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RN2505(TE85R)

产品描述TRANSISTOR 100 mA, 50 V, 2 CHANNEL, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-3L1A, SMV, 5 PIN, BIP General Purpose Small Signal
产品类别分立半导体    晶体管   
文件大小467KB,共7页
制造商Toshiba(东芝)
官网地址http://toshiba-semicon-storage.com/
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RN2505(TE85R)概述

TRANSISTOR 100 mA, 50 V, 2 CHANNEL, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-3L1A, SMV, 5 PIN, BIP General Purpose Small Signal

RN2505(TE85R)规格参数

参数名称属性值
包装说明SMALL OUTLINE, R-PDSO-G5
针数5
Reach Compliance Codeunknown
ECCN代码EAR99
其他特性BUILT-IN BIAS RESISTOR RATIO IS 0.0468
最大集电极电流 (IC)0.1 A
集电极-发射极最大电压50 V
配置COMMON EMITTER, 2 ELEMENTS WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE)80
JESD-30 代码R-PDSO-G5
元件数量2
端子数量5
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
极性/信道类型PNP
认证状态Not Qualified
表面贴装YES
端子形式GULL WING
端子位置DUAL
晶体管应用SWITCHING
晶体管元件材料SILICON
标称过渡频率 (fT)200 MHz
Base Number Matches1

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RN2501~RN2506
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)
RN2501,RN2502,RN2503
RN2504,RN2505,RN2506
Switching, Inverter Circuit, Interface Circuit
and Driver Circuit Applications
Including two devices in SMV (super mini type with 5 leads)
With built-in bias resistors
Simplify circuit design
Reduce a quantity of parts and manufacturing process
Complementary to RN1501 to RN1506
Unit: mm
Equivalent Circuit and Bias Resistor Values
Type No.
RN2501
RN2502
RN2503
RN2504
RN2505
RN2506
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
SMV
JEDEC
JEITA
TOSHIBA
2-3L1A
Weight: 14 mg (typ.)
Absolute Maximum Ratings
(Ta = 25°C) (Q1, Q2 Common)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter base voltage
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
RN2501 to 2506
RN2501 to 2506
RN2501 to 2504
RN2505, 2506
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
*
Tj
Tstg
Rating
−50
−50
−10
−5
−100
300
150
−55
to150
Unit
V
V
V
mA
mW
°C
°C
Equivalent Circuit
(Top View)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
* Total rating
1
2010-05-20

 
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