74ACTQ00 Quiet Series™ Quad 2-Input NAND Gate
August 1990
Revised April 1999
74ACTQ00
Quiet Series™ Quad 2-Input NAND Gate
General Description
The ACTQ00 contains four 2-input NAND gates and uti-
lizes Fairchild FACT Quiet Series™ technology to guaran-
tee quiet output switching and improve dynamic threshold
performance FACT Quiet Series features GTO™ output
control and undershoot corrector in addition to a split
ground bus for superior ACMOS performance.
Features
s
I
CC
reduced by 50%
s
Guaranteed simultaneous switching noise level and
dynamic threshold performance
s
Improved latch-up immunity
s
Outputs source/sink 24 mA
s
Has TTL-compatible inputs
Ordering Code:
Order Number
74ACTQ00SC
74ACTQ00PC
Package Number
M14A
N14A
Package Description
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow Body
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Pin Assignment for
DIP and SOIC
Pin Descriptions
Pin Names
A
n
, B
n
O
n
Description
Inputs
Outputs
FACT™, Quiet Series™, FACT Quiet Series™, and GTO™ are trademarks of Fairchild Semiconductor Corporation.
© 1999 Fairchild Semiconductor Corporation
DS010888.prf
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74ACTQ00
Absolute Maximum Ratings
(Note 1)
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
= −0.5V
V
I
=
V
CC
+
0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
= −0.5V
V
O
=
V
CC
+
0.5V
DC Output Voltage (V
O
)
DC Output Source
or Sink Current (I
O
)
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
)
Storage Temperature (T
STG
)
±50
mA
−65°C
to
+150°C
±50
mA
−20
mA
+20
mA
−0.5V
to V
CC
+
0.5V
−20
mA
+20
mA
−0.5V
to V
CC
+
0.5V
−0.5V
to
+7.0V
DC Latch-up Source
or Sink Current
Junction Temperature (T
J
)
PDIP
140°C
±300
mA
Recommended Operating
Conditions
Supply Voltage (V
CC
)
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
Minimum Input Edge Rate (∆V/∆t)
V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V
Note 1:
Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, with-
out exception, to ensure that the system design is reliable over its power
supply, temperature, and output/input loading variables. Fairchild does not
4.5V to 5.5V
0V to V
CC
0V to V
CC
−40°C
to
+85°C
125 mV/ns
DC Electrical Characteristics
Symbol
V
IH
V
IL
V
OH
Parameter
Minimum HIGH Level
Input Voltage
Maximum LOW Level
Input Voltage
Minimum HIGH Level
Output Voltage
V
CC
(V)
4.5
5.5
4.5
5.5
4.5
5.5
4.5
5.5
V
OL
Maximum LOW Level
Output Voltage
4.5
5.5
4.5
5.5
I
IN
I
CCT
I
OLD
I
OHD
I
CC
V
OLP
V
OLV
V
IHD
V
ILD
Maximum Input Leakage Current
Maximum I
CC
/Input
Minimum Dynamic
Output Current (Note 3)
Maximum Quiescent Supply Current
Quiet Output Maximum Dynamic
V
OL
Quiet Output Minimum Dynamic
V
OL
Minimum HIGH Level Dynamic
Input Voltage
Maximum LOW Level Dynamic
Input Voltage
5.0
5.0
1.9
1.2
2.2
0.8
V
V
5.0
−0.6
−1.2
V
5.5
5.5
5.5
5.5
5.5
5.0
1.1
2.0
1.5
0.6
0.001
0.001
T
A
= +25°C
Typ
1.5
1.5
1.5
1.5
4.49
5.49
2.0
2.0
0.8
0.8
4.4
5.4
3.86
4.86
0.1
0.1
0.36
0.36
±0.1
T
A
= −40°C
to
+85°C
Guaranteed Limits
2.0
2.0
0.8
0.8
4.4
5.4
V
IN
=
V
IL
or V
IH
3.76
4.76
0.1
0.1
V
IN
=
V
IL
or V
IH
0.44
0.44
±1.0
1.5
75
−75
20.0
V
µA
mA
mA
mA
µA
V
I
OL
=
24 mA
I
OL
=
24 mA (Note 2)
V
I
=
V
CC
, GND
V
I
=
V
CC
−
2.1V
V
OLD
=
1.65V Max
V
OHD
=
3.85V Min
V
IN
=
V
CC
or GND
Figure 1, Figure 2
(Note 4)(Note 5)
Figure 1, Figure 2
(Note 4)(Note 5)
(Note 4)(Note 6)
(Note 4)(Note 6)
V
V
I
OH
= −24
mA
I
OH
= −24
mA (Note 2)
I
OUT
=
50
µA
V
V
V
V
OUT
=
0.1V
or V
CC
−
0.1V
V
OUT
=
0.1V
or V
CC
−
0.1V
I
OUT
= −50 µA
Units
Conditions
Note 2:
All outputs loaded; thresholds on input associated with output under test.
Note 3:
Maximum test duration 2.0 ms, one output loaded at a time.
Note 4:
DIP package.
Note 5:
Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND.
Note 6:
Max number of data inputs (n) switching. (n−1) inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (V
ILD
),
0V to threshold (V
IHD
), f
=
1 MHz.
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2
74ACTQ00
FACT™ Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500Ω.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the word generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope
V
OLP
/V
OLV
and V
OHP
/V
OHV
:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50Ω coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
• Measure V
OLP
and V
OLV
on the quiet output during the
worst case transition for active and enable. Measure
V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD
and V
IHD
:
• Monitor one of the switching outputs using a 50Ω coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
• Next decrease the input HIGH voltage level.V
IH
until the
output begins to oscillate or steps out a mine of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
Note 9:
V
OHV
and V
OLP
are measured with respect to ground reference.
Note 10:
Input pulses have the following characteristics: f
=
1 MHz, t
r
=
3 ns, t
f
=
3 ns, skew
<
150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
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