IDT54/74FCT162823AT/BT/CT
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS 18-BIT
REGISTER
IDT54/74FCT162823AT/BT/CT
FEATURES:
−
−
−
−
−
−
−
−
−
−
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK
(o) (Output Skew) < 250ps
Low input and output leakage
≤1µ
A (max.)
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
V
CC
= 5V ±10%
Balanced Output Drivers:
•
±24mA (industrial)
•
±16mA (military)
Reduced system switching noise
Typical V
OLP
(Output Ground Bounce) < 0.6V at V
CC
= 5V,T
A
=
25°C
Available in the following packages:
•
Industrial: SSOP, TSSOP, TVSOP
•
Military: CERPACK
DESCRIPTION:
The FCT162823T 18-bit bus interface register is built using advanced,
dual metal CMOS technology. These high-speed, low-power registers with
clock enable (xCLKEN) and clear (xCLR) controls are ideal for parity bus
interfacing in high-performance synchronous systems. The control inputs
are organized to operate the device as two 9-bit registers or one 18-bit
register. Flow-through organization of signal pins simplifies layout. All inputs
are designed with hysteresis for improved noise margin.
The FCT162823T has balanced output drive with current limiting
resistors. This offers low ground bounce, minimal undershoot, and con-
trolled output fall times – reducing the need for external series terminating
resistors. The FCT162823T is a plug-in replacement for the FCT16823T
and ABT16823 for on-board interface applications.
FUNCTIONAL BLOCK DIAGRAM
2
1
OE
1
CLR
1
CLK
55
1
CLKEN
2
CLKEN
1
56
2
CLK
2
OE
2
CLR
27
28
29
30
R
C
D
54
1
D
1
2
D
1
3
1
Q
1
42
R
C
D
15
2
Q
1
TO EIGHT OTHER CHANNELS
TO EIGHT OTHER CHANNELS
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
1
c
1999
Integrated Device Technology, Inc.
OCTOBER 2000
DSC-5437
IDT54/74FCT162823AT/BT/CT
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
PIN CONFIGURATION
1
CLR
1
OE
1
Q
1
ABSOLUTE MAXIMUM RATINGS
(1)
56
55
54
53
52
51
50
49
48
47
46
45
44
1
CLK
1
CLKEN
1
D
1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
SO56-1
SO56-2
SO56-3
E56-1
Symbol
V
TERM(2)
V
TERM(3)
T
STG
I
OUT
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
5v16-link
GND
1
Q
2
1
Q
3
GND
1
D
2
1
D
3
V
CC
1
Q
4
1
Q
5
1
Q
6
V
CC
1
D
4
1
D
5
1
D
6
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
GND
1
Q
7
1
Q
8
1
Q
9
2
Q
1
2
Q
2
2
Q
3
GND
1
D
7
1
D
8
1
D
9
2
D
1
2
D
2
2
D
3
CAPACITANCE
(T
A
= +25
O
C, f = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
5v16-link
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
xDx
xCLK
xCLKEN
xCLR
xOE
xQx
Description
Data inputs
Clock Inputs
Clock Enable Inputs (Active LOW)
Asynchronous clear Inputs (Active LOW)
Output Enable Inputs (Active LOW)
3-State Outputs
GND
2
Q
4
2
Q
5
2
Q
6
GND
2
D
4
2
D
5
2
D
6
V
CC
2
Q
7
2
Q
8
V
CC
2
D
7
2
D
8
GND
2
Q
9
2
OE
2
CLR
GND
2
D
9
2
CLKEN
2
CLK
FUNCTION TABLE
(1)
xOE
H
L
L
H
xCLR
X
L
H
H
H
H
H
Inputs
xCLKEN
X
X
H
L
L
L
L
xCLK
X
X
X
↑
↑
↑
↑
xDx
X
X
X
L
H
L
H
Outputs
xQx
Z
L
Q
(2)
Z
Z
L
H
Function
High Z
Clear
Hold
Load
SSOP/ TSSOP/ TVSOP/ CERPACK
TOP VIEW
H
L
L
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
2. Output level before indicated steady-state input conditions were
established.
2
IDT54/74FCT162823AT/BT/CT
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= -40°C to +85°C, V
CC
= 5.0V ±10%; Military: T
A
= -55°C to +125°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
V
mA
mV
µA
µA
Unit
V
V
µA
5v16-link
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN
= V
IH
or V
IL
, V
O
= 1.5V
(3)
V
CC
= 5V, V
IN
= V
IH
or V
IL
, V
O
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –16mA MIL
I
OH
= –24mA IND.
I
OL
= 16mA MIL
I
OL
= 24mA IND.
5v16-link
Min.
60
–60
2.4
—
Typ.
(2)
115
–115
3.3
0.3
Max.
200
–200
—
0.55
Unit
mA
mA
V
V
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ±5µA at T
A
= -55°C.
3
IDT54/74FCT162823AT/BT/CT
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply Current
(4)
Test Conditions
(1)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
xOE = xCLKEN = GND
One Input Toggling
50% Duty Cycle
V
CC
= Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
xOE = xCLKEN = GND
at fi = 5MHz
50% Duty Cycle
One Bit Toggling
V
CC
= Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
xOE = xCLKEN = GND
at fi = 2.5MHz
50% Duty Cycle
Eighteen Bits Toggling
V
IN
= V
CC
V
IN
= GND
Min.
—
—
Typ.
(2)
0.5
75
Max.
1.5
120
Unit
mA
µ A/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.8
1.7
mA
V
IN
= 3.4V
V
IN
= GND
—
1.3
3.2
V
IN
= V
CC
V
IN
= GND
—
4.2
7.1
(5)
V
IN
= 3.4V
V
IN
= GND
—
9.2
22.1
(5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at DH
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT54/74FCT162823AT/BT/CT
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL
FCT162823AT
Symbol
t
PLH
t
PHL
Propagation Delay
xCLK to xQx
Parameter
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(5)
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(5)
R
L
= 500Ω
C
L
= 5pF
(5)
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
Min
.
(2)
1.5
1.5
1.5
1.5
1.5
1.5
1.5
3
1.5
3
0
6
6
6
—
Max
.
10
20
14
12
23
7
8
—
—
—
—
—
—
—
0.5
FCT162823BT
Min
.
(2)
1.5
1.5
1.5
1.5
1.5
1.5
1.5
3
1.5
3
0
6
6
6
—
Max
.
7.5
15
9
8
15
6.5
7.5
—
—
—
—
—
—
—
0.5
FCT162823CT
Min
.
(2)
1.5
1.5
1.5
1.5
1.5
1.5
1.5
1.5
0
2.5
0
3
3
3
—
Max
.
4.7
8
4.7
4.4
9
3.6
3.6
—
—
—
—
—
—
—
0.5
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Unit
ns
t
PHL
t
PZH
t
PZL
Propagation Delay
x
CLR
to xQx
Output Enable Time
x
OE
to xQx
t
PHZ
t
PLZ
Output Disable Time
x
OE
to xQx
t
SU
t
H
t
SU
t
H
t
W
t
W
t
REM
t
SK
(o)
Set-up Time HIGH or LOW xDx to xCLK
Hold Time HIGH or LOW xDx to xCLK
Set-up Time HIGH or LOW x
CLKEN
to xCLK
Hold Time HIGH or LOW x
CLKEN
to xCLK
xCLK Pulse Width HIGH or LOW
x
CLR
Pulse Width LOW
Recovery Time x
CLR
to xCLK
Output Skew
(3)
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This limit is guaranteed but not tested.
5. This condition is guaranteed but not tested.
5
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