REVISIONS
LTR
A
B
DESCRIPTION
Make changes to table I. Rewrite entire document.
Add device types 03 and 04.
DATE
(YR-MO-DA)
94-01-18
99-06-28
APPROVED
K. A. Cottongim
K. A. Cottongim
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
SHEET
PREPARED BY
Gary Zahn
B
1
B
2
B
3
B
4
B
5
B
6
B
7
B
8
B
9
B
10
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS
P. O. BOX 3990
COLUMBUS, OHIO 43216-5000
CHECKED BY
Robert M. Heber
APPROVED BY
William K. Heckman
MICROCIRCUIT, HYBRID, LINEAR, 16-BIT, HIGH
SPEED, A/D CONVERTER
DRAWING APPROVAL DATE
90-12-19
SIZE
CAGE CODE
REVISION LEVEL
B
AMSC N/A
A
SHEET
67268
1
OF
10
5962-90795
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E304-99
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class
G (lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead
finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness
assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
90795
01
H
X
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
\/
Drawing number
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the
MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a
non-RHA device.
1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:
Device type
01
02
03
04
Generic number
HS9576S/B BIP
HS9576T/B BIP
HS9576S/B UNI
HS9576T/B UNI
Circuit function
16-bit A/D converter, bipolar
16-bit A/D converter, bipolar
16-bit A/D converter, unipolar
16-bit A/D converter, unipolar
Maximun linearity error
±0.006% FSR
±0.003% FSR
±0.006% FSR
±0.003% FSR
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as
follows:
Device class
D, E, G, H or K
Device performance documentation
Certification and qualification to MIL-PRF-38534
1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
See figure 1
Terminals
32
Package style
Dual-in-line
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
B
5962-90795
SHEET
2
1.3 Absolute maximum ratings. 1/
Positive supply voltage range (V
CC
) . . . . . . . . . . . . . . . . . . . . .
Negative supply voltage range (V
EE
) . . . . . . . . . . . . . . . . . . . .
Logic supply voltage range (V
DD
) . . . . . . . . . . . . . . . . . . . . . .
Analog ground to logic ground . . . . . . . . . . . . . . . . . . . . . . . . .
Logic inputs to logic ground . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog inputs to analog ground . . . . . . . . . . . . . . . . . . . . . . . .
Voltage on logic outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power dissipation (P
D
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Thermal resistance, junction to case (
JC
) . . . . . . . . . . . . . . . .
Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . .
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . .
Junction temperature (T
J
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.4 Recommended operating conditions.
Positive supply voltage range (V
CC
) . . . . . . . . . . . . . . . . . . . . .
Negative supply voltage range (V
EE
) . . . . . . . . . . . . . . . . . . . .
Logic supply voltage range (V
DD
) . . . . . . . . . . . . . . . . . . . . . .
Case operating temperature range (T
C
) . . . . . . . . . . . . . . . . . .
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Methods and Procedures for Microelectronics.
MIL-STD-973 - Configuration Management.
MIL-STD-1835 - Microcircuit Case Outlines.
HANDBOOK
DEPARTMENT OF DEFENSE
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
+14.55 V dc to +15.45 V dc
-14.55 V dc to -15.45 V dc
+4.75 V dc to +5.25 V dc
-55
C to +125
C
0 V dc to +16 V dc
0 V dc to -16 V dc
-0.5 V dc to +7.0 V dc
0.5 V dc
0 V dc to +6.5 V dc
0 V dc to +16.5 V dc
0 V dc to 7.0 V dc
2.0 W
40
C/W
+300
C
-65
C to +150
C
+170
C
1/
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
REVISION LEVEL
B
5962-90795
SHEET
3
DSCC FORM 2234
APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for applicable device class.
Therefore, the tests and inspections herein may not be performed for applicable device class (see MIL-PRF-38534).
Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class. The modification in the QM plan shall not affect the form, fit, or function as described herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in
QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
B
5962-90795
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
Bipolar
Group A
subgroups
1, 2, 3
Device
type
Min
01, 02
-2.5
-5.0
-10.0
Unipolar
03, 04
0
0
0
High level input voltage
Low level input voltage
High level output voltage
Low level output voltage
Supply currents
VIH
VIL
VOH
VOL
ICC
IEE
IDD
Integral linearity error
ILE
V
CC
= +15.45 V dc
V
EE
= -15.45 V dc
V
DD
= +5.25 V dc
End point definition,
TC = +25°C
TC = +125°C
4
01, 03
02, 04
5
01, 03
02, 04
TC = -55°C
6
01, 03
02, 04
Differential linearity error
DLE
TC = +25°C
TC = +125°C
4
5
All
01, 03
02, 04
TC = -55°C
See footnotes at end of table.
6
01, 03
02, 04
-0.006
-0.003
-0.036
-0.023
-0.030
-0.019
-0.006
-0.006
-0.006
-0.006
-0.006
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
All
All
All
All
All
2.4
0.40
+23
-38
+37
+0.006
+0.003
+0.036
+0.023
+0.030
+0.019
+0.006
+0.046
+0.026
+0.038
+0.022
%FSR
%FSR
2.0
0.8
Limits
Max
+2.5
+5.0
+10.0
+5.0
+10.0
+20.0
V
V
V
V
mA
V
Unit
Input voltage
VIN
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
B
5962-90795
SHEET
5
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