Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These conditions represent a stress rating only, and functional operation of the device at
these or any other conditions above the operational limits noted in this specification is not implied. Exposure to maximum rating conditions for extended conditions may affect device performance,
functionality, and reliability.
PARAMETER
Supply Voltage (V
SS
= ground)
Input Voltage, dc
Output Voltage, dc
Input Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Output Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Storage Temperature Range (non-condensing)
Ambient Temperature Range, Under Bias
Junction Temperature
Lead Temperature (soldering, 10s)
Input Static Discharge Voltage Protection (MIL-STD 883E, Method 3015.7)
SYMBOL
V
DD
V
I
V
O
I
IK
I
OK
T
S
T
A
T
J
MIN.
V
SS
-0.5
V
SS
-0.5
V
SS
-0.5
-50
-50
-65
-55
MAX.
7
V
DD
+0.5
V
DD
+0.5
50
50
150
125
125
260
2
UNITS
V
V
V
mA
mA
°C
°C
°C
°C
kV
CAUTION: ELECTROSTATIC SENSITIVE DEVICE
Permanent damage resulting in a loss of functionality or performance may occur if this device is subjected to a high-energy elec-
trostatic discharge.
Table 4: Operating Conditions
PARAMETER
Supply Voltage
Ambient Operating Temperature Range
SYMBOL
V
DD
T
A
CONDITIONS/DESCRIPTION
3.3V ± 10%
MIN.
3.0
0
TYP.
3.3
MAX.
3.6
70
UNITS
V
°C
2
ISO9001
2.26.02
FS6385
Triple PLL Clock Generator IC
Table 5: DC Electrical Specifications
Unless otherwise stated, V
DD
= 3.3V ± 10%, no load on any output, and ambient temperature range T
A
= 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not production tested to any specific limits. Where given, MIN and MAX characterization data are
±
3σ from typical. Negative currents indicate current flows out of the device.
PARAMETER
Overall
Supply Current, Dynamic, with Loaded
Outputs
Crystal Oscillator
Crystal Loading Capacitance
Clock Outputs (CLKA, CLKB, CLKC)
Output Impedance *
Short Circuit Source Current *
Short Circuit Sink Current *
SYMBOL
CONDITIONS/DESCRIPTION
MIN.
TYP.
MAX.
UNITS
I
DD
30
mA
C
L(xtal)
As seen by a crystal connected to XIN and
XOUT
16
pF
z
OH
z
OL
I
OSH
I
OSL
V
O
= 0.5V
DD
; output driving high
V
O
= 0.5V
DD
; output driving low
V
O
= 0V; shorted for 30s, max.
V
O
= 3.3V; shorted for 30s, max.
45
45
-35
35
Ω
mA
mA
Table 6: AC Timing Specifications
Unless otherwise stated, V
DD
= 3.3V ± 10%, no load on any output, and ambient temperature range T
A
= 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not production tested to any specific limits. Where given, MIN and MAX characterization data are
±
3σ from typical.
PARAMETER
Overall
Synthesis Error
Clock Outputs (CLKA, CLKB, CLKC)
Duty Cycle *
Jitter, Period (peak-peak) *
Rise Time *
Fall Time *
SYMBOL
CONDITIONS/DESCRIPTION
MIN.
TYP.
MAX.
UNITS
(unless otherwise noted in Frequency Table)
0
ppm
Ratio of high pulse width (as measured from rising edge to next falling
Microchip MCU
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