www.micronetics.com/Noise_Source_SMT/Microwave_LLC.pdf
SMN3018
S
URFACE
M
OUNT
N
OISE
S
OURCE
200 MH
Z TO
6.0 GH
Z
D
ESCRIPTION
The SMN3018 noise module is the
world's smallest packaged noise source.
This 0.150" x 0.220" surface mount
device has all the biasing circuitry built-
in so all that is required is a DC source
and ground. This module is designed
for built-in-test (BIT) and calibration of
receivers. The module is broadband,
200 MHz to 6.0 GHz for a wide range of
receiver applications from cellular base
stations to radio-astronomy telescopes.
The world’s
smallest packaged
noise source
SMN3018 D
ATA
S
UITABLE FOR
H
IGH
V
OLUME
P
RODUCTS
:
The SMN3018 noise source being sur-
face mount, having a small footprint and
available on tape and reel make them
ideal for production manufacturing.
Traditionally packaged microwave noise
sources have been large and costly ren-
dering them unsuitable for all but large
expensive systems. The benefits of
having built-in test and calibration can
now be brought to mass produced prod-
ucts so they can now realize the bene-
fits of an onboard noise source.
ENR
S
PECIFICATIONS
• Frequency:
• ENR:
• Flatness:
• Impedance:
• Bias:
• Voltage Sens:
• Temp Sens:
• Current:
200 MHzto 6.0 GHz
26 dB min
2 dB max
50 ohms
+12 Vdc models
+15 Vdc models
1.0 dB/V (typ)
0.015 dB/
o
C (typ)
12 mA max
A
PPLICATION
N
OTE
Using noise for built-in test:
There are two primary uses for employing a noise signal for built-in test.
1. Noise Temperature (noise figure) or sensitivity testing: This test uses the noise source to supply a
known excess noise ratio (ENR) to a device under test for a Y-factor measurement. By taking two
receiver readings, one with the noise on and one with it off, Y-factor can be determined. By knowing
the ENR and Y-factor, one can calculate noise temperature (figure) or sensitivity.
2. Frequency Response: The noise source being broadband can be used as a replacement of a swept
source to calculate frequency response of a receiver or other device. By putting in a known spectral
signal at the input and taking a reading at the output, one can determine the gain or loss over frequency
of the entire system. Noise sources are inherently extremely stable devices. In addition, the circuitry is
much simpler than a swept source which increases reliability and lowers cost.
For more information on using noise for built-in-test, read the Feb 2004 Microwave Journal article authored
by Patrick Robbins of Micronetics.
http://www.micronetics.com/articles/microwave_journal_02-04.pdf
• Operating Temp: -40 to +125
o
C
• Storage Temp:
-54 to +150
o
C
MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM
WWW.MICRONETICS.COM
SMN3018
www.micronetics.com/Noise_Source_SMT/Microwave_LLC.pdf
S
URFACE
M
OUNT
N
OISE
S
OURCE
200 MH
Z
- 6.0 GH
Z
U
SEFUL
N
OISE
E
QUATIONS
Calculating Y-Factor: Y
Fact
= N
2
/ N
1
Where N
2
is measured power output with noise source on and N
1
is the
measured power output with noise source off.
Calculating noise figure from ENR and Y-Factor: NF(dB) = ENR (dB) - 10 log10 (Y
Fact
-1)
Converting ENR to noise spectral density (N
0
): 0 dB ENR = -174 dBm/Hz
Calculating noise power in a given bandwidth (BW) from noise spectral density:
Power (dBm) = N
0
+ 10log(BW)
H
OW
T
O
O
RDER
Model #
SMN3018-
X
1D
Nominal Voltage
D = 12 V
E = 15 V
P
ACKAGE
O
UTLINE
D
RAWING
PIN:
1, 4 = Ground
2 = Output
3 = Bias
MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM
WWW.MICRONETICS.COM
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