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GS88037BGT-200T

产品描述Cache SRAM, 256KX36, 2.7ns, CMOS, PQFP100, LEAD FREE, TQFP-100
产品类别存储    存储   
文件大小1001KB,共19页
制造商GSI Technology
官网地址http://www.gsitechnology.com/
标准
下载文档 详细参数 全文预览

GS88037BGT-200T概述

Cache SRAM, 256KX36, 2.7ns, CMOS, PQFP100, LEAD FREE, TQFP-100

GS88037BGT-200T规格参数

参数名称属性值
是否Rohs认证符合
零件包装代码QFP
包装说明LQFP,
针数100
Reach Compliance Codeunknown
ECCN代码3A991.B.2.B
最长访问时间2.7 ns
其他特性PIPELINED ARCHITECTURE; ALSO OPERATES AT 3.3V SUPPLY
JESD-30 代码R-PQFP-G100
JESD-609代码e3
长度20 mm
内存密度9437184 bit
内存集成电路类型CACHE SRAM
内存宽度36
湿度敏感等级3
功能数量1
端子数量100
字数262144 words
字数代码256000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织256KX36
封装主体材料PLASTIC/EPOXY
封装代码LQFP
封装形状RECTANGULAR
封装形式FLATPACK, LOW PROFILE
并行/串行PARALLEL
峰值回流温度(摄氏度)260
认证状态Not Qualified
座面最大高度1.6 mm
最大供电电压 (Vsup)2.7 V
最小供电电压 (Vsup)2.3 V
标称供电电压 (Vsup)2.5 V
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层PURE MATTE TIN
端子形式GULL WING
端子节距0.65 mm
端子位置QUAD
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度14 mm
Base Number Matches1

文档预览

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GS88037BT-333/300/250/200
100-Pin TQFP
Commercial Temp
Industrial Temp
Features
• Single Cycle Deselect (SCD) operation
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Default to Interleaved Pipeline mode
• Byte Write (BW) and/or Global Write (GW) operation
• Internal self-timed write cycle
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP package
• Pb-Free 100-lead TQFP package available
256K x 36
9Mb Sync Burst SRAM
333 MHz–200 MHz
2.5 V or 3.3 V V
DD
2.5 V or 3.3 V I/O
ec
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst
control inputs (ADSP, ADSC, ADV), and write control inputs
(Bx, BW, GW) are synchronous and are controlled by a
positive-edge-triggered clock input (CK). Output enable (G)
and power down control (ZZ) are asynchronous inputs. Burst
cycles can be initiated with either ADSP or ADSC inputs. In
en
de
Applications
The GS88037BT is a 9,437,184-bit (8,388,608-bit for x32
version) high performance synchronous SRAM with a
2-bit burst address counter. Although of a type originally
developed for Level 2 Cache applications supporting high
performance CPUs, the device now finds application in
synchronous SRAM applications, ranging from DSP main
store to networking chip set support.
om
m
ot
R
Parameter Synopsis
t
KQ
tCycle
Curr
(x36)
Curr
(x36)
-333
2.0
3.0
435
435
-300
2.2
3.3
395
395
-250
2.3
4.0
330
330
-200
2.7
5.0
270
270
Unit
ns
ns
mA
mA
N
Pipeline
3-1-1-1
3.3 V
2.5 V
Rev: 1.04 2/2005
d
1/19
fo
r
Sleep Mode
Low power (Sleep mode) is attained through the assertion
(High) of the ZZ signal, or by stopping the clock (CK).
Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS88037BT operates on a 2.5 V or 3.3 V power supply.
All input are 3.3 V and 2.5 V compatible. Separate output
power (V
DDQ
) pins are used to decouple output noise from the
internal circuits and are 3.3 V and 2.5 V compatible.
N
Functional Description
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable
(BW) input combined with one or more individual byte write
signals (Bx). In addition, Global Write (GW) is available for
writing all bytes at one time, regardless of the Byte Write
control inputs.
ew
SCD Pipelined Reads
The GS88037BT is a SCD (Single Cycle Deselect) pipelined
synchronous SRAM. DCD (Dual Cycle Deselect) versions are
also available. SCD SRAMs pipeline deselect commands one
stage less than read commands. SCD RAMs begin turning off
their outputs immediately after the deselect command has been
captured in the input registers.
D
es
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
ig
n
Burst mode, subsequent burst addresses are generated
internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or
interleave order with the Linear Burst Order (LBO) input. The
Burst function need not be used. New addresses can be loaded
on every cycle with no degradation of chip performance.
© 2002, GSI Technology
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