REVISION
REVISIONS
DESCRIPTION
APPROVED
DATE
A
B
C
D
Updated part numbers
Edited Part Numbers
Edited
Changed par. 3.1.1 split supply and load variation from frequency
stability Vs. temperature characteristics, phase noise limits @10Hz
and 100 Hz) Add par. 3.4.2 Logic microcircuits and Radiation
(ECO# 10549)
Luis Vargas
Luis Vargas
Luis Vargas
C. Albright
1/9/09
6/21/2009
12/2/2010
4/26/12
CONSULT FACTORY FOR CURRENT REVISION
50MHz TCXO ,Vcc=12v,+25ºC
9/17/08
frequency drift, PPM
Aging Data
0.3
-30
-40
-50
-60
-70
-80
0.25
0.2
L(f), dBc
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
1
10
100
1000
10000
100000
0.15
0.1
0.05
0
0 1 2 3 4 5
6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
Frequency Offset, HZ
elapsed time, days
Example 1 of Temperature Stability
2.0
Example 2 of Temperature Stability
1.5
1.0
freq error, PPM
freq error, PPM
0.5
0.0
-0.5
-1.0
-1.5
-2.0
-50 -45 -40 -35 -30 -25 -20 -15 -10 -5
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 35 90
temp, deg
temp, deg
SPECIFICATION CONTROL DRAWING
UNLESS OTHERWISE
SPECIFIED, DIMENSIONS
ARE IN INCHES.
TOLERANCES:
3 PLACE DECIMAL = .005
2 PLACE DECIMAL = .02
1 PLACE DECIMAL = .1
FRACTIONS = ± 1/16
ANGLES = 2 DEGREES
RELEASED BY:
P. Steinblums 4/26/12
PREPARED BY:
Luis Vargas
CHECKED BY:
B. Remtulla
DATE
4/25/12
DATE
4/26/12
DATE
4/26/12
SCALE
Q-TECH CORPORATION
10150 W. JEFFERSON BLVD.
CULVER CITY, CA 90232-3510
LOW PROFILE 24 PIN DDIP HYBRID CRYSTAL
OSCILLATOR, TCXO, CLASS S,
Standard Design For HCMOS up to 90MHz
DRAWING NO.:
REVISION
QT801 and QT802
Square-Wave
SIZE
CAGE CODE
D
APPROVED BY:
C. Albright
NONE
A
51774
SHEET 1 of 10
ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL
1.0
SCOPE
This specification establishes the detail requirements for low profile hybrid, hermetically sealed,
HCMOS output temperature compensated crystal oscillators (TCXO) for use in space flight missions
2.0
APPLICABLE DOCUMENTS
The following documents of the latest issue form a part of this drawing to the extent specified herein.
2.1
Specifications and Standards
SPECIFICATIONS
MILITARY
MIL-S-19500
MIL-PRF-55310
MIL-PRF-38535
MIL-PRF-38534
Semiconductor Devices, General Specification For
Crystal Oscillators, General Specification For
Integrated Circuits, (Microcircuits) Manufacturing, General Specification For
Hybrid Microcircuits, General Specification For
STANDARDS
MILITARY
MIL-STD-202
MIL-STD-883
MIL-STD-1686
Test Methods for Electronic and Electrical Component Parts
Test Methods and Procedures for Microelectronics
Electrostatic Discharge Control Program for Protection of Electrical and Electronics Parts,
Assemblies and Equipment.
2.2
Conflicting Requirements
In the event of conflict between requirements of this specification and other requirements of the
applicable detail drawing, the precedence in which requirements shall govern, in descending order, is
as follows:
a) Applicable Customer purchase order.
b) Applicable detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.
2.3
Customer Purchase Order Special Requirements
Additional special requirements shall be specified in the applicable Customer purchase order when
additional requirements or modifications specified herein are needed for compliance to special
program or product line requirements.
3.0
3.1
PERFORMANCE REQUIREMENTS
General Definition
The TCXO is a high reliability signal generator that provides a square-wave output. The TCXO has
been designed to operate in a spaceflight environment with an expected lifetime in excess of 15 years.
Lifetime is defined as the sum of operational and storage environments.
QT801 and QT802 Square-Wave
24 pin DDIP
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
A
51774
D
Sheet 2 of 10
Culver City, CA 90232
ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL
SIZE
CAGE NO.
3.1.1
Electrical Characteristics
SYMBOL
fo
Vs
Is
Δf/fc
(Ta)
Δf/fo
(ΔVcc)
CONDITIONS
-
Vs±5%
Vs, nom. / Ta=+25°C
Contact factory for other options
available
PARAMETER
Frequency Nom.
Supply voltage, Nom.
Input Current, max.
Freq. stability vs. Operating
temperature
Electrical Frequency
Adjustment Min.
(when specified)
VALUE
3. to 90
See part number
generation table
UNIT
MHz
V
mA
ppm
ppm
50
See part number
generation table
±5 PPM Two options:
1) via an external select-at-test
resistor connected from Pin 1
to Ground
2) Via External tuning voltage
Ta=+25°C
Vs, nom. / Ta=+25°C
over 10 year (first year
≤
1 ppm)
Met by design, not tested
Δt=1sec.
(Allan Deviation)
Contact factory for other options
available
±5.0
Freq. stability vs. ±5 %
Input Voltage Variation
Freq. stability vs. ±5 %
Load Variation
Aging Max
Freq. stability vs. Vacuum
Short term stability
RF Output
Δf/fc
(Vs)
Δf/fc
(Load)
Δf/fo
Δf/fo
Δf/fc(Δt)
±1.2
0.3
±5.0
±0.2
0.001
30 to 70
70.1 to
3rd
90
3
rd
X
0.9•Vcc / 0.1•Vcc
See part number
generation table
ppm
ppm
ppm
ppm
ppm
MHz
Output
Duty cycle
Rise- / fall time
Load
Phase noise @ freq. offset
VOH / VOL load=15pF, Vcc=nom.
DC
tr / tf
£
£
£
£
£
(Δf)
(Δf)
(Δf)
(Δf)
(Δf)
load=15pF/ @50%Vcc, Ta=+25°C
20%~80% Vout, 80%~20% Vout
Δf=10Hz
Δf=100Hz
Δf=1kHz
Δf=10kHz
Δf=100kHz
V
%
nSec
pF
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
.5…7 (see note A)
15
-70
70.1 to 90
-100
MHZ
Contact
-130
factory for
-140
other
-140
options
available
A:
Supply Current, rise & fall time are frequency dependent
3.2
Absolute Maximum Rating
CHARACTERISTICS
Supply Voltage
DC Input Current
Storage Temperature range
Lead Temperature (Soldering, 10 seconds)
MAXIMUM RATINGS
0 to +6.0 VDC
50 mA maximum
-55°C to +125°C
300°C
REMARKS
Note 1
Note 1
Note 1
Note 1
Notes: 1 – Without irreversible damages
Q-TECH Corporation
10150 W. Jefferson Blvd.
A
51774
D
Sheet 3 of 10
Culver City, CA 90232
ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL
SIZE
CAGE NO.
QT801 and QT802 Square-Wave
24 pin DDIP
REV.
3.2.1
Physical Characteristics
3.2.1.1 Dimensions - The TCXO outline dimensions and terminal connections shall be as shown in Figure 1
herein.
3.2.1.2 Weight - The TCXO shall weigh less than or equal to 15 grams.
3.2.1.3 Materials - The TCXO package body and lead finish shall be gold in accordance with MIL-PRF-38534.
3.3
Design and Construction
The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the
oscillators shall meet the design and construction requirements of MIL-PRF-55310, except element
evaluation shall be as specified in 3.3.1
SCREENING FLOW CHART
Operation
Non-Destruct Wire Bond Pull
Internal Visual
100%, MIL-STD-883, Method 2023 (2.4 grams)
MIL-STD-883, methods 2017 & 2032 condition K (class S). During the
time interval between final internal visual inspection and preparation for
sealing, hybrid crystal oscillators shall be stored in a dry, controlled
environment as defined in MIL-STD-883, method 2017 or in a vacuum
bake oven.
48 hrs minimum @ +150°C MIL-STD-883, Method 1008 TC B
MI-STD 883, Method 1011, TC A
MI-STD 883, Method 1010, TC B
MIL-STD-883, Method 2001, TC A (5000 gs, Y1 Axis only)
MIL-STD-883, Method 2020, TC B
Frequency, Output levels, Input Current@ +25°C
+125°C for 240 hours
100% Method 1014, (TC A1 for fine leak and TC C for gross leak)
Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical Specification
MIL-STD-883, Method 2012 class S
MIL-STD-883 Method 2009
Stabilization Bake
Thermal Shock
Temperature Cycling
Constant Acceleration
PIND
Electrical Test
Burn-In (Powered with load)
Seal Test (fine & gross)
Electrical Test
Radiographic
External visual
Q-TECH Corporation
10150 W. Jefferson Blvd.
A
51774
D
Sheet 4 of 10
Culver City, CA 90232
ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL
SIZE
CAGE NO.
QT801 and QT802 Square-Wave
24 pin DDIP
REV.
Group A Inspection
PARAMETER
Input Current, max.
Freq. stability vs.
temperature
SYMBOL
CONDITIONS
Is
Vs, nom. / Ta=+25°C
Δf/fc
(Ta)
Vs, nominal and over the temperature
range indicated under part number
definition
Δf/fo
(ΔVcc)
VOH /
VOL
DC
± Vs, nom. / Ta=+25°C as indicated
under part number definition
load=15pF, Vcc=nom.
load=15pF/ @50%Vcc, Ta=+25°C
VALUE
50
indicated under
part number
definition
indicated under
part number
definition
0.9•Vcc / 0.1•Vcc
indicated under
part number
definition
.5…7 (see note A)
ppm
UNIT
mA
ppm
Electrical Frequency
Adjustment Min.
(when specified)
Output
Duty cycle
V
%
Rise- / fall time
External Visual
tr / tf
20%~80% Vout, 80%~20% Vout
MIL-STD-883, Method 2009
nSec
A:
Supply Current, rise & fall time are frequency dependent
Group B Inspection
SUB-
GROUP
1
2
3
TEST DESCRIPTION
Frequency Aging
Hermetic Seal 1/
Electrical 1/ (Go/NoGo)
CONDITION
MIL-PRF-55310
Para 3.6.34.2
Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C
QTY
100%
100%
100%
1/ Testing shall be performed after completion of Frequency Aging and before parts are shipped.
Q-TECH Corporation
10150 W. Jefferson Blvd.
A
51774
D
Sheet 5 of 10
Culver City, CA 90232
ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL
SIZE
CAGE NO.
QT801 and QT802 Square-Wave
24 pin DDIP
REV.
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