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RN2301(TE85L,F)

产品描述TRANSISTOR PNP 50V 0.1A SC-70
产品类别分立半导体    晶体管   
文件大小450KB,共7页
制造商Toshiba(东芝)
官网地址http://toshiba-semicon-storage.com/
标准
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RN2301(TE85L,F)概述

TRANSISTOR PNP 50V 0.1A SC-70

RN2301(TE85L,F)规格参数

参数名称属性值
是否Rohs认证符合
厂商名称Toshiba(东芝)
包装说明SMALL OUTLINE, R-PDSO-G3
Reach Compliance Codeunknown
Factory Lead Time16 weeks
Is SamacsysN
其他特性BUILT IN BAIS RESISTOR RATIO IS 1
最大集电极电流 (IC)0.1 A
集电极-发射极最大电压50 V
配置SINGLE WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE)30
JESD-30 代码R-PDSO-G3
元件数量1
端子数量3
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
峰值回流温度(摄氏度)NOT SPECIFIED
极性/信道类型PNP
最大功率耗散 (Abs)0.1 W
表面贴装YES
端子形式GULL WING
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
晶体管应用SWITCHING
晶体管元件材料SILICON
标称过渡频率 (fT)200 MHz
Base Number Matches1

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RN2301~RN2306
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)
RN2301, RN2302, RN2303
RN2304, RN2305, RN2306
Unit: mm
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
With built-in bias resistors
Simplify circuit design
Reduce a quantity of parts and manufacturing process
Complementary to RN1301 to RN1306
Equivalent Circuit
Bias Resistor Values
Type No.
RN2301
RN2302
RN2303
RN2304
RN2305
RN2306
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
USM
JEDEC
JEITA
TOSHIBA
Weight: 0.006g
SC-70
2-2E1A
Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
RN2301 to RN2306
RN2301 to RN2306
RN2301 to RN2304
RN2305, RN2306
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
T
j
T
stg
Rating
−50
−50
−10
−5
−100
100
150
−55
to 150
Unit
V
V
V
mA
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Start of commercial production
1987-09
1
2014-03-01

 
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