184pin Registered DDR SDRAM DIMMs based on 512Mb B ver. (TSOP)
This Hynix Registered Dual In-Line Memory Module (DIMM) series consists of 512Mb B ver. DDR SDRAMs in 400mil.
TSOP II packages on a 184pin glass-epoxy substrate. This Hynix 512Mb B ver. based Registered DIMM series provide
a high performance 8-byte interface in 5.25" width form factor of industry standard. It is suitable for easy interchange
and addition.
FEATURES
•
•
•
•
•
•
•
•
JEDEC Standard 184-pin dual in-line memory module
(DIMM)
Two ranks 256M x 72 organization
Error Check Correction (ECC) Capability
2.5V
±
0.2V VDD and VDDQ Power supply for
DDR333 and below
All inputs and outputs are compatible with SSTL_2
interface
Fully differential clock operations (CK & /CK) with
100/133 MHz
DLL aligns DQ and DQS transition with CK transition
Programmable CAS Latency: DDR200(2 clock),
DDR266(2, 2.5 clock)
•
•
•
•
•
•
•
Programmable Burst Length 2 / 4 / 8 with both
sequential and interleave mode
Edge-aligned DQS with data outs and Center-aligned
DQS with data inputs
Auto refresh and self refresh supported
8192refresh cycles / 64ms
Serial Presence Detect (SPD) with EEPROM
Built with 512Mb DDR SDRAMs in 400 mil TSOP II
packages
Lead-free product listed for each configuration
(RoHS compliant)
ADDRESS TABLE
Organization
2GB
128M x 72
Ranks
2
SDRAMs
128Mb x 4 (Stacked)
# of
DRAMs
36
# of row/bank/column Address
13(A0~A12)/2(BA0,BA1)/12(A0~A9,A11,A12)
Refresh
Method
8K / 64ms
PREFORMANCE
Part-Number Suffix
Speed Bin
CL - tRCD- tRP
CL=3
Max Clock
Frequency
CL=2.5
CL=2
-K
DDR266A
2-3-3
-
133
133
-H
DDR266B
2.5-3-3
-
133
133
-L
DDR200
2-2-2
-
100
100
Unit
-
CK
MHz
MHz
MHz
Rev. 1.1 / May. 2005
1
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any
responsibility for use of circuits described. No patent licenses are implied.
184pin Registered DDR SDRAM DIMMs
ORDERING INFORMATION
Part Number
HYMD525G726BS4-K/H/L
HYMD525G726BSP4-K/H/L
HYMD525G726BS4M-K/H/L
HYMD525G726BSP4M-K/H/L
Density
2GB
2GB
2GB
2GB
Organization
256Mb x 4 (stacked)
256Mb x 4 (stacked)
256Mb x 4 (stacked)
256Mb x 4 (stacked)
# of
DRAMs
36
36
36
36
Material
Normal
Pb-free
1
Normal
Pb-free
1
DIMM Dimension
133.35 x 43.18 x 6.81 [mm
3
]
↑
133.35 x 30.48 x 6.81 [mm
3
]
↑
Note:
1. The “Pb-free” products contain Lead less than 0.1% by weight and satisfy RoHS - please contact Hynix for product availability.
* These products are built with HY5DU124(8,16)22BT[P], the Hynix DDR SDRAM component.
Rev. 1.1 /May. 2005
2
184pin Registered DDR SDRAM DIMMs
PIN DESCRIPTION
Pin
CK0, /CK0
/CS0, /CS1
CKE0, CKE1
/RAS, /CAS, /WE
A0 ~ A13
A10/AP
BA0, BA1
DQ0~DQ63
CB0~CB7
DQS0~DQS8
DM0~8
Pin Description
Differential Clock Inputs
Chip Select Inputs
Clock Enable Inputs
Commend Sets Inputs
Address Inputs
Address Input/Autoprecharge
Bank Address
Data Inputs/Outputs
Data Check bits
Data Strobes
Data-in Masks
Pin
VDD
VDDQ
VSS
VREF
VDDSPD
VDDID
SA0~SA2
SCL
SDA
DU
NC
TEST
Pin Description
Power Supply for Core and I/O
Power Supply for DQs
Ground
Input/Output Reference
Power Supply for SPD
VDD, VDDQ Level Detection
SPD Address Inputs
SPD Clock Input
SPD Data Input/Output
Do not Use
No Connect
Reserved for test equipment use
PIN ASSIGNMENT
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
Name
VREF
DQ0
VSS
DQ1
DQS0
DQ2
VDD
DQ3
NC
NC
VSS
DQ8
DQ9
DQS1
VDDQ
NC,CK1
NC,/CK1
VSS
DQ10
DQ11
CKE0
VDDQ
DQ16
DQ17
DQS2
VSS
A9
DQ18
A7
VDDQ
DQ19
Pin
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
Name
A5
DQ24
VSS
DQ25
DQS3
A4
VDD
DQ26
DQ27
A2
VSS
A1
CB0
CB1
VDD
DQS8
A0
CB2
VSS
CB3
BA1
Key
DQ32
VDDQ
DQ33
DQS4
DQ34
VSS
BA0
DQ35
DQ40
Pin
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
Name
VDDQ
/WE
DQ41
/CAS
VSS
DQS5
DQ42
DQ43
VDD
NC,/CS2
DQ48
DQ49
VSS
NC,/CK2
NC,CK2
VDDQ
DQS6
DQ50
DQ51
VSS
VDDID
DQ56
DQ57
VDD
DQS7
DQ58
DQ59
VSS
NC
SDA
SCL
Pin
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
Name
VSS
DQ4
DQ5
VDDQ
DM0,DQS9
DQ6
DQ7
VSS
NC
NC,TEST
NC,/FETEN
VDDQ
DQ12
DQ13
DM1,DQS10
VDD
DQ14
DQ15
CKE1
VDDQ
NC,BA2
DQ20
NC,A12
VSS
DQ21
A11
DM2,DQS11
VDD
DQ22
A8
DQ23
Pin
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
Name
VSS
A6
DQ28
DQ29
VDDQ
DM3,DQS12
A3
DQ30
VSS
DQ31
CB4
CB5
VDDQ
CK0
/CK0
VSS
DM8,DQS17
A10
CB6
VDDQ
CB7
Key
VSS
DQ36
DQ37
VDD
DM4,DQS13
DQ38
DQ39
VSS
DQ44
Pin
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
Name
/RAS
DQ45
VDDQ
/CS0
/CS1
DM5,DQS14
VSS
DQ46
DQ47
NC,/CS3
VDDQ
DQ52
DQ53
NC,A13
VDD
DM6
DQ54
DQ55
VDDQ
NC
DQ60
DQ61
VSS
DM7,DQS16
DQ62
DQ63
VDDQ
SA0
SA1
SA2
VDDSPD
Rev. 1.1 /May. 2005
3
184pin Registered DDR SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
2GB, 256Mb x 72 ECC Registered DIMM: HYMD525G726BS[P]4[M]
VSS
/RS1
/RS0
DQS0
DQ00
DQ01
DQ02
DQ03
DQS1
DQ08
DQ09
DQ10
DQ11
DQS2
DQ16
DQ17
DQ18
DQ19
DQS3
DQ24
DQ25
DQ26
DQ27
DQS4
DQ32
DQ33
DQ34
DQ35
DQS5
DQ40
DQ41
DQ42
DQ43
DQS6
DQ48
DQ49
DQ50
DQ51
DQS7
DQ56
DQ57
DQ58
DQ59
DQS8
CB0
CB1
CB2
CB3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DQS /CS
I/O0
I/O1
I/O2
I/O3
DM
DM0/DQS9
D0
D18
DQ04
DQ05
DQ06
DQ07
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D9
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D27
DM1/DQS10
DM
D1
D19
DQ12
DQ13
DQ14
DQ15
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D10
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D28
DM2/DQS11
DM
D2
D20
DQ20
DQ21
DQ22
DQ23
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D11
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D29
DM3/DQS12
DM
D3
D21
DQ28
DQ29
DQ30
DQ31
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D12
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D30
DM4/DQS13
DM
D4
D22
DQ36
DQ37
DQ38
DQ39
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D13
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D31
DM5/DQS14
DM
D5
D23
DQ44
DQ45
DQ46
DQ47
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D14
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D32
DM6/DQS15
DM
D6
D24
DQ52
DQ53
DQ54
DQ55
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D15
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D33
DM7/DQS16
DM
D7
D25
DQ60
DQ61
DQ62
DQ63
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D16
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D34
DM8/DQS17
DM
D8
D26
CB4
CB5
CB6
CB7
VDDSPD
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D17
DQS /CS
I/O0
I/O1
D0
I/O2
I/O3
DM
D35
/S0
/S1
BA0-BA1
A0-A12
/RAS
/CAS
CKE0
CKE1
/WE
PCK
/PCK
Serial PD
DO-D35
DO-D35
WP
DO-D35
R
E
G
I
S
T
E
R
/RS0->/CS : SDRAMs D0-D17
/RS1->/CS : SDRAMs D18-D35
RBA0-RBA1-> : BA0->BA1 : SDRAMs D0-D35
VDDQ
VDD
VREF
Serial PD
SCL
A0 A1 A2
SDA
RA0-RA12-> : A0->A12 : SDRAMs D0-D35
SA0 SA1SA2
DO-D35
VSS
/RRAS->/RAS : SDRAMs D0-D35
/RCAS->/CAS : SDRAMs D0-D35
VDDID
Strap:see Note 4
Note :
RCKE0->CKE : SDRAMs D0-D17
1. DQ-to-I/O wiring may be changed within a byte.
RCKE1->CKE : SDRAMs D18-D35
2. DQ/DQS/DM/CKE/S relationships must be maintained as shown.
/RWE->WE : SDRAMs D0-D35
/RESET
CKO, /CKO------PLL*
* Wire per Clock Loading Table/Wiring Diagram
3. DQ/DQS resistors should be 22 Ohms.
4. V
DDID
strap connections (for memory device V
DD
, V
DDQ
) :
STRAP OUT (OPEN) : V
DD
= V
DDQ
STRAP IN (V
SS
) : V
DD
≠
V
DDQ
5. Address and control resistors should be 22 Ohms.
6. Each Chip Select and CKE pair alternate between decks for thermal
enhancement.
Rev. 1.1 /May. 2005
4
184pin Registered DDR SDRAM DIMMs
ABSOLUTE MAXIMUM RATINGS
1
Parameter
Operating Temperature (Ambient)
Storage Temperature
Voltage on V
DD
relative to V
SS
Voltage on V
DDQ
relative to V
SS
Voltage on inputs relative to Vss
Voltage on I/O pins relative to Vss
Output Short Circuit Current
Soldering Temperature
⋅
Time
Symbol
T
A
T
STG
V
DD
V
DDQ
V
INPUT
V
IO
IOS
T
SOLDER
Rating
0 ~ 70
-55 ~ 150
-1.0 ~ 3.6
-1.0 ~ 3.6
-1.0 ~ 3.6
-0.5 ~3.6
50
260
⋅
10
o
C
Unit
o
C
o
C
V
V
V
V
mA
⋅
Sec
Note:
1. Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITIONS
(TA=0 to 70
o
C, Voltage referenced to V
SS
= 0V)
Parameter
Power Supply Voltage
Power Supply Voltage
Input High Voltage
Input Low Voltage
Termination Voltage
Reference Voltage
Input Voltage Level, CK and CK inputs
Input Differential Voltage, CK and CK inputs
V-I Matching: Pullup to Pulldown Current Ratio
Input Leakage Current
Output Leakage Current
Normal Strength
Output Driver
Output High Current
(min VDDQ, min VREF, min VTT)
(min VDDQ, max VREF, max VTT)
Half Strength Out- Output High Current
put Driver
(min VDDQ, min VREF, min VTT)
(VOUT=VTT
±
0.68)
Output Low Current
Symbol
V
DD
V
DDQ
V
IH
V
IL
V
TT
V
REF
VIN(DC)
VID(DC)
VI(RATIO)
I
LI
I
LO
IOH
IOL
IOH
IOL
Min
2.3
2.3
V
REF
+ 0.15
-0.3
V
REF
- 0.04
0.49*VDDQ
-0.3
0.36
0.71
-2
-5
-16.8
16.8
-13.6
13.6
Typ.
2.5
2.5
-
-
V
REF
0.5*VDDQ
-
-
-
-
-
-
-
-
-
Max
2.7
2.7
V
DDQ
+ 0.3
V
REF
- 0.15
V
REF
+ 0.04
0.51*VDDQ
VDDQ+0.3
VDDQ+0.6
1.4
2
5
-
-
-
-
Unit
V
V
V
V
V
V
V
V
-
uA
uA
mA
mA
mA
mA
Note
1
3
4
5
6
7
8
(VOUT=VTT
±
0.84)
Output Low Current
(min VDDQ, max VREF, max VTT)
Note:
1. V
DDQ
must not exceed the level of V
DD
.
2. V
IL
(min) is acceptable -1.5V AC pulse width with < 5ns of duration.
3. VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of the same. Peak to
peak noise on VREF may not exceed
±
2% of the DC value.
4. VID is the magnitude of the difference between the input level on CK and the input level on /CK.
5. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire tempera-
ture and voltage range, for device drain to source voltages from 0.25V to 1.0V. For a given output, it represents the maximum differ-
ence between pullup and pulldown drivers due to process variation. The full variation in the ratio of the maximum to minimum
pullup and pulldown current will not exceed 1/7 for device drain to source voltages from 0.1 to 1.0.
6. VIN=0 to VDD, All other pins are not tested under VIN =0V.
7. DQs are disabled, VOUT=0 to VDDQ.
Rev. 1.1 /May. 2005
5