电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

IS61DDB21M18A

产品描述Fixed 2-bit burst for read and write operations
文件大小592KB,共29页
制造商ISSI(芯成半导体)
官网地址http://www.issi.com/
下载文档 全文预览

IS61DDB21M18A在线购买

供应商 器件名称 价格 最低购买 库存  
IS61DDB21M18A - - 点击查看 点击购买

IS61DDB21M18A概述

Fixed 2-bit burst for read and write operations

文档预览

下载PDF文档
IS61DDB21M18A
IS61DDB251236A
1Mx18, 512Kx36
18Mb DDR-II (Burst 2) CIO SYNCHRONOUS SRAM
FEATURES
512Kx36 and 1Mx18 configuration available.
On-chip delay-locked loop (DLL) for wide data valid
window.
Common I/O read and write ports.
Synchronous pipeline read with self-timed late write
operation.
Double Data Rate (DDR) interface for read and
write input ports.
Fixed 2-bit burst for read and write operations.
Clock stop support.
Two input clocks (K and K#) for address and control
registering at rising edges only.
Two input clocks (C and C#) for data output control.
Two echo clocks (CQ and CQ#) that are delivered
simultaneously with data.
+1.8V core power supply and 1.5V to 1.8V VDDQ,
used with 0.75V to 0.9V VREF.
HSTL input and output interface.
Registered addresses, write and read controls, byte
writes, data in, and data outputs.
Full data coherency.
Boundary scan using limited set of JTAG 1149.1
functions.
Byte write capability.
Fine ball grid array (FBGA) package:
13mmx15mm and 15mmx17mm body size
165-ball (11 x 15) array
Programmable impedance output drivers via 5x
user-supplied precision resistor.
OCTOBER 2014
DESCRIPTION
The 18Mb IS61DDB251236A and IS61DDB21M18A are
synchronous, high-performance CMOS static random access
memory (SRAM) devices. These SRAMs have a common I/O
bus. The rising edge of K clock initiates the read/write
operation, and all internal operations are self-timed. Refer to
the
Timing Reference Diagram for Truth Table
for a
description of the basic operations of these DDR-II (Burst of
2) CIO SRAMs.
Read and write addresses are registered on alternating rising
edges of the K clock. Reads and writes are performed in
double data rate.
The following are registered internally on the rising edge of
the K clock:
Read/write address
Read enable
Write enable
Byte writes for first burst address
Data-in for first burst address
The following are registered on the rising edge of the K#
clock:
Byte writes for second burst address
Data-in for second burst address
Byte writes can change with the corresponding data-in to
enable or disable writes on a per-byte basis. An internal write
buffer enables the data-ins to be registered one cycle after
the write address. The first data-in burst is clocked one cycle
later than the write command signal, and the second burst is
timed to the following rising edge of the K# clock.
During the burst read operation, the data-outs from the first
bursts are updated from output registers of the second rising
edge of the C# clock (starting one and half cycles later after
read command). The data-outs from the second bursts are
updated with the third rising edge of the C clock. The K and
K# clocks are used to time the data-outs whenever the C and
C# clocks are tied high.
The device is operated with a single +1.8V power supply and
is compatible with HSTL I/O interfaces.
Copyright © 2014 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
10/02/2014
1

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 448  2748  337  1269  408  4  57  29  37  14 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved