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UPD44646097F5-E27-FQ1

产品描述DDR SRAM, 8MX9, CMOS, PBGA165, 15 X 17 MM, PLASTIC, BGA-165
产品类别存储    存储   
文件大小398KB,共36页
制造商NEC(日电)
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UPD44646097F5-E27-FQ1概述

DDR SRAM, 8MX9, CMOS, PBGA165, 15 X 17 MM, PLASTIC, BGA-165

UPD44646097F5-E27-FQ1规格参数

参数名称属性值
是否Rohs认证不符合
包装说明LBGA,
Reach Compliance Codecompliant
其他特性PIPELINED ARCHITECTURE
JESD-30 代码R-PBGA-B165
JESD-609代码e0
长度17 mm
内存密度75497472 bit
内存集成电路类型DDR SRAM
内存宽度9
功能数量1
端子数量165
字数8388608 words
字数代码8000000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织8MX9
封装主体材料PLASTIC/EPOXY
封装代码LBGA
封装形状RECTANGULAR
封装形式GRID ARRAY, LOW PROFILE
并行/串行PARALLEL
峰值回流温度(摄氏度)NOT SPECIFIED
认证状态Not Qualified
座面最大高度1.51 mm
最大供电电压 (Vsup)1.9 V
最小供电电压 (Vsup)1.7 V
标称供电电压 (Vsup)1.8 V
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层TIN LEAD
端子形式BALL
端子节距1 mm
端子位置BOTTOM
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度15 mm
Base Number Matches1

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PRELIMINARY DATA SHEET
MOS INTEGRATED CIRCUIT
μ
PD44646095, 44646185, 44646365, 44646097, 44646187, 44646367
72M-BIT DDR II+ SRAM SEPARATE I/O
2.0 & 2.5 Cycle Read Latency
2-WORD BURST OPERATION
Description
The
μ
PD44646095 and
μ
PD44646097 are 8,388,608-word by 9-bit, the
μ
PD44646185 and
μ
PD44646187 are
4,194,304-word by 18-bit and the
μ
PD44646365 and
μ
PD44646367 are 2,097,152-word by 36-bit synchronous double
data rate static RAMs fabricated with advanced CMOS technology using full CMOS six-transistor memory cell.
The
μ
PD44646xx5 is for 2.0 cycle and the
μ
PD44646xx7 is for 2.5 cycle read latency. The
μ
PD44646095,
μ
PD44646097,
μ
PD44646185,
μ
PD44646187,
μ
PD44646365 and
μ
PD44646367 integrate unique synchronous peripheral circuitry and a
burst counter. All input registers controlled by an input clock pair (K and K#) are latched on the positive edge of K and K#.
These products are suitable for application which require synchronous operation, high speed, low voltage, high density
and wide bit configuration.
These products are packaged in 165-pin PLASTIC BGA.
Features
Core (V
DD
) = 1.8 ± 0.1 V power supply
I/O (V
DD
Q) = 1.5 ± 0.1 V power supply
165-pin PLASTIC BGA (15x17)
HSTL interface
PLL circuitry for wide output data valid window and future frequency scaling
DDR read or write operation initiated each cycle
Pipelined double data rate operation
Separate data input/output bus
Two-tick burst for low DDR transaction size
Two input clocks (K and K#) for precise DDR timing at clock rising edges only
Two Echo clocks (CQ and CQ#)
Data Valid pin (QVLD) supported
Read latency : 2.0 & 2.5 clock cycles (Not selectable by user)
Internally self-timed write control
Clock-stop capability. Normal operation is restored in 2,048 cycles after clock is resumed.
User programmable impedance output (35 to 70
Ω)
Fast clock cycle time : 2.66 ns (375 MHz) for 2.0 cycle read latency,
2.5 ns (400 MHz) for 2.5 cycle read latency
Simple control logic for easy depth expansion
JTAG 1149.1 compatible test access port
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. M18525EJ1V0DS00 (1st edition)
Date Published November 2006 NS CP(N)
Printed in Japan
2006

 
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