IDT74FCT16240AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 16-BIT
BUFFER/LINE DRIVER
IDT74FCT16240AT/CT/ET
FEATURES:
•
•
•
•
•
•
•
•
DESCRIPTION:
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK
(o) (Output Skew) < 250ps
Low input and output leakage
≤
1µA (max.)
V
CC
= 5V ±10%
High drive outputs (–32mA I
OH
, 64mA I
OL
)
Power off disable outputs permit “live insertion”
Typical V
OLP
(Output Ground Bounce) < 1.0V at V
CC
= 5V,
T
A
= 25°C
• Available in SSOP and TSSOP packages
The FCT16240T 16-bit buffer/line driver is built using advanced dual metal
CMOS technology. These high-speed, low-power devices offer bus/backplane
interface capability with improved packing density. The flow-through organiza-
tion of signal pins simplifies layout. The three-state controls are designed to
operate these devices in a Quad-Nibble, Dual-Byte or single 16-bit word mode.
All inputs are designed with hysteresis for improved noise margin.
The FCT16240T is ideally suited for driving high capacitance loads and low-
impedance backplanes. The output buffers are designed with power off disable
capability to allow "live insertion" of boards when used as backplane drivers.
FUNCTIONAL BLOCK DIAGRAM
1
OE
1
A
1
1
A
2
1
A
3
1
A
4
1
Y
1
1
Y
2
1
Y
3
1
Y
4
3
OE
3
A
1
3
A
2
3
Y
1
3
Y
2
3
A
3
3
A
4
3
Y
3
3
Y
4
2
OE
2
A
1
2
A
2
2
A
3
2
A
4
2
Y
1
2
Y
2
2
Y
3
2
Y
4
4
OE
4
A
1
4
A
2
4
A
3
4
A
4
4
Y
1
4
Y
2
4
Y
3
4
Y
4
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
© 2002 Integrated Device Technology, Inc.
JUNE 2002
DSC-5465/1
IDT74FCT16240AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1
OE
1
Y
1
1
Y
2
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Max
–0.5 to 7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
SSOP/ TSSOP
TOP VIEW
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
2
OE
1
A
1
1
A
2
V
TERM
(2)
Terminal Voltage with Respect to GND
V
TERM
(3)
Terminal Voltage with Respect to GND
T
STG
I
OUT
Storage Temperature
DC Output Current
GND
1
Y
3
1
Y
4
GND
1
A
3
1
A
4
V
CC
2
Y
1
2
Y
2
V
CC
2
A
1
2
A
2
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals
3. Output and I/O terminals for FCT162XXX.
GND
2
Y
3
2
Y
4
3
Y
1
3
Y
2
GND
2
A
3
2
A
4
3
A
1
3
A
2
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
GND
3
Y
3
3
Y
4
GND
3
A
3
3
A
4
NOTE:
1. This parameter is measured at characterization but not tested.
V
CC
4
Y
1
4
Y
2
V
CC
4
A
1
4
A
2
PIN DESCRIPTION
Pin Names
xOE
xAx
x
Y
x
Data Inputs
3-State Outputs
Description
3-State Output Enable Inputs (Active LOW)
GND
4
Y
3
4
Y
4
4
OE
GND
4
A
3
4
A
4
3
OE
FUNCTION TABLE
(1)
Inputs
xOE
L
L
H
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
Outputs
xAx
L
H
X
xYx
L
H
Z
2
IDT74FCT16240AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
I
IL
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
Unit
V
V
µA
µA
V
mA
mV
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
O
V
OH
Parameter
Output DriveCurrent
Output HIGH Voltage
Test Conditions
(1)
V
CC
= Max., V
O
= 2.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –3mA
I
OH
= –15mA
I
OH
= –32mA
(4)
V
OL
I
OFF
Output LOW Voltage
Input/Output Power Off Leakage
(5)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
≤
4.5V
—
—
±1
µA
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second
5. The test limit for this parameter is ±5µA at T
A
= –55°C.
Min.
–50
2.5
2.4
2
—
Typ.
(2)
—
3.5
3.5
3
0.2
Max.
–180
—
—
—
0.55
Unit
mA
V
I
OL
= 64mA
V
3
IDT74FCT16240AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply
Current
(4)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
xOE = GND
One Input Toggling
50% Duty Cycle
V
CC
= Max.
Outputs Open
fi = 10MHz
50% Duty Cycle
xOE = GND
One Bit Toggling
V
CC
= Max.
Outputs Open
fi = 2.5MHz
50% Duty Cycle
xOE = GND
Sixteen Bits Toggling
V
IN
= V
CC
V
IN
= GND
Test Conditions
(1)
Min.
—
—
Typ.
(2)
0.5
60
Max.
1.5
100
Unit
mA
µA/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
V
IN
= 3.4V
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= 3.4V
V
IN
= GND
—
0.6
1.5
mA
—
0.9
2.3
—
2.4
4.5
(5)
—
6.4
16.5
(5)
NOTES:
1. For conditions shown as min. or max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
fi = Input Frequency
Ni = Number of Inputs at fi
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT16240AT
Symbol
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SK
(o)
Parameter
Propagation Delay
xAx to xYx
Output Enable Time
Output Disable Time
Output Skew
(3)
Condition
(1)
FCT16240CT
Min
.
1.5
1.5
1.5
—
(2)
FCT16240ET
Min
.
1.5
1.5
1.5
—
(2)
Min
.
1.5
1.5
1.5
—
(2)
Max
.
4.8
6.2
5.6
0.5
Max
.
4.3
5.8
5.2
0.5
Max
.
3.2
4.4
3.6
0.5
Unit
ns
ns
ns
ns
C
L
= 50pF
R
L
= 500Ω
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4
IDT74FCT16240AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
Test
Open Drain
Disable Low
Enable Low
All Other Tests
Switch
Closed
Open
V
CC
500Ω
V
IN
Pulse
Generator
R
T
D.U.T.
50pF
C
L
500Ω
V
OUT
7.0V
DEFINITIONS:
C
L
= Load capacitance: includes jig and probe capacitance.
R
T
= Termination resistance: should be equal to Z
OUT
of the Pulse Generator.
Test Circuits for All Outputs
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
t
SU
t
H
t
REM
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
t
W
HIGH-LOW-HIGH
PULSE
1.5V
1.5V
t
SU
t
H
Pulse Width
Set-up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
t
PLH
OUTPUT
t
PLH
OPPOSITE PHASE
INPUT TRANSITION
t
PHL
t
PHL
3V
1.5V
0V
V
OH
1.5V
V
OL
3V
1.5V
0V
CONTROL
INPUT
t
PZL
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
SWITCH
CLOSED
t
PZH
SWITCH
OPEN
3.5V
1.5V
t
PHZ
DISABLE
3V
1.5V
0V
3.5V
0.3V
0.3V
1.5V
0V
V
OL
V
OH
0V
t
PLZ
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate
≤
1.0MHz; t
F
≤
2.5ns; t
R
≤
2.5ns.
5
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