7\SH&05+LJK5HOLDELOLW\0LFD&DSDFLWRUV
Specifications
Capacitance
is within tolerance
when measured at these frequencies:
1–1000 pF @ 1 MHz
> 1000 pF @ 1 kHz
capacitors’ capacitance at 25
°C,
–55
°C,
25
°C,
125
°C
(or 150
°C)
and at 25
°C
af
ter stabilizing at each temperature. The
capacitance will meet the limits of the
Characteristic table shown in Ordering
Information.
every 2,000 hours. There will be no
visual damage and the capacitors will
meet the after-test limits on the following page.
Dissipation Factor
limits are be
low. Measure dissipation factor at 1
MHz when the capacitance is 1 pF to
1,000 pF, and at 1 kHz when the ca
pacitance is greater than 1,000 pF. Dis
sipation factor is equal to DF = 2πfRC,
where f is the test frequency, R is the
equivalent series resistance, and C is
the capacitance. For other capacitance
values, see Figure 1.
Capacitance
100–1000 pF
1100–3300 pF
3600–9100 pF
10,000 pF
Resistance to Solvents:
Subject
the capacitors to three cycles of 3
minute immersion in solvent, 10 strokes
with bristle brush and, where appli
cable,
1
/
2
minute in vapor, per MIL-STD
202, Method 215. Repeat the three
cycles for three solvent mixtures: Iso
propyl alcohol mixture (Solvent 1),
azeotrope mixture (Solvent 3), and
water/propylene-glycol mixture (Sol
vent 4). The marking will not rub off or
smear and there will be no visible dam
age to the capacitor body. Refer to MIL
STD-202 for details.
Failure Rate:
Type CMR capacitors
have specified failure rate levels rang
ing from 0.01% to 1.0% per 1,000
hours. The failure rate level is estab
lished at a 90% confidence level and is
referred to operational life at full-rated
voltage at maximum-rated tempera
ture.
Dissipation Factor
0.00075 max at 1 MHz
0.0014 max at 1 kHz
0.0013 max at 1 kHz
0.0012 max at 1 kHz
Quality Factor (Q)
is the re
ciprocal of dissipation factor.
High-Voltage Stabilization:
We
subject capacitors with Failure Levels
M, P, and R to a burn-in at twice-rated
voltage, at rated temperature, for a
minimum of 48 hours. Capacitors that
show damage, arcing, breakdown, or
low IR are removed. We reject the lot if
more than 8% of the capacitors fail.
Solderability:
After an 8-hour
steam aging, coat leads with a rosin
flux (R) and immerse in molten
245
°C ±5 °C
60/40 tin/lead solder. Solder
coverage will be no less than 95%
when examined at 10X magnification.
Resistance to Soldering Heat:
Capacitors will meet the requirements
of MIL-STD-202, Method 210 Test Con
dition G. Immerse capacitor leads to
within .250 inches (6.4 mm) of the body
in molten tin/lead solder (260
°C±5 °C)
for 10±2 seconds. Allow to cool. Capaci
tors will meet the after-test limits on
the following page.
Insulation Resistance
for ca
pacitances up to 10,000 pF is greater
than 100 G
at 25
°C,
greater than 10
G
at 125
°C,
and greater than 5 G
at
150
°C.
For other capacitance values
and temperatures, see Figure 2.
Marking
of capacitors conforms to
method I of MIL-STD-1285, and in
cludes the type designation, “JAN,”
brand, trademark, source code, date
code, rated voltage, capacitance, ca
pacitance tolerance, and highest rated
temperature. Small capacitors are
marked with the letter “J.”
Withstanding Voltage
is two
times the rated voltage, and can be ap
plied up to 5 seconds without damage.
Life Test:
Subject the capacitors to
maximum operating temperature
(+125
°C
or +150
°C)
with 1.5 times rated
voltage applied for 10,000 hours. Take
readings and make visual observations
Temperature Coefficient and
Capacitance Drift:
Measure the
INSULATION RESISTANCE (MEGOHMS)
.10
100,000
+25°C
DISSIPATION FACTOR
+85°C
+125°C
.01
10,000
+150°C
.001
Maximum dissipation factor
at 1 MHz for capacitance
values of 1,000 pF or less
.0001
Maximum dissipation factor
at 1 kHz for capacitance
values greater than 1,000 pF
1,000
1
10
100
1,000
10,000
100,000
100
5 10
100
1,000
10,000
62,000
CAPACITANCE (pF)
CAPACITANCE (pF)
Figure 1. DF vs. Capacitance
Figure 2. IR vs. Capacitance
CDE Cornell Dubilier•1605 E. Rodney French Blvd.•New Bedford, MA 02744•Ph: (508)996-8561•Fax: (508)996-3830• www.cde.com
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
