CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTE:
1.
JA
is measured with the component mounted on an evaluation PC board in free air.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: Supply Voltage = ±15V, V
L
+ = 5V, V
L
- = 0V, unless otherwise specified.
D.C. PARAMETERS
Input Offset Voltage
SYMBOL
V
IO
CONDITIONS
V
CM
= 0V, V
OUT
= 1.4V (See Note 4)
GROUP A
SUBGROUPS
1
2, 3
Input Bias Current
+I
B
V
CM
= 0V
1
2, 3
-I
B
V
CM
= 0V
1
2, 3
Input Offset Current
I
IO
V
CM
= 0V
1
2, 3
Input Sensitivity
IN
SEN
(See Note 4)
1
2, 3
Output Voltage Levels
V
OL
I
SINK
= 3mA
1
2, 3
V
OH
I
SOURCE
= 3mA
1
2, 3
Output Current
I
SINK
V
OUT
≤0.4V
1
2, 3
I
SOURCE
V
OUT
≥3.5V
1
2, 3
Supply Current
+I
CC
V
OUT
= V
OL,
V
OH
1
2, 3
-I
CC
V
OUT
= V
OL,
V
OH
1
2, 3
Logic Current
I
L
V
OUT
= V
OL,
V
OH
1
2, 3
TEMP (°C)
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
+25
+125, -55
MIN
-5
-8
-150
-200
-150
-200
-35
-45
-0.5
-0.6
-
-
3.5
3.5
3
3
-
-
-
-
-
-
-
-
MAX
5
8
150
200
150
200
35
45
0.5
0.6
0.4
0.4
-
-
-
-
-3
-3
20
20
8
10
6
8
UNITS
mV
mV
nA
nA
nA
nA
nA
nA
mV
mV
V
V
V
V
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
FN3929 Rev.1.00
May 3, 2012
Page 2 of 12
HA-4902/883
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Table 2 Intentionally left blank. See A. C. Specifications on Table 3.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: Supply Voltage = ±15V, V
L
+ = 5V, V
L
- = 0V, unless otherwise specified.
PARAMETER
Response Time
SYMBOL
t
pd0
t
pd1
Common Mode Range
+CMR
-CMR
NOTES:
2. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab
characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from
multiple production runs which reflect lot to lot and within lot variation.
3. F
≈
100Hz, duty cycle
≈
50%, inverting input driven, all unused inverting inputs tie to +5V.
4. Refer to enlarged area of test waveform A. Offset voltage is measured when V
OUT
= 1.4V. Sensitivity is measured on the transition edge at 0.4V and
3.5V. Sensitivity is the change in differential input voltage required to change the output state. Sensitivity includes the effects of offset voltage, offset
current, common mode rejection and voltage gain.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Interim Electrical Parameters (Pre Burn-In)
Final Electrical Test Parameters
Group A Test Requirements
Groups C and D Endpoints
NOTE:
5. PDA applies to Subgroup 1 only.
SUBGROUPS (SEE TABLE 1 )
1
1 (Note 5), 2, 3
1, 2, 3
1
CONDITIONS
+100mV Input Step, +10mV Overdrive
-100mV Input Step, -10mV Overdrive
NOTES
2, 3
2, 3
2
2
TEMP (°C)
+25
+25
+25
+25
MIN
-
-
-
-15
MAX
200
200
12.4
-
UNITS
ns
ns
V
V
FN3929 Rev.1.00
May 3, 2012
Page 3 of 12
HA-4902/883
Test Circuit
(Applies to Tables 1 and 2)
I
SWITCH POSITION 1 FOR D.C. PARAMETERS
SWITCH POSITION 2 FOR A.C. PARAMETERS
1 OF 4 TEST LOOPS FOR THE HA-4902/883 DUT
ENLARGED VIEW
Test Waveform A
(Applies to Table 1)
ENLARGED VIEW
DUT OUTPUT: CHANNEL B
Test Waveform B
(Applies to Table 3)
RESPONSE TIME
NOTE: Response time testing is done after V
IO
testing to acquire the actual device offset voltage. 10mV overdrive is then added (or subtracted depending
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