15.625MHZ to 62.5MHZ, 1:4 LVCMOS/
LVTTL Zero Delay Clock Buffer
G
ENERAL
D
ESCRIPTION
The ICS86004I is a high performance 1:4
IC
S
LVCMOS/LVTTL Clock Buffer. The ICS86004I has
HiPerClockS™
a fully integrated PLL and can be configured as
zero delay buffer and has an input and output
frequency range of 15.625MHz to 62.5MHz. The
VCO operates at a frequency range of 250MHz to 500MHz. The
external feedback allows the device to achieve “zero delay”
between the input clock and the output clocks. The PLL_SEL
pin can be used to bypass the PLL for system test and debug
purposes. In bypass mode, the reference clock is routed around
the PLL and into the internal output divider.
ICS86004I
DATA SHEET
F
EATURES
• Four LVCMOS/LVTTL outputs, 7Ω typical output impedance
• Single LVCMOS/LVTTL clock input
• CLK accepts the following input levels: LVCMOS or LVTTL
• Output frequency range: 15.625MHz to 62.5MHz
• Input frequency range: 15.625MHz to 62.5MHz
• VCO range: 250MHz to 500MHz
• External feedback for “zero delay” clock regeneration
with configurable frequencies
• Fully integrated PLL
• Cycle-to-cycle jitter: 75ps (maximum)
• Output skew: 65ps (maximum)
• Full 3.3V or 2.5V, or 3.3V core/2.5V output operating supply
• -40°C to 85° ambient operating temperature
• Available in both standard and lead-free RoHS compliant
packages
B
LOCK
D
IAGRAM
PLL_SEL
Q0
÷8, ÷16
0
Q1
CLK
PLL
1
Q2
P
IN
A
SSIGNMENT
Q1
GND
Q0
F_SEL
V
DD
CLK
GND
V
DDA
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
DDO
Q2
GND
Q3
V
DDO
MR
FB_IN
PLL_SEL
FB_IN
1:1
Q3
ICS86004I
16-Lead TSSOP
4.4mm x 5.0mm x 0.925mm package body
G Package
Top View
MR
F_SEL
ICS86004BGI REVISION A FEBRUARY 24, 2010
1
©2010
Integrated Device Technology, Inc.
ICS86004I Data Sheet
15.625MHZ TO 62.5MHZ, 1:4 LVCMOS/LVTTL ZERO DELAY CLOCK BUFFER
T
ABLE
1. P
IN
D
ESCRIPTIONS
Number
1, 3,
13, 15
2, 7, 14
4
5
6
8
9
10
11
12, 16
Nam e
Q1, Q0,
Q3, Q2
GND
F_SEL
V
DD
CL K
V
DDA
PLL_SEL
FB_IN
MR
V
DDO
Type
Output
Power
Input
Power
Input
Power
Input
Input
Input
Power
Pulldown
Description
Clock outputs. 7
Ω
typical output impedance. LVCMOS/LVTTL interface levels.
Power supply ground.
Frequency range select input. See Table 3A and 3B.
LVCMOS/LVTTL interface levels.
Core supply pin.
Pulldown LVCMOS/LVTTL clock input.
Analog supply pin.
Selects between the PLL and reference clock as input to the dividers.
When LOW, selects the reference clock (PLL Bypass). When HIGH,
Pullup
selects PLL (PLL Enabled). LVCMOS/LVTTL interface levels.
Feedback input to phase detector for regenerating clocks with "zero delay".
Pulldown
Connect to one of the outputs. LVCMOS/LVTTL interface levels.
Active HIGH Master Reset. When logic HIGH, the internal dividers are reset
Pulldown causing the outputs to go low. When logic LOW, the internal dividers and the
outputs are enabled. LVCMOS/LVTTL interface levels.
Output supply pins.
NOTE:
Pullup
and
Pulldown
refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
T
ABLE
2. P
IN
C
HARACTERISTICS
Symbol
C
IN
R
PULLUP
R
PULLDOWN
C
PD
R
OUT
Parameter
Input Capacitance
Input Pullup Resistor
Input Pulldown Resistor
Power Dissipation Capacitance
(per output)
Output Impedance
V
DD
, V
DDA
, V
DDO
= 3.465V
V
DD
, V
DDA
, V
DDO
= 2.625V
3.3V ± 5%
5
7
Test Conditions
Minimum
Typical
4
51
51
23
17
12
Maximum
Units
pF
kΩ
kΩ
pF
pF
Ω
T
ABLE
3A. C
ONTROL
I
NPUT
F
UNCTION
T
ABLE
, PLL_SEL = 1
Input
F_SEL
0
1
Input/Output
Frequency Range (MHz)
Minimum
Maximum
31.25
15.625
62.5
31.25
T
ABLE
3B. C
ONTROL
I
NPUT
F
UNCTION
T
ABLE
, PLL_SEL = 0
Input
F_SEL
0
1
Output
Ref ÷8
Ref ÷16
ICS86004BGI REVISION A FEBRUARY 24, 2010
2
©2010
Integrated Device Technology, Inc.
ICS86004I Data Sheet
15.625MHZ TO 62.5MHZ, 1:4 LVCMOS/LVTTL ZERO DELAY CLOCK BUFFER
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DD
Inputs, V
I
Outputs, V
O
4.6V
-0.5V to V
DD
+ 0.5 V
-0.5V to V
DDO
+ 0.5V
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional op-
eration of product at these conditions or any conditions beyond
those listed in the
DC Characteristics
or
AC Characteristics
is not
implied. Exposure to absolute maximum rating conditions for ex-
tended periods may affect product reliability.
Package Thermal Impedance,
θ
JA
89°C/W (0 lfpm)
Storage Temperature, T
STG
-65°C to 150°C
T
ABLE
4A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDA
V
DDO
I
DD
I
DDA
I
DDO
Parameter
Core Supply Voltage
Analog Supply Voltage
Output Supply Voltage
Power Supply Current
Analog Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
3.135
Typical
3.3
3.3
3.3
Maximum
3.465
V
DD
3.465
98
22
8
Units
V
V
V
mA
mA
mA
T
ABLE
4B. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%, V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDA
V
DDO
I
DD
I
DDA
I
DDO
Parameter
Core Supply Voltage
Analog Supply Voltage
Output Supply Voltage
Power Supply Current
Analog Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
2.375
Typical
3.3
3.3
2.5
Maximum
3.465
V
DD
2.625
98
22
8
Units
V
V
V
mA
mA
mA
T
ABLE
4C. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDA
V
DDO
I
DD
I
DDA
I
DDO
Parameter
Core Supply Voltage
Analog Supply Voltage
Output Supply Voltage
Power Supply Current
Analog Supply Current
Output Supply Current
Test Conditions
Minimum
2.375
2.375
2.375
Typical
2.5
2.5
2.5
Maximum
2.625
V
DD
2.625
88
18
6
Units
V
V
V
mA
mA
mA
ICS86004BGI REVISION A FEBRUARY 24, 2010
3
©2010
Integrated Device Technology, Inc.
ICS86004I Data Sheet
15.625MHZ TO 62.5MHZ, 1:4 LVCMOS/LVTTL ZERO DELAY CLOCK BUFFER
T
ABLE
4D. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%
OR
2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
Parameter
Input High Voltage
Input Low Voltage
CLK, MR,
FB_IN, F_SEL
PLL_SEL
CLK, MR,
FB_IN, F_SEL
PLL_SEL
Test Conditions
V
DD
= 3.3V
V
DD
= 2.5V
V
DD
= 3.3V
V
DD
= 2.5V
V
DD
= V
IN
= 3.465V
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
V
DD
= 3.465V, V
IN
= 0V
V
DDO
= 3.465V
V
DDO
= 2.625V
-5
-150
2. 6
1.8
0. 5
Minimum Typical
2
1.7
-0.3
-0.3
Maximum
V
DD
+ 0.3
V
DD
+ 0.3
0.8
0.7
150
5
Units
V
V
V
V
µA
µA
µA
µA
V
V
V
Input High Current
I
IL
V
OH
Input Low Current
Output High Voltage; NOTE 1
Output Low Voltage; NOTE 1
V
DDO
= 3.465V or 2.625V
V
OL
NOTE 1: Outputs terminated with 50
Ω
to V
DDO
/2. See Parameter Measurement Information Section,
Output Load Test Circuit diagrams.
T
ABLE
5A. AC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
tp
LH
t(Ø)
Parameter
Output Frequency
Propagation Delay, Low-to-High; NOTE 1
Static Phase Offset; NOTE 2, 4
Output Skew; NOTE 3, 4
Cycle-to-Cycle Jitter ; NOTE 4
PLL Lock Time
Output Rise/Fall Time
0.4
Test Conditions
F_SEL = 0
F_SEL = 1
PLL_SEL = 0V,
Bypass Mode
PLL_SEL = 3.3V
PLL_SEL = 0V
Minimum
31.25
15.625
4.1
-500
Typical
Maximum
62.5
31.25
6.1
500
65
75
1
1
Units
MH z
MH z
ns
ps
ps
ps
mS
ns
t
sk(o)
t
jit(cc)
t
L
t
R
/ t
F
odc
Output Duty Cycle
49
51
%
All parameters measured at f
MAX
unless noted otherwise.
.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet
specifications after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defined as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
ICS86004BGI REVISION A FEBRUARY 24, 2010
4
©2010
Integrated Device Technology, Inc.
ICS86004I Data Sheet
15.625MHZ TO 62.5MHZ, 1:4 LVCMOS/LVTTL ZERO DELAY CLOCK BUFFER
T
ABLE
5B. AC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%, V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
tp
LH
t(Ø)
Parameter
Output Frequency
Propagation Delay, Low-to-High; NOTE 1
Static Phase Offset; NOTE 2, 4
Output Skew; NOTE 3, 4
Cycle-to-Cycle Jitter ; NOTE 4
PLL Lock Time
Output Rise/Fall Time
0.4
Test Conditions
F_SEL = 0
F_SEL = 1
PLL_SEL = 0V,
Bypass Mode
PLL_SEL = 2.5V
PLL_SEL = 0V
Minimum
31.25
15.625
4.25
-500
Typical
Maximum
62.5
31.25
6.25
500
65
75
1
1
Units
MHz
MHz
ns
ps
ps
ps
mS
ns
t
sk(o)
t
jit(cc)
t
L
t
R
/ t
F
odc
Output Duty Cycle
48
52
%
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet
specifications after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defined as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
T
ABLE
5C. AC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
tp
LH
t(Ø)
Parameter
Output Frequency
Propagation Delay, Low-to-High; NOTE 1
Static Phase Offset; NOTE 2, 4
Output Skew; NOTE 3, 4
Cycle-to-Cycle Jitter ; NOTE 4
PLL Lock Time
Output Rise/Fall Time
0.4
Test Conditions
F_SEL = 0
F_SEL = 1
PLL_SEL = 0V,
Bypass Mode
PLL_SEL = 2.5V
PLL_SEL = 0V
Minimum
31.25
15.625
4.5
-500
Typical
Maximum
62.5
31.25
6.5
500
65
75
1
1
Units
MHz
MHz
ns
ps
ps
ps
mS
ns
t
sk(o)
t
jit(cc)
t
L
t
R
/ t
F
odc
Output Duty Cycle
48
52
%
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet
specifications after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defined as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
ICS86004BGI REVISION A FEBRUARY 24, 2010
5
©2010
Integrated Device Technology, Inc.
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