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CY7C1327C-250AC

产品描述Cache SRAM, 256KX18, 2.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
产品类别存储    存储   
文件大小293KB,共24页
制造商Cypress(赛普拉斯)
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CY7C1327C-250AC概述

Cache SRAM, 256KX18, 2.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

CY7C1327C-250AC规格参数

参数名称属性值
是否Rohs认证不符合
零件包装代码QFP
包装说明14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
针数100
Reach Compliance Codenot_compliant
ECCN代码3A991.B.2.A
最长访问时间2.5 ns
最大时钟频率 (fCLK)250 MHz
I/O 类型COMMON
JESD-30 代码R-PQFP-G100
JESD-609代码e0
长度20 mm
内存密度4718592 bit
内存集成电路类型CACHE SRAM
内存宽度18
功能数量1
端子数量100
字数262144 words
字数代码256000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织256KX18
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码LQFP
封装等效代码QFP100,.63X.87
封装形状RECTANGULAR
封装形式FLATPACK, LOW PROFILE
并行/串行PARALLEL
峰值回流温度(摄氏度)NOT SPECIFIED
电源3.3 V
认证状态Not Qualified
座面最大高度1.6 mm
最大待机电流0.02 A
最小待机电流3.14 V
最大压摆率0.45 mA
最大供电电压 (Vsup)3.63 V
最小供电电压 (Vsup)3.135 V
标称供电电压 (Vsup)3.3 V
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层Tin/Lead (Sn/Pb)
端子形式GULL WING
端子节距0.65 mm
端子位置QUAD
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度14 mm
Base Number Matches1

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CY7C1347C/GVT71128DA36
CY7C1327C/GVT71256DA18
256K x 18/128K x 36 Synchronous-Pipelined
Cache RAM
Features
Fast access times: 2.5 and 3.5 ns
Fast clock speed: 250, 225, 200, and 166 MHz
1-ns set-up time and hold time
Fast OE access times: 2.5 ns and 3.5 ns
Optimal for depth expansion (one cycle chip deselect
to eliminate bus contention)
3.3V –5% and +10% power supply
3.3V or 2.5V I/O supply
5V tolerant inputs except I/Os
Clamp diodes to V
SS
at all inputs and outputs
Common data inputs and data outputs
Byte Write Enable and Global Write control
Three chip enables for depth expansion and address
pipeline
Address, data, and control registers
Internally self-timed Write Cycle
Burst control pins (interleaved or linear burst se-
quence)
Automatic power-down for portable applications
JTAG boundary scan
JEDEC standard pinout
Low profile 119-lead, 14-mm x 22-mm BGA (Ball Grid
Array) and 100-pin TQFP packages
The CY7C1347C/GVT71128DA36 and CYC7C1327C/
GVT71256DA18 SRAMs integrate 131,072x36 and
262,144x18 SRAM cells with advanced synchronous periph-
eral circuitry and a 2-bit counter for internal burst operation. All
synchronous inputs are gated by registers controlled by a pos-
itive-edge-triggered clock input (CLK). The synchronous in-
puts include all addresses, all data inputs, address-pipelining
Chip Enable (CE), depth-expansion Chip Enables (CE2 and
CE2), Burst Control Inputs (ADSC, ADSP and ADV), Write
,
Enables (BWa, BWb, BWc, BWd, and BWE), and Global Write
(GW).
Asynchronous inputs include the Output Enable (OE) and
Burst Mode Control (MODE). The data outputs (Q), enabled
by OE, are also asynchronous.
Addresses and chip enables are registered with either Ad-
dress Status Processor (ADSP) or Address Status Controller
(ADSC) input pins. Subsequent burst addresses can be inter-
nally generated as controlled by the Burst Advance pin (ADV).
Address, data inputs, and write controls are registered on-chip
to initiate self-timed Write cycle. Write cycles can be one to
four bytes wide as controlled by the write control inputs. Indi-
vidual byte write allows individual byte to be written. BWa con-
trols DQa. BWb controls DQb. BWc controls DQc. BWd con-
trols DQd. BWa, BWb, BWc, and BWd can be active only with
BWE being LOW. GW being LOW causes all bytes to be writ-
ten. The x18 version only has 18 data inputs/outputs (DQa and
DQb) along with BWa and BWb (no BWc, BWd, DQc, and
DQd).
Four pins are used to implement JTAG test capabilities: Test
Mode Select (TMS), Test Data-in (TDI), Test Clock (TCK), and
Test Data-out (TDO). The JTAG circuitry is used to serially shift
data to and from the device. JTAG inputs use LVTTL/LVCMOS
levels to shift data during this testing mode of operation.
The
CY7C1347C/GVT71128DA36
and
CY7C1327C/
GVT71256DA18 operate from a +3.3V power supply. All inputs
and outputs are LVTTL compatible
Functional Description
The Cypress Synchronous Burst SRAM family employs
high-speed, low-power CMOS designs using advanced tri-
ple-layer polysilicon, double-layer metal technology. Each
memory cell consists of four transistors and two high-valued
resistors.
Selection Guide
7C1347C-250
71128DA36-4
7C1327C-250
71256DA18-4
Maximum Access Time (ns)
Maximum Operating Current (mA)
Maximum CMOS Standby Current (mA)
2.5
450
10
7C1347C-225
71128DA36-4.4
7C1327C-225
71256DA18-4.4
2.5
400
10
7C1347C-200
71128DA36-5
7C1327C-200
71256DA18-5
2.5
360
10
7C1347C-166
71128DA36-6
7C1327C-166
71256DA18-6
3.5
300
10
Cypress Semiconductor Corporation
3901 North First Street
San Jose
CA 95134
408-943-2600
July 21, 2000

 
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