PRODUCT INFORMATION
CUR 3105
May/2010
CUR 3105
Hall-Effect Current Transducer
The CUR 3105 is a current transducer
based on the Hall effect. The IC can be
used for very precise current measure-
ments. The output voltage is proportional to
the measured current and the supply volt-
age (ratiometric analog output). Major char-
acteristics, such as magnetic field range,
sensitivity, output quiescent voltage (output
voltage at B= 0 mT), and output voltage
range are programmable and are stored in
the internal EEPROM. It is possible to pro-
gram different transducers which are in par-
allel to the same supply voltage individually.
The CUR 3105 features a temperature-
compensated Hall plate with choppered off-
set compensation, an A/D converter, digital
signal processing, a D/A converter with out-
put driver, an EEPROM memory with redun-
dancy and lock function for the calibration
data, an EEPROM for customer serial num-
ber, a serial programming interface, and
protection devices at all pins. The internal
digital signal processing is of great benefit
because analog offsets, temperature shifts,
and mechanical stress do not degrade the
transducers accuracy.
The CUR 3105 is programmable by modu-
lating the supply voltage. No additional pro-
gramming pin is needed. The easy pro-
grammability allows a 2-point calibration by
adjusting the output voltage directly to the
input signal (current). Individual adjustment
of each transducer during the customer’s
manufacturing process is possible. With this
calibration procedure, the tolerances of the
IC and the mechanical positioning can be
compensated in the final assembly.
The calculation of the individual IC charac-
teristics and the programming of the
EEPROM memory can easily be done with
a PC and the application kit from Micronas.
The transducer is designed for industrial,
white goods and automotive applications
and operates with typically 5 V supply volt-
age in the wide junction temperature range
from
−40
°C up to 170 °C. The CUR 3105 is
available in the very small leaded package
TO92UT and the SMD package SOIC8.
V
V
V
V
V
V
V
V
V
V
V
Open-circuit (ground and supply line
break detection) with 5 kΩ pull-up and
pull-down resistor, overvoltage and
undervoltage detection
For programming an individual trans-
ducer within several ICs in parallel to the
same supply voltage, a selection can be
done via the output pin
Programmable clamping function
Programming through modulation of the
supply voltage
Operates from
−40
°C up to 170 °C
junction temperature
Operates from 4.5 V up to 5.5 V supply
voltage in specification and functions up
to 8.5 V
Operates with static magnetic fields and
dynamic magnetic fields up to 1 kHz
Overvoltage and reverse-voltage protec-
tion at all pins
Magnetic characteristics extremely
robust against mechanical stress
Short-circuit protected push-pull output
EMC and ESD optimized design
Features
V
V
V
V
High-precision current transducer with
ratiometric output and digital signal pro-
cessing
Low output voltage drifts over temperature
12-bit analog output
Multiple programmable magnetic char-
acteristics in a non-volatile memory
(EEPROM) with redundancy and lock
function
PRODUCT INFORMATION
CUR 3105
Development Tools
For engineering and production purposes,
Micronas offers an easy-to-use application kit:
Serial Port
May/2010
V
V
Micronas Programmer Board V 5.1
Visual Basic
®
programming software for
Windows
®
9x/2000/XP/Vista /7
HAL Programmer Board
Fig. 1:
Development tool setup
System Architecture
The CUR 3105 transducer is produced in a
proven submicron CMOS technology.
The CUR 3105 features a temperature-
compensated Hall plate with choppered off-
set compensation, an A/D converter, digital
signal processing, an analog output, an
EEPROM with redundancy and lock func-
tion for the calibration data and the data
register information, a serial interface for
programming the EEPROM, and protection
devices on all pins.
The CUR 3105 is programmable by modu-
lating the supply voltage. No additional pro-
gramming pin is needed.
The internal digital signal processing is a
great benefit because analog offsets, tem-
perature shifts, and mechanical stress do
not degrade the sensor accuracy.
GND
V
DD
Internally
stabilized
Supply and
Protection
Devices
Temperature
Dependent
Bias
Oscillator
Overvoltage,
Undervoltage
Detection
Protection
Devices
Switched
Hall Plate
A/D
Converter
Digital
Signal
Processing
D/A
Converter
Analog
Output
50
Ω
OUT
EEPROM Memory
Lock Control
Fig. 2:
Block diagram of the CUR 3105
All information and data contained in this product information are without any commitment, are not to be consid-
ered as an offer for conclusion of a contract, nor shall they be construed as to create any liability. Product or
development sample availability and delivery are exclusively subject to our respective order confirmation form. By
this publication, Micronas GmbH does not assume responsibility for patent infringements or other rights of third
parties which may result from its use.
No part of this publication may be reproduced, photo-
copied, stored on a retrieval system, or transmitted
without the express written consent of Micronas GmbH.
Edition May 14, 2010; Order No. PI000136_002EN
Micronas GmbH
⋅
Hans-Bunte-Strasse 19
⋅
D-79108 Freiburg (Germany)
⋅
P.O. Box 840
⋅
D-79008 Freiburg (Germany)
Tel. +49-761-517-0
⋅
Fax +49-761-517-2174
⋅
E-mail: docservice@micronas.com
⋅
www.micronas.com
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