Design
Objectives
Standard LGH Connectors,
Series 1/2I, 1/2LI, 1I, 1LI, 2I, 3I and 4I
108-36033
Rev O2
DESIGN OBJECTIVES
The product described in this document has not been fully tested to ensure conformance to the requirements outlined below. Therefore
Tyco Electronics makes no representation or warranty, express or implied, that the product will comply with these requirements. Further,
Tyco Electronics may change these requirements based on the results of additional testing and evaluation. Contact Tyco Electronics
Engineering for further details.
1.
1.1.
SCOPE
Content
This specification covers perform ance, tests and quality requirem ents for the Tyco Electronics LGH
standard high voltage 1/2I, 1/2LI, 1I, 1LI, 2I, 3I and 4I series m olded end leads and receptacles. These
leads and receptacles are designed for com m ercial, industrial and m ilitary type applications requiring
operation over wide environm ents.
1.2.
Qualification
W hen tests are perform ed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be perform ed using the applicable inspection plan and product drawing.
2.
APPLICABLE DOCUM ENTS
The following docum ents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the
requirem ents of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirem ents of this specification and the referenced docum ents,
this specification shall take precedence.
2.1.
Tyco Electronics Docum ents
!
!
!
!
109 Series: Test Specifications as indicated in Figure 1
109-197: Test Specification (AMP Test Specifications vs EIA and IEC Test Methods)
114- : Application Specification
501- : Qualification Test Report
2.2.
Com m ercial Standard
EIA-364:
Electrical Connector/Socket Test Procedures Including Environm ental Classifications
2.3.
Military Standard
MIL-STD-202: Test Methods For Electronic And Electrical Com ponent Parts
3.
3.1.
REQUIREM ENTS
Product shall be of the design, construction and physical dim ensions specified on the applicable product
drawing.
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
1 of 6
LOC B
DESIGN OBJECTIVES
Design and Construction
DESIGN OBJECTIVES 07 Mar 11
108-36033
3.2.
Materials
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
3.3.
Ratings
!
Voltage:
•
1/2I:
•
1/2LI:
•
1I:
•
1LI:
•
2I:
•
3I:
•
4I:
Tem perature:
!
3.4.
10 kilovolts
15 kilovolts
20 kilovolts
25 kilovolts
30 kilovolts
40 kilovolts
50 kilovolts
-55 to 125EC
Perform ance and Test Description
Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents
specified in Figure 1. Unless otherwise specified, all tests shall be perform ed at am bient environm ental
conditions per EIA-364.
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Requirem ent
Procedure
EIA-364-18.
Visual and dim ensional (C of C)
inspection per product drawing.
EIA-364-18.
Visual inspection.
Initial exam ination of product.
Final exam ination of product.
DESIGN OBJECTIVES 07 Mar 11
Meets requirem ents of product
drawing.
Meets visual requirem ents.
ELECTRICAL
100 m illiohm s m axim um .
Contact resistance.
EIA-364-6.
Measure potential drop of m ated
specim ens at 1 am pere m axim um .
Calculate resistance.
See Figure 3.
EIA-364-21.
Test between contacts of m ated
lead connector assem blies and
ground.
EIA-364-20, Condition I.
Test between contacts of m ated
lead connector assem blies and
ground.
Insulation resistance.
5000 m egohm s m inim um .
W ithstanding voltage.
Figure 1 (cont)
Rev O2
2 of 6
DESIGN OBJECTIVES
Test Voltage
(kvDC)
1/2I
15
1/2LI
23
1I
30
1LI
38
2I
45
3I
55
4I
60
5 m icroam peres m axim um leakage
current. 3 m inute hold.
Series
108-36033
Test Description
Requirem ent
MECHANICAL
Vibration, sinusoidal.
No discontinuities of 10
m icroseconds or longer duration.
See Note.
EIA-364-28, Test Condition I.
Subject m ated specim ens to 10-55-
10 Hz traversed in 1 m inute with 1.5
m m [.06 in] m axim um total
excursion. 2 hours in each of 3
m utually perpendicular planes.
Procedure
Mechanical shock.
No discontinuities of 1 m icrosecond EIA-364-27, Method H.
or longer duration.
Subject m ated specim ens to 30 G's
See Note.
half-sine shock pulses of 11
m illiseconds duration. 3 shocks in
each direction applied along 3
m utually perpendicular planes, 18
total shocks.
See Note.
EIA-364-9.
Mate and unm ate gold plated
specim ens for 500 cycles and tin
plated specim ens for 50 cycles at a
m axim um rate of 500 cycles per
hour.
AMP Spec 109-35.
Measure force necessary to
engage using gage 2 to a depth of
.19 inch for 1/2I and 1/2LI and .25
inch for 1I, 1LI, 2I, 3I and 4I.
See Figure 4.
AMP Spec 109-35.
Size 3 tim es using gage 2. Then
insert gage 1 to depth of .19 inch
for 1/2I and 1/2LI and .25 inch for
1I, 1LI, 2I, 3I and 4I and m easure
force necessary to separate.
See Figure 4.
Durability.
Contact engaging force.
20 ounces m axim um .
Contact separating force.
DESIGN OBJECTIVES 07 Mar 11
3 ounces m inim um .
ENVIRONMENTAL
See Note.
EIA-364-32.
Subject specim ens to 5 cycles
between -55 and 125EC.
EIA-364-31, Method II, Condition A.
Subject specim ens to 40EC and 90
to 95% RH for 96 hours.
EIA-364-17, Method A, Test
Condition 5, Test Tim e Condition A.
Subject m ated specim ens to 125EC
for 96 hours.
Figure 1 (cont)
Therm al shock.
Hum idity, steady state.
See Note.
Tem perature life.
See Note.
Rev O2
3 of 6
DESIGN OBJECTIVES
108-36033
Test Description
Barom etric pressure, tem perature
cycling.
Herm etic seal.
See Note.
Leakage rate less than 1 X 10
-8
cc
He/sec.
See Note.
Requirem ent
Procedure
MIL-STD 202, Method 105C,
Condition C.
MIL-STD 202, Method 112C,
Condition C.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure
2.
Figure 1 (end)
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Exam ination
1
2(c)
Test Sequence (b)
Initial exam ination of product
Contact resistance
Insulation resistance
W ithstanding voltage
1,19
4,8
2
3,11,15
9
10
7
5,17
6,18
14
12
16
13(d)
2,12,16
19
18
1,18
5,9
3
4,13,17
10
11
8
6
7
15
14
Mechanical shock
Durability
Contact engaging force
Contact separating force
Therm al shock
Hum idity, steady state
Tem perature life
Barom etric pressure, tem perature cycling
Herm etic seal
Final exam ination of product
NOTE
(a)
(b)
(c)
(d)
Figure 2
Rev O2
4 of 6
DESIGN OBJECTIVES
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
This test group is applicable to hermetic seal type receptacles only.
HiPot is performed at each temperature extreme and reduced barometric pressure,
70000 feet.
DESIGN OBJECTIVES 07 Mar 11
Vibration
108-36033
4.
4.1.
QUALITY ASSURANCE PROVISIONS
Qualification Testing
A.
Specim en Selection
Specim ens shall be prepared in accordance with applicable Instruction Sheets and shall be
selected at random from current production. Test group 1 shall consist of 28 lead assem blies and
receptacles; 4 each from 1/2I, 1/2LI, LI, 1LI, 2I, 3I and 4I series. Test group 2 shall consist of 14
herm etic seal type receptacles; 2 each from 1/2I, 1/2LI, LI, 1LI, 2I, 3I and 4I series.
B.
Test Sequence
Qualification inspection shall be verified by testing specim ens as specified in Figure 2.
4.2.
Requalification Testing
If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determ ined by developm ent/product, quality and reliability engineering.
4.3.
Acceptance
Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures
attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. If product
failure occurs, corrective action shall be taken and specim ens resubm itted for qualification. Testing to
confirm corrective action is required before resubm ittal.
4.4.
Quality Conform ance Inspection
The applicable quality inspection plan shall specify the sam pling acceptable quality level to be used.
Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing
and this specification.
DESIGN OBJECTIVES 07 Mar 11
Rev O2
5 of 6
DESIGN OBJECTIVES
stm32/stm8
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