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CAT93C56, CAT93C57
2-Kb Microwire Serial CMOS EEPROM
FEATURES
High speed operation: 2MHz
1.8V to 5.5V supply voltage range
Selectable x8 or x16 memory organization
Sequential read
Software write protection
Power-up inadvertant write protection
Low power CMOS technology
1,000,000 Program/erase cycles
100 year data retention
Industrial temperature ranges
RoHS-compliant 8-pin PDIP, SOIC, TSSOP and
8-pad TDFN packages
For Ordering Information details, see page 16.
DESCRIPTION
The CAT93C56/57 is a 2-Kb CMOS Serial EEPROM
device which is organized as either 128 registers of 16
bits (ORG pin at V
CC
) or 256 registers of 8 bits (ORG pin
at GND). Each register can be written (or read) serially
by using the DI (or DO) pin. The CAT93C56/57 features
sequential read and self-timed internal write with auto-
clear. On-chip Power-On Reset circuitry protects the
internal logic against powering up in the wrong state.
PIN CONFIGURATION
PDIP (L)
SOIC (V, X)
TSSOP (Y)
TDFN (VP2, ZD4*)
CS
SK
DI
DO
1
2
3
4
8 V
CC
7 NC
6 ORG
5 GND
NC
V
CC
CS
SK
FUNCTIONAL SYMBOL
V
CC
SOIC (W*)
1
2
3
4
8 ORG
7 GND
6 DO
5 DI
ORG
CS
SK
DI
CAT93C56
CAT93C57
DO
* TDFN 3x3mm (ZD4) and SOIC (W) rotated pin-out packages are
available for CAT93C57 and CAT93C56, Rev. E only (not
recommended for new designs of CAT93C56)
GND
PIN FUNCTION
Pin Name
CS
SK
DI
DO
V
CC
GND
ORG
NC
Function
Chip Select
Clock Input
Serial Data Input
Serial Data Output
Power Supply
Ground
Memory Organization
No Connection
Note: When the ORG pin is connected to VCC, the x16 organization
is selected. When it is connected to ground, the x8 pin is selected. If
the ORG pin is left unconnected, then am internal pullup device will
select the x16 organization
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
1
Doc. No. MD-1088 Rev. P
CAT93C56, CAT93C57
Absolute Maximum Ratings
(1)
Parameters
Storage Temperature
Voltage on Any Pin with Respect to Ground
(2)
Reliability Characteristics
(3)
Symbol
NEND
(4)
TDR
Parameter
Endurance
Data Retention
Min
1,000,000
100
Units
Program/ Erase Cycles
Years
Ratings
-65 to +150
-0.5 to +6.5
Units
°C
V
D.C. OPERATING CHARACTERISTICS, CAT93C56, Die Rev. G – New Product
V
CC
= +1.8V to +5.5V, T
A
=-40°C to +85°C unless otherwise specified.
Symbol
I
CC1
I
CC2
I
SB1
I
SB2
I
LI
I
LO
V
IL1
V
IH1
V
IL2
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than V
CC
+ 0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than V
CC
+ 1.5V, for periods of less than 20 ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Block Mode, V
CC
= 5V, 25°C
Parameter
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16 Mode)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Test Conditions
f
SK
= 1MHz, V
CC
= 5.0V
f
SK
= 1MHz, V
CC
= 5.0V
V
IN
= GND or V
CC
, CS = GND
ORG = GND
V
IN
= GND or V
CC
, CS = GND
ORG = Float or V
CC
V
IN
= GND to V
CC
V
OUT
= GND to V
CC
, CS = GND
4.5V
≤
V
CC
< 5.5V
4.5V
≤
V
CC
< 5.5V
1.8V
≤
V
CC
< 4.5V
1.8V
≤
V
CC
< 4.5V
4.5V
≤
V
CC
< 5.5V, I
OL
= 2.1mA
4.5V
≤
V
CC
< 5.5V, I
OH
= -400µA
1.8V
≤
V
CC
< 4.5V, I
OL
= 1mA
1.8V
≤
V
CC
< 4.5V, I
OH
= -100µA
Min
Max
1
500
2
1
1
1
Units
mA
µA
µA
µA
µA
µA
V
V
V
V
V
V
V
V
-0.1
2
0
V
CC
x 0.7
2.4
0.8
V
CC
+ 1
V
CC
x 0.2
V
CC
+ 1
0.4
0.2
V
CC
- 0.2
Doc. No. MD-1088 Rev. P
2
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT93C56, CAT93C57
D.C. OPERATING CHARACTERISTICS, CAT93C56/57, Die Rev. E – Mature Product
(CAT93C56, Rev. E – NOT RECOMMENDED FOR NEW DESIGNS)
V
CC
= +1.8V to +5.5V, T
A
=-40°C to +125°C unless otherwise specified.
Symbol
I
CC1
I
CC2
I
SB1
I
SB2
I
LI
I
LO
V
IL1
V
IH1
V
IL2
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Parameter
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16 Mode)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Test Conditions
f
SK
= 1MHz, V
CC
= 5.0V
f
SK
= 1MHz, V
CC
= 5.0V
V
IN
= GND or V
CC
, CS = GND
ORG = GND
V
IN
= GND or V
CC
, CS = GND
ORG = Float or V
CC
V
IN
= GND to V
CC
V
OUT
= GND to V
CC
, CS = GND
4.5V
≤
V
CC
< 5.5V
4.5V
≤
V
CC
< 5.5V
1.8V
≤
V
CC
< 4.5V
1.8V
≤
V
CC
< 4.5V
4.5V
≤
V
CC
< 5.5V, I
OL
= 2.1mA
4.5V
≤
V
CC
< 5.5V, I
OH
= -400µA
1.8V
≤
V
CC
< 4.5V, I
OL
= 1mA
1.8V
≤
V
CC
< 4.5V, I
OH
= -100µA
V
CC
- 0.2
2.4
0.2
-0.1
2
0
V
CC
x 0.7
Min
Max
3
500
10
10
1
1
0.8
V
CC
+ 1
V
CC
x 0.2
V
CC
+ 1
0.4
Units
mA
µA
µA
µA
µA
µA
V
V
V
V
V
V
V
V
PIN CAPACITANCE
T
A
= 25°C, f = 1MHz, V
CC
= 5V
Symbol
C
OUT(1)
C
IN(1)
Notes:
(1) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
Test
Output Capacitance (DO)
Input Capacitance (CS, SK, DI, ORG)
Conditions
V
OUT
= 0V
V
IN
= 0V
Min
Typ
Max
5
5
Units
pF
pF
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc. No. MD-1088 Rev. P
CAT93C56, CAT93C57
A.C. CHARACTERISTICS
(1)
, CAT93C56, Die Rev. G – New Product
V
CC
= +1.8V to +5.5V, T
A
= -40°C to +85°C, unless otherwise specified.
Limits
Symbol
t
CSS
t
CSH
t
DIS
t
DIH
t
PD1
t
PD0
t
HZ(2)
t
EW
t
CSMIN
t
SKHI
t
SKLOW
t
SV
SK
MAX
Parameter
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
DC
0.25
0.25
0.25
0.25
2000
Min
50
0
100
100
0.25
0.25
100
5
Max
Units
ns
ns
ns
ns
µs
µs
ns
ms
µs
µs
µs
µs
kHz
A.C. CHARACTERISTICS
(1)
, CAT93C56/57, Die Rev. E – Mature Product
(CAT93C56 Rev. E - NOT RECOMMENDED FOR NEW DESIGNS)
Limits
Symbol
t
CSS
t
CSH
t
DIS
t
DIH
t
PD1
t
PD0
t
HZ(2)
t
EW
t
CSMIN
t
SKHI
t
SKLOW
t
SV
SK
MAX
Notes
:
(1)
(2)
Test conditions according to “A.C. Test Conditions” table.
These parameters are tested initially and after a design or process change that affects the parameter according to appropriate
AEC-Q100 and JEDEC test methods.
Parameter
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
V
CC
= 1.8V - 5.5V
Min
200
0
400
400
1
1
400
10
1
1
1
1
DC
250
Max
V
CC
= 2.5V - 5.5V
Min
100
0
200
200
0.5
0.5
200
10
0.5
0.5
0.5
0.5
DC
500
Max
V
CC
= 4.5V - 5.5V
Min
50
0
100
100
0.25
0.25
100
10
0.25
0.25
0.25
0.25
DC
1000
Max
Units
ns
ns
ns
ns
µs
µs
ns
ms
µs
µs
µs
µs
kHz
Doc. No. MD-1088 Rev. P
4
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
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