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S-LNZ9F3V9T5G

产品描述Zener Diode,
产品类别分立半导体    二极管   
文件大小502KB,共4页
制造商LRC
官网地址http://www.lrc.cn
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S-LNZ9F3V9T5G概述

Zener Diode,

S-LNZ9F3V9T5G规格参数

参数名称属性值
Reach Compliance Codeunknown
ECCN代码EAR99
二极管类型ZENER DIODE
Base Number Matches1

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LESHAN RADIO COMPANY, LTD.
Zener Voltage Regulators
200 mW SOD−923 Surface Mount
This series of Zener diodes is packaged in a SOD−923 surface
mount package. They are designed to provide voltage regulation
protection and are especially attractive in situations where space is at a
premium. They are well suited for applications such as cellular
phones, hand held portables, and high density PC boards.
Specification Features:
LNZ9F2V4T5G Series
S-LNZ9F2V4T5G Series
1
Cathode
2
Anode
Standard Zener Breakdown Voltage Range
2.4 V to 24 V
Steady State Power Rating of 200 mW
Small Body Outline Dimensions:
2
1
SOD−923
MARKING
DIAGRAM
XM
1
2
0.039″ x 0.024″ (1.00 mm x 0.60 mm)
Low Body Height: 0.016″ (0.40 mm)
ESD Rating of Class 3 (>16 kV) per Human Body Model
These are Pb−Free Devices
S- Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC-Q101 Qualified and
PPAP Capable.
X
M
= Specific Device Code
= Month Code
ORDERING INFORMATION
Device
LNZ9F2V4T5G
Series
Package
SOD−923
(Pb−Free)
Shipping†
8000/Tape & Reel
Mechanical Characteristics:
CASE:
Void-free, transfer-molded, thermosetting plastic
Epoxy Meets UL 94 V−0
LEAD FINISH:
100% Matte Sn (Tin)
MOUNTING POSITION:
Any
QUALIFIED MAX REFLOW TEMPERATURE:
260°C
Device Meets MSL 1 Requirements
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
MAXIMUM RATINGS
Rating
Total Device Dissipation FR−5 Board,
@ T
A
= 25°C
Junction and Storage
Temperature Range
Symbol
P
D
T
J
, T
stg
Max
200
−65
to +150
Unit
mW
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
Rev.O 1/4

 
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