CAT5409
Quad Digitally Programmable Potentiometers
(DPP™) with 64 Taps and I²C Interface
FEATURES
Four linear taper digitally programmable
potentiometers
64 resistor taps per potentiometer
End to end resistance 2.5kΩ, 10kΩ, 50kΩ or
100kΩ
I²C interface
Low wiper resistance, typically 80Ω
Four non-volatile wiper settings for each
potentiometer
Recall of saved wiper settings at power-up
2.5 to 6.0 volt operation
Standby current less than 1µA
1,000,000 nonvolatile WRITE cycles
100 year nonvolatile memory data retention
24-lead SOIC and 24-lead TSSOP
Write protection for data register
For Ordering Information details, see page 15.
DESCRIPTION
The CAT5409 is four Digitally Programmable
Potentiometers (DPP™) integrated with control logic
and 16 bytes of NVRAM memory.
A separate 6-bit control register (WCR) independently
controls the wiper tap position for each DPP.
Associated with each wiper control register are four
6-bit non-volatile memory data registers (DR) used for
storing up to four wiper settings. Writing to the wiper
control register or any of the non-volatile data
registers is via a I²C serial bus. On power-up, the
contents of the first data register (DR0) for each of the
four potentiometers is automatically loaded into its
respective wiper control register (WCR).
¯¯¯
The Write Protection (WP) pin protects against
inadvertent programming of the data register.
The CAT5409 can be used as a potentiometer or as a
two terminal, variable resistor. It is intended for circuit
level or system level adjustments in a wide variety of
applications.
FUNCTIONAL DIAGRAM
PIN CONFIGURATION
SOIC (W)
SDA
A
1
R
L1
R
H1
R
W1
GND
NC
R
W2
R
H2
1
2
3
4
5
6
7
8
9
24 WP
23 A
2
22 R
W0
21 R
H0
20 R
L0
19 V
CC
18 NC
17 R
L3
16 R
H3
15 R
W3
14 A
0
13 NC
V
CC
R
L0
R
H0
R
W0
A
2
WP
SDA
A
1
R
L1
R
H1
R
W1
1
2
3
4
5
6
7
8
9
10
11
TSSOP (Y)
24 NC
23 R
L3
22 R
H3
21 R
W3
20 A
0
19 NC
18 A
3
17 SCL
16 R
L2
15 R
H2
14 R
W2
13 NC
SCL
SDA
R
H0
R
H1
R
H2
R
H3
I²C BUS
INTERFACE
WIPER CONTROL
REGISTERS
R
W0
WP
A
0
A
1
A
2
A
3
R
W1
CONTROL LOGIC
NONVOLATILE
DATA
REGISTERS
R
W2
R
W3
R
L0
R
L1
R
L2
R
L3
R
L2
10
SCL 11
A
3
12
GND 12
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
1
Doc. No. MD-2010 Rev. K
CAT5409
PIN DESCRIPTIONS
Pin#
(SOIC)
19
20
21
22
23
24
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
Pin#
(TSSOP)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
Name
V
CC
R
L0
R
H0
R
W0
A2
¯¯¯
WP
SDA
A1
R
L1
R
H1
R
W1
GND
NC
R
W2
R
H2
R
L2
SCL
A3
NC
A0
R
W3
R
H3
R
L3
NC
Function
Supply Voltage
Low Reference Terminal
for Potentiometer 0
High Reference Terminal
for Potentiometer 0
Wiper Terminal for
Potentiometer 0
Device Address
Write Protection
Serial Data Input/Output
Device Address
Low Reference Terminal
for Potentiometer 1
High Reference Terminal
for Potentiometer 1
Wiper Terminal for
Potentiometer 1
Ground
No Connect
Wiper Terminal for
Potentiometer 2
High Reference Terminal
for Potentiometer 2
Low Reference Terminal
for Potentiometer 2
Bus Serial Clock
Device Address
No Connect
Device Address, LSB
Wiper Terminal for
Potentiometer 3
High Reference Terminal
for Potentiometer 3
Low Reference Terminal
for Potentiometer 3
No Connect
SCL: Serial Clock
The CAT5409 serial clock input pin is used to clock all
data transfers into or out of the device.
SDA: Serial Data
The CAT5409 bidirectional serial data pin is used to
transfer data into and out of the device. The SDA pin is
an open drain output and can be wire-Ored with the
other open drain or open collector outputs.
A0, A1, A2, A3: Device Address Inputs
These inputs set the device address when addressing
multiple devices. A total of sixteen devices can be
addressed on a single bus. A match in the slave
address must be made with the address input in order
to initiate communication with the CAT5409.
R
H
, R
L
: Resistor End Points
The four sets of R
H
and R
L
pins are equivalent to the
terminal connections on a mechanical potentiometer.
R
W
: Wiper
The four R
W
pins are equivalent to the wiper terminal of
a mechanical potentiometer.
¯¯¯: Write Protect Input
WP
The ¯¯¯ pin when tied low prevents non-volatile writes
WP
to the data registers (change of wiper control register is
allowed) and when tied high or left floating normal
read/write operations are allowed.
See Write Protection
on page 7 for more details.
DEVICE OPERATION
The CAT5409 is four resistor arrays integrated with I²C serial interface logic, four 6-bit wiper control registers and
sixteen 6-bit, non-volatile memory data registers. Each resistor array contains 63 separate resistive elements
connected in series. The physical ends of each array are equivalent to the fixed terminals of a mechanical
potentiometer (R
H
and R
L
). R
H
and R
L
are symmetrical and may be interchanged. The tap positions between and
at the ends of the series resistors are connected to the output wiper terminals (R
W
) by a CMOS transistor switch.
Only one tap point for each potentiometer is connected to its wiper terminal at a time and is determined by the
value of the wiper control register. Data can be read or written to the wiper control registers or the non-volatile
memory data registers via the I²C bus. Additional instructions allows data to be transferred between the wiper
control registers and each respective potentiometer's non-volatile data registers. Also, the device can be
instructed to operate in an "increment/decrement" mode.
Doc. No. MD-2010 Rev. K
2
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT5409
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Temperature Under Bias
Storage Temperature
Voltage on Any Pin with Respect to V
SS(1) (2)
V
CC
with Respect to Ground
Package Power Dissipation Capability (T
A
= 25ºC)
Lead Soldering Temperature (10sec)
Wiper Current
RECOMMENDED OPERATING CONDITIONS
Parameters
V
CC
Industrial Temperature
POTENTIOMETER CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
R
POT
R
POT
R
POT
R
POT
Parameter
Potentiometer Resistance (-00)
Potentiometer Resistance (-50)
Potentiometer Resistance (-10)
Potentiometer Resistance (-2.5)
Potentiometer Resistance
Tolerance
R
POT
Matching
Power Rating
Wiper Current
Wiper Resistance
Wiper Resistance
Voltage on any R
H
or R
L
Pin
Resolution
Absolute Linearity
(5)
Relative Linearity
(6)
Temperature Coefficient of R
POT
Ratiometric Temp. Coefficient
Potentiometer Capacitances
Frequency Response
Test Conditions
Min
Typ
100
50
10
2.5
±20
25°C, each pot
I
W
= ±3mA @ V
CC
= 3V
I
W
= ±3mA @ V
CC
= 5V
V
SS
= 0V
R
W(n)(actual)
- R
(n)(expected)(8)
R
W(n+1)
- [R
W(n) + LSB
]
(8)
(4)
(4)
(4)
R
POT
= 50kΩ
(4)
±300
20
10/10/25
0.4
1
50
±6
300
150
V
CC
±1
±0.2
Max
Units
kΩ
kΩ
kΩ
kΩ
%
%
mW
mA
Ω
Ω
V
%
LSB
(7)
LSB
(7)
ppm/ºC
ppm/ºC
pF
MHz
Ratings
+2.5 to +6
-40 to +85
Units
V
°C
Ratings
-55 to +125
-65 to +150
-2.0 to +V
CC
+ 2.0
-2.0 to +7.0
1.0
300
±12
Units
ºC
°C
V
V
W
ºC
mA
I
W
R
W
R
W
V
TERM
80
GND
1.6
TC
RPOT
TC
RATIO
C
H
/C
L
/C
W
fc
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+2.0V for periods of less than 20ns.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V
CC
+1V.
(4) This parameter is tested initially and after a design or process change that affects the parameter.
(5) Absolute linearity is utilized to determine actual wiper voltage versus expected voltage as determined by wiper position when used as a potentiometer.
(6) Relative linearity is utilized to determine the actual change in voltage between two successive tap positions when used as a potentio-
meter. It is a measure of the error in step size.
(7) LSB = R
TOT
/ 63 or (R
H
- R
L
) / 63, single pot.
(8) n = 0, 1, 2, ..., 63
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc. No. MD-2010 Rev. K
CAT5409
D.C. OPERATING CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
I
CC
I
SB
I
LI
I
LO
V
IL
V
IH
V
OL1
Parameter
Power Supply Current
Standby Current (V
CC
= 5.0V)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage (V
CC
= 3.0V)
I
OL
= 3 mA
Test Conditions
f
SCL
= 400kHz
V
IN
= GND or V
CC
, SDA Open
V
IN
= GND to V
CC
V
OUT
= GND to V
CC
-1
V
CC
x 0.7
Min
Max
1
1
10
10
V
CC
x 0.3
V
CC
+ 1.0
0.4
Units
mA
µA
µA
µA
V
V
V
CAPACITANCE
(1)
T
A
= 25ºC, f = 1.0MHz, V
CC
= 5V
Symbol
C
I/O
C
IN
Test
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, A2, A3, SCL, ¯¯¯)
WP
Conditions
V
I/O
= 0V
V
IN
= 0V
Max.
8
6
Units
pF
pF
A.C. CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
f
SCL
T
I(1)
t
AA
t
BUF(1)
t
HD:STA
t
LOW
t
HIGH
t
SU:STA
t
HD:DAT
t
SU:DAT
t
R(1)
t
F
(1)
Parameter
Clock Frequency
Noise Suppression Time Constant at SCL, SDA Inputs
SLC Low to SDA Data Out and ACK Out
Time the bus must be free before a new transmission can
start
Start Condition Hold Time
Clock Low Period
Clock High Period
Start Condition SetupTime (for a Repeated Start Condition)
Data in Hold Time
Data in Setup Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Stop Condition Setup Time
Data Out Hold Time
Min
Typ
Max
400
50
0.9
Units
kHz
ns
µs
µs
µs
µs
µs
µs
ns
ns
1.2
0.6
1.2
0.6
0.6
0
100
0.3
300
0.6
50
µs
ns
µs
ns
t
SU:STO
t
DH
POWER UP TIMING
(1)
Symbol
t
PUR
t
PUW
Parameter
Power-up to Read Operation
Power-up to Write Operation
Max
1
1
Units
ms
ms
Note:
(1)
This parameter is tested initially and after a design or process change that affects the parameter.
Doc. No. MD-2010 Rev. K
4
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT5409
WRITE CYCLE LIMITS
Symbol
t
WR
Parameter
Write Cycle Time
Max
5
Units
ms
The write cycle is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the write
cycle, the bus interface circuits are disabled, SDA is allowed to remain high, and the device does not respond to its slave address.
RELIABILITY CHARACTERISTICS
Symbol
N
END(1)
T
DR
(1)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Max
Units
Cycles/Byte
Years
V
mA
V
ZAP(1)
I
LTH(1) (2)
Figure 1. Bus Timing
tF
tLOW
SCL
tSU:STA
tHD:STA
tHD:DAT
tSU:DAT
tSU:STO
tHIGH
tLOW
tR
SDA IN
tAA
SDA OUT
tDH
tBUF
Figure 2. Write Cycle Timing
SCL
SDA
8TH BIT
BYTE n
ACK
tWR
STOP
CONDITION
START
CONDITION
ADDRESS
Figure 3. Start/Stop Timing
SDA
SCL
START CONDITION
STOP CONDITION
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) t
PUR
and t
PUW
are delays required from the time V
CC
is stable until the specified operation can be initiated.
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
5
Doc. No. MD-2010 Rev. K
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