GT20G101(SM)
TOSHIBA INSULATED GATE BIPOLAR TRANSISTOR SILICON N−CHANNEL IGBT
GT20G101(SM)
STROBE FLASH APPLICATIONS
High Input Impedance
Low Saturation Voltage : V
CE (sat)
= 8V (Max.) (I
C
= 130A)
Enhancement−Mode
20V Gate Drive
Unit: mm
MAXIMUM RATINGS
(Ta = 25°C)
CHARACTERISTIC
Collector−Emitter Voltage
Gate-Emitter Voltage
Collector Current
Collector Power
Dissipation
Junction Temperature
Storage Temperature Range
DC
1ms
Ta = 25°C
Tc = 25°C
SYMBOL
V
CES
V
GES
I
C
I
CP
P
C
P
C
T
j
T
stg
RATING
400
±25
20
130
1.3
60
150
−55~150
UNIT
V
V
A
W
°C
°C
JEDEC
JEITA
TOSHIBA
Weight: 1.4g
―
―
2−10S2C
ELECTRICAL CHARACTERISTICS
(Ta = 25
°C
)
CHARACTERISTIC
Gate Leakage Current
Collector Cut−off Current
Gate-Emitter Cut−off Voltage
Collector−Emitter Saturation Voltage
Input Capacitance
Rise Time
Switching Time
Turn−on Time
Fall Time
Turn−off Time
Thermal Resistance
SYMBOL
I
GES
I
CES
V
GE (OFF)
V
CE (sat)
C
ies
t
r
t
on
t
f
t
off
R
th (j−c)
―
TEST CONDITION
V
GE
= ±25V, V
CE
= 0
V
CE
= 400V, V
GE
= 0
I
C
= 1mA, V
CE
= 5V
I
C
= 130A, V
GE
= 20V
V
CE
= 10V, V
GE
= 0, f = 1MHz
MIN
―
―
4
―
―
―
―
―
―
―
TYP.
―
―
5
5
1350
0.1
0.15
4.0
4.5
―
MAX
±100
10
7
8
―
0.5
0.5
6.0
7.0
2.08
UNIT
nA
µA
V
V
pF
µs
°C / W
1
2001-06-06
GT20G101(SM)
RESTRICTIONS ON PRODUCT USE
000707EAA
•
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
•
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
•
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
•
The information contained herein is subject to change without notice.
4
2001-06-06
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