Chip Multilayer Ceramic Capacitors for General Purpose
GRM033R61A225ME47_(0201,X5R(EIA),2.2uF,DC 10 V)
_:Packaging Code
■
Scope
This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment.
Reference Sheet
■
MURATA Part No. System
(Ex.)
GRM
03
(1)L/W
Dimensions
3
R6
1A
(4)Rated
Voltage
225
M
E47
D
(2)T
(3)Temperature
Dimensions Characteristics
(5)Nominal (6)Capacitance (7)Murata’s
(8)Packaging
Capacitance
Tolerance
Control Code Code
■
Type
■
Rated Value
(1)Size Code :
0201
(3)Temperature Characteristics :R6(Public STD Code :X5R(EIA))
Dimensions(mm)
MURATA PART NO.
(1)-1 L
0.6
+/-0.09
(3)Temperature Characteristics
e
g
Temp. coeff
or Cap. Change
+/-15 %
(1)-2 W
0.3
+/-0.09
(2) T
0.3
+/-0.09
Temp. Range
-55 to 85
℃
Ref.Temp.
25
℃
(4)Rated
Voltage
(5)Nominal
Capacitance
(6)Capacitance
Operating
Tolerance
Temp. Range
Mounting
Limited
Method
Application
For only
mobile
devices
GRM033R61A225ME47_
0.1
to 0.25
0.2 min.
DC 10 V
2.2uF
+/-20 %
-55 to 85
℃
Reflow
■
Package
(8)Code
D
W
J
Packaging
φ180mm Reel
PAPER Tape W8P2
φ180mm Reel
PAPER Tape W8P1
φ330mm Reel
PAPER Tape W8P2
Packaging Unit
15000 pcs./Reel
30000 pcs./Reel
50000 pcs./Reel
Product specifications in this catalog are as of Nov.22,2017,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GRM033R61A225ME47-04A
■
Specifications and Test Methods
Item
No.
1 Rated Voltage
Specification
Shown in Rated value.
Test Method (Ref. Standard:JIS C 5101, IEC60384)
The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
P-P
or V
O-P
, whichever is larger, should be maintained
within the rated voltage range.
Visual inspection.
Using Measuring instrument of dimension.
Measurement Point :
Between the terminations
Test Voltage :
250% of the rated voltage
Applied Time :
1s to 5s
Charge/Discharge Current : 50mA max.
Measurement Temperature: Room Temperature
Measurement Point :
Between the terminations
Measurement Voltage :
Rated Voltage
Charging Time :
1min
Charge/Discharge Current : 50mA max.
Measurement Temperature: Room Temperature
Measurement Frequency : 1.0+/-0.1kHz
Measurement Voltage :
1.0+/-0.2Vrms
2 Appearance
3 Dimension
4 Voltage Proof
No defects or abnormalities.
Shown in Rated value.
No defects or abnormalities.
5 Insulation Resistance(I.R.)
More than 50Ω½F
6 Capacitance
Shown in Rated value.
7 Q or Dissipation Factor (D.F.)
DF:0.1 max.
Measurement Temperature : Room Temperature
Measurement Frequency : 1.0+/-0.1kHz
Measurement Voltage :
1.0+/-0.2Vrms
The capacitance change should be measured after 5 minutes at each specified temperature stage.
Capacitance value as a reference is the value in "*" marked step.
8 Capacitance
Temperature
Characteristics
No bias
Within +/-15%
(-55℃ to +85℃)
Measurement Voltage :
Less than 1.0Vrms (Refer to the individual data sheet)
Step
1
2
3
*
4
5
Temperature(°C)
Reference Temp. +/-2
Min. Operating Temp. +/-3
Reference Temp. +/-2
Max. Operating Temp. ±3
Reference Temp. +/-2
Applying Voltage
No bias
Pre-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
GRM033R61A225ME47-04A
Item
No.
9 Adhesive Strength of
Termination
Specification
No removal of the terminations or other defect should occur.
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
Applied Force :
2N
Holding Time :
10+/-1½
Applied Direction :
In parallel with the test substrate and vertical with the capacitor side
Solder the capacitor on the test substrate shown in Fig.3.
Kind of Vibration :
A simple harmonic motion 10Hz to 55Hz to 10Hz
Vibration Time :
1min
Total Amplitude :
1.5mm
This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours).
10 Vibration
Appearance
No defects or abnormalities.
Capacitance Within the specified initial value.
Q or D.F.
Within the specified initial value.
11 Substrate
Bending Test
Appearance
No defects or abnormalities.
Capacitance Within +/-10%
Change
Solder the capacitor on the test substrate shown in Fig.1.
Pressurization Method :
Shown in Fig.2.
Flexure :
1mm
Holding Time :
5+/-1s
Soldering Method :
Reflow soldering
Test Method :
Flux :
Preheat :
Solder :
Test Temp. :
Test Time :
Test Method :
Solder :
Solder Temp. :
Test Time :
Preheat Temp. :
Preheat Time :
Pre-treatment :
Post-treatment :
Solder bath method
Solution of rosin ethanol 25(mass)%
80℃ to 120℃、10s to 30s
Sn-3.0Ag-0.5Cu(Lead Free Solder)
245+/-5℃
2+/-0.5s
Solder bath method
Sn-3.0Ag-0.5Cu(Lead Free Solder)
270+/-5℃
10+/-0.5s
120℃ to 150℃
1min
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
12 Solderability
95% of the terminations is to be soldered evenly and continuously.
13 Resistance
to Soldering
Heat
Appearance
No defects or abnormalities.
Capacitance Within +/-15%
Change
Q or D.F.
Within the specified initial value.
I.R.
Voltage
Proof
Within the specified initial value.
No defects.
Let sit for 24+/-2hours at room temperature, then measure.
14 Temperature
Sudden
Change
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
5 cycles
Cycles :
Step
1
2
3
4
Temperature(℃)
Min.Operating Temp. +0/-3
Reference Temp.
Max.Operating Temp. +3/-0
Reference Temp.
Time (min)
30+/-3
2 to 3
30+/-3
2 to 3
Capacitance Within +/-7.5%
Change
Q or D.F.
Within the specified initial value.
I.R.
Voltage
Proof
Within the specified initial value.
No defects.
Pre-treatment :
Post-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Let sit for 24+/-2hours at room temperature, then measure.
GRM033R61A225ME47-04A
Item
Specification
No.
15 High
Appearance No defects or abnormalities.
Temperature
High Humidity
Capacitance Within +/-12.5%
(Steady)
Change
Q or D.F.
DF:0.2 max.
I.R.
More than 0.5Ω½F
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
40+/-2℃
Test Temperature :
Test Humidity :
90%RH to 95%RH
Test Time :
500+/-12h
Test Voltage :
Rated Voltage
Charge/Discharge Current : 50mA max.
Pre-treatment :
Post-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
16 Durability
Appearance
No defects or abnormalities.
Capacitance Within +/-12.5%
Change
Q or D.F.
DF:0.2 max.
I.R.
More than 0.5Ω½F
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Maximum Operating Temperature+/-3℃
Test Time :
1000+/-12h
Test Voltage :
100% of the rated voltage
Charge/Discharge Current : 50mA max.
Pre-treatment :
Post-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Derating conditions on Voltage and Temperature (for Rated Voltage 100Vdc max.)
Useful Lifetime for Mobile Application Specific MLCC
Derated products*1 are suitable for use in circuits w here continuous applied voltage and temperature to the
capacitor is derated (below rated voltage and temperature).
A reliability assurance level equivalent to standard products*2 can be secured by restricting the voltage and
temperature according to the derating conditions in the chart.
*1 Derated Products: The test voltage of these products is less than 150% of the rated voltage
in the Durability / Operational Life Test.
These MLCC products are designed for use in devices w ith a typical lifetime of less than 5 years.
(Examples: Cellular phone, Smartphone, Tablet PC, Digital camera, Watch, Electronics dictionary,
Small-scale server, IPC-9592B class1 equipment, etc.)
These MLCC products are designed so that the useful lifetime can be extended longer than 5 years
under the follow ing conditions:
「80%
of the rated voltage or less, Maximum operating temperature -20 degree C or less
」
Extended useful lifetime, under specific operating conditions, can be estimated from
the chart on the left.
※The
useful lifetime is the time w hen cumulative failure rate becomes 1%.
※Please
note that the useful lifetime data is for reference only and not guaranteed.
*2 Standard Products: The test voltage of these products is 150% of the rated voltage and over
in the Durability / Operational Life Test.
GRM033R61A225ME47-04A
Substrate Bending Test
・Test
Substrate
Material : JIS C 6484 Copper-clad laminated sheets for PCBs (Glass fabric base, epoxy resin)
Thickness :
0.8mm
Copper Foil Thickness: 0.035mm
Kind of Solder : Sn-3.0Ag-0.5Cu
Land
b
4.5
40
c
c
Series
GRM03
Dimension(mm)
a
0.3
b
0.9
c
0.3
a
100
Solder Resist (Coat with heat resistant resin for solder)
・Pressurization
Method
20
50min.
Pressurization speed
1.0mm/s
Pressurize
R5
Support
Capacitance meter
45
45
Flexure
Fig.2 (in mm)
Adhesive Strength of Termination, Vibration, Temperature Sudden Change, High Temperature High Humidity(Steady), Durability
・Test
Substrate
Material : JIS C 6484 Copper-clad laminated sheets for PCBs (Glass fabric base, epoxy resin)
Thickness :
1.6mm or 0.8mm
Copper Foil Thickness: 0.035mm
Kind of Solder : Sn-3.0Ag-0.5Cu
・Land
Dimensions
Chip Capacitor
Land
Series
GRM03
a
b
Solder Resist
Dimension(mm)
a
0.3
c
b
0.9
c
0.3
Fig.3
GRM033R61A225ME47-04A
1.75±0.1
Fig.1 (in mm)
*1,2：2.0±0.05
4.0±0.1
单片机
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