Guaranteed Input Logical HIGH Voltage for All Inputs
[3]
Guaranteed Input Logical LOW Voltage for All Inputs
[3]
V
SS
< V
IN
< V
CC
, V
CC
= Max.
V
CC
= Max., V
SS
< V
OUT
< V
CC
0.5V
[5,6]
Com’l
Mil/Ind
Com’l
Com’l
Mil/Ind
Mil/Ind
V
CC
= Max.,
V
IN
= GND,
Outputs Open in Unprogrammed
Device
Output Short Circuit Current V
CC
= Max., V
OUT
=
–130 mA
Operating Power Supply
Current
V
CC
= Max., V
IL
= 0V, V
IH
= 3V,
10, 15, 25 ns
Output Open, Device Programmed 5, 7.5 ns
as a 10-bit Counter,
15, 25 ns
f = 25 MHz
10 ns
Capacitance
[6]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
V
IN
= 2.0V @ f = 1 MHz
V
OUT
= 2.0V @ f = 1 MHz
Min.
Max.
10
10
Unit
pF
pF
Endurance Characteristics
[6]
Parameter
N
Description
Minimum Reprogramming Cycles
Test Conditions
Normal Programming Conditions
Min.
100
Max.
Unit
Cycles
Notes:
1. T
A
is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
IL
(Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-03027 Rev. *B
Page 4 of 13
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
AC Test Loads and Waveforms
5V
OUTPUT
CL
INCLUDING
JIG AND
SCOPE
(a)
3.0V
GND
< 2 ns
R2170Ω
(236Ω MIL)
INCLUDING
JIG AND
SCOPE
(b)
ALL INPUT PULSES
90%
10%
90%
10%
< 2 ns
(d)
Equivalent to:THÉVENIN Equivalent (Commercial)
99Ω
OUTPUT
2.08V = V
THC
OUTPUT
R1238Ω
(319Ω MIL)
5V
OUTPUT
5 pF
R1238Ω
(319Ω MIL)
OUTPUT
PALCE22V10
R2170Ω
(236Ω MIL)
CL
750Ω
(1.2KΩ
MIL)
(c)
Equivalent to: THÉVENIN Equivalent (Military)
136Ω
2.13V = V
THM
Load Speed
5, 7.5, 10, 15, 25 ns
C
L
50 pF
Parameter
t
ER (- )
t
ER (+)
t
EA (+)
t
EA (- )
Package
PDIP, CDIP,
PLCC, LCC
V
X
1.5V
2.6V
0V
V
thc
V
OH
V
OL
V
X
V
X
Output W
aveform Measurement Level
0.5V
0.5V
1.5V
V
X
V
X
V
OH
0.5V
(e) Test Waveforms
V
OL
Commercial Switching Characteristics PALCE22V10
22V10-5
Parameter
t
PD
t
EA
t
ER
t
CO
Description
Input to Output
Propagation Delay
[8]
Input to Output Enable Delay
[9]
Input to Output Disable Delay
[10]
Clock to Output Delay
[8]
2
Min.
3
Max.
5
6
6
4
2
Min.
3
[2, 7]
22V10-7
Max.
7.5
8
8
5
22V10-10
Min.
3
Max.
10
10
10
2
7
22V10-15
Min.
3
Max.
15
15
15
2
8
22V10-25
Min.
3
Max.
25
25
25
2
15
Unit
ns
ns
ns
ns
Notes:
7. Part (a) of AC Test Loads and Waveforms is used for all parameters except t
ER
and t
EA(+)
. Part (b) of AC Test Loads and Waveforms is used for t
ER
. Part (c) of AC Test
Loads and Waveforms is used for t
EA(+)
.
8. Min. times are tested initially and after any design or process changes that may affect these parameters.
9. The test load of (a) of AC Test Loads and Waveforms is used for measuring t
EA(-)
. The test load of (c) of AC Test Loads and Waveforms is used for measuring t
EA(+)
only.
Please see (e) of AC Test Loads and Waveforms for enable and disable test waveforms and measurement reference levels.
10. This parameter is measured as the time after output disable input that the previous output data state remains stable on the output. This delay is measured to
the point at which a previous HIGH level has fallen to 0.5V below V
OH
min. or a previous LOW level has risen to 0.5V above V
OL
max. Please see (e) of AC Test Loads
and Waveforms for enable and disable test waveforms and measurement reference levels.
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