电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

GT28F640W18T70

产品描述Flash, 4MX16, 70ns, PBGA56, 0.75 MM PITCH, CSP, MICRO, BGA-56
产品类别存储    存储   
文件大小964KB,共84页
制造商Intel(英特尔)
官网地址http://www.intel.com/
下载文档 详细参数 全文预览

GT28F640W18T70概述

Flash, 4MX16, 70ns, PBGA56, 0.75 MM PITCH, CSP, MICRO, BGA-56

GT28F640W18T70规格参数

参数名称属性值
是否Rohs认证不符合
零件包装代码BGA
包装说明0.75 MM PITCH, CSP, MICRO, BGA-56
针数56
Reach Compliance Codeunknown
ECCN代码3A991.B.1.A
Is SamacsysN
最长访问时间70 ns
其他特性ALSO SUPPORTS SYNCHRONOUS OPERATION
启动块TOP
命令用户界面YES
通用闪存接口YES
数据轮询NO
JESD-30 代码R-PBGA-B56
JESD-609代码e0
长度9 mm
内存密度67108864 bit
内存集成电路类型FLASH
内存宽度16
功能数量1
部门数/规模8,127
端子数量56
字数4194304 words
字数代码4000000
工作模式ASYNCHRONOUS
最高工作温度85 °C
最低工作温度-40 °C
组织4MX16
封装主体材料PLASTIC/EPOXY
封装代码VFBGA
封装等效代码BGA56,7X8,30
封装形状RECTANGULAR
封装形式GRID ARRAY, VERY THIN PROFILE, FINE PITCH
页面大小4 words
并行/串行PARALLEL
电源1.8 V
编程电压1.8 V
认证状态Not Qualified
座面最大高度1 mm
部门规模4K,32K
最大待机电流0.000005 A
最大压摆率0.04 mA
最大供电电压 (Vsup)1.95 V
最小供电电压 (Vsup)1.7 V
标称供电电压 (Vsup)1.8 V
表面贴装YES
技术CMOS
温度等级INDUSTRIAL
端子面层Tin/Lead (Sn/Pb)
端子形式BALL
端子节距0.75 mm
端子位置BOTTOM
切换位NO
类型NOR TYPE
宽度7.7 mm
Base Number Matches1

文档预览

下载PDF文档
1.8 Volt Intel
®
Wireless Flash Memory
(W18)
28F320W18, 28F640W18, 28F128W18
Preliminary Datasheet
Product Features
Performance
— 70 ns Asynchronous reads for 32 and 64 Mbit,
90 ns for 128 Mbit
— 14 ns Clock to Data Output (t
CHQV
)
— 20 ns Page Mode Read Speed
— 4-Word, 8-Word, and Continuous-Word Burst
Modes
— Burst and Page Modes in Parameter and Main
Partitions
— Programmable WAIT Configuration
— Enhanced Factory Programming Mode@
3.50 µs/Word (Typ)
— Glueless 12 V interface for Fast Factory
Programming @ 8 µs/Word (Typ)
— 1.8 V Low-Power Programming @ 12 µs/Word
(Typ)
— Program or Erase during Reads
s
Architecture
— Multiple 4-Mbit Partitions
— Dual-Operation: Read-While-Write or Read-
While-Erase
— Eight, 4-Kword Parameter Code and Data
Blocks
— 32-Kword Main Code and Data Blocks
— Top and Bottom Parameter Configurations
s
Power Operation
— 1.7 V to 1.95 V Read and Write Operations
— 1.7 V to 2.24 V V
CCQ
for I/O Isolation
— Standby Current: 5 µA (Typ)
— Read Current: 7 mA (Typ)
s
Software
— 5 µs (Typ) Program Suspend
— 5 µs (Typ) Erase Suspend
— Intel
®
Flash Data Integrator (FDI) Software
Optimized
— Intel Basic Command Set Compatible
— Common Flash Interface (CFI)
s
Quality and Reliability
— Extended Temperature: –40 °C to +85 °C
— Minimum 100,000 Erase Cycles per Block
— ETOX™ VII Flash Technology (0.18 µm)
s
Security
— 128-bit Protection Register: 64 Unique Device
Identifier Bits; 64 User-Programmable OTP
Bits
— Absolute Write Protection
⇒V
PP
= GND
— Erase/Program Lockout during Power
Transitions
— Individual Dynamic Zero-Latency Block
Locking
— Individual Block Lock-Down
s
Density and Packaging
— 32 Mbit and 128 Mbit in a VF BGA Package
— 64 Mbit in a
µBGA*Package
— 56 Active Ball Matrix, 0.75 mm Ball-Pitch
µBGA*
and VF BGA Packages
— 16-bit wide Data Bus
s
The 1.8 Volt Intel
®
Wireless Flash memory with flexible multi-partition dual-operation provides high-
performance asynchronous and synchronous burst reads. It is an ideal memory for low-voltage burst CPUs.
Combining high read performance with flash memory’s intrinsic non-volatility, 1.8 Volt Intel Wireless Flash
memory eliminates the traditional system-performance paradigm of shadowing redundant code memory from
slow nonvolatile storage to faster execution memory. It reduces the total memory requirement that increases
reliability and reduces overall system power consumption and cost.
The 1.8 Volt Intel Wireless Flash memory’s flexible multi-partition architecture allows programming or erasing to
occur in one partition while reading from another partition. This allows for higher data write throughput
compared to single partition architectures. The dual-operation architecture also allows two processors to
interleave code operations while program and erase operations take place in the background. The designer can
also choose the size of the code and data partitions via the flexible multi-partition architecture.
The 1.8 Volt Intel Wireless Flash memory is manufactured on Intel’s 0.18 µm ETOX™ VII process technology. It
is available in µBGA and VF BGA packages which are ideal for board-constrained applications.
Notice:
This document contains preliminary information on new products in production. The
specifications are subject to change without notice. Verify with your local Intel sales office that
you have the latest datasheet before finalizing a design.
290701-003
June 2001

技术资料推荐更多

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1826  1592  2639  1997  1654  35  58  7  36  49 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved