IDT74FCT162543AT/CT
FAST CMOS 16-BIT LATCHED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS
16-BIT LATCHED
TRANSCEIVER
FEATURES:
•
•
•
•
•
•
•
•
IDT74FCT162543AT/CT
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK(o)
(Output Skew) < 250ps
Low input and output leakage
≤
1µA (max.)
V
CC
= 5V ±10%
Balanced Output Drivers: ±24mA
Reduced system switching noise
Typical VOLP (Output Ground Bounce) < 0.6V at V
CC
= 5V,
T
A
= 25°C
• Available in SSOP and TSSOP packages
The FCT162543T 16-bit latched transceivers are built using advanced dual
metal CMOS technology. These high-speed, low-power devices are organized
as two independent 8-bit D-type latched transceivers with separate input and
output control to permit independent control of data flow in either direction. For
example, the A-to-B Enable (xCEAB) must be low in order to enter data from
the A port or to output data from the B port. xLEAB controls the latch function.
When xLEAB is low, the latches are transparent. A subsequent low-to-high
transition of xLEAB signal puts the A latches in the storage mode. xOEAB
performs output enable function on the B port. Data flow from the B port to the
A port is similar but requires using xCEBA, xLEBA, and xOEBA inputs. Flow-
through organization of signal pins simplifies layout. All inputs are designed with
hysteresis for improved noise margin.
The FCT162543T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
times–reducing the need for external series terminating resistors. The
FCT162543T is a plug-in replacement for the FCT16543T and 54/74ABT16543
for on-board bus interface applications.
DESCRIPTION:
FUNCTIONAL BLOCK DIAGRAM
1
OEBA
56
2
OEBA
2
CEBA
2
LEBA
2
OEAB
2
CEAB
2
LEAB
29
31
30
28
26
27
1
CEBA
54
1
LEBA
1
OEAB
1
CEAB
1
LEAB
55
1
3
2
C
1
A
1
5
2
A
1
15
C
D
C
D
42
D
C
D
52
1
B
1
2
B
1
TO SEVEN OTHER CHANNELS
TO SEVEN OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
© 2002 Integrated Device Technology, Inc.
JUNE 2002
DSC-5445/4
IDT74FCT162543AT/CT
FAST CMOS 16-BIT LATCHED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1
OEAB
1
LEAB
1
CEAB
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Max
–0.5 to 7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
56
55
54
53
52
51
50
49
1
OEBA
1
LEBA
1
CEBA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
V
TERM
(2)
Terminal Voltage with Respect to GND
V
TERM
(3)
Terminal Voltage with Respect to GND
T
STG
I
OUT
Storage Temperature
DC Output Current
GND
1
A
1
1
A
2
GND
1
B
1
1
B
2
V
CC
1
A
3
1
A
4
1
A
5
V
CC
1
B
3
1
B
4
1
B
5
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
GND
1
A
6
1
A
7
1
A
8
2
A
1
2
A
2
2
A
3
GND
1
B
6
1
B
7
1
B
8
2
B
1
2
B
2
2
B
3
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
GND
2
A
4
2
A
5
2
A
6
GND
2
B
4
2
B
5
2
B
6
NOTE:
1. This parameter is measured at characterization but not tested.
V
CC
2
A
7
2
A
8
V
CC
2
B
7
2
B
8
GND
2
CEAB
2
LEAB
2
OEAB
GND
2
CEBA
2
LEBA
2
OEBA
FUNCTION TABLE
(1, 2)
For A-to-B (Symmetric with B-to-A)
Inputs
xLEAB
X
H
L
H
L
H
Latch
Status
xAx to xBx
Storing
Storing
Transparent
Storing
Transparent
Storing
Output
Buffers
xBx
Z
X
Current A Inputs
Previous* A Inputs
Z
Z
SSOP/ TSSOP
TOP VIEW
xCEAB
H
X
L
L
L
L
PIN DESCRIPTION
Pin Names
xOEAB
xOEBA
xCEAB
xCEBA
xLEAB
xLEBA
xAx
xBx
Description
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
B-to-A Enable Input (Active LOW)
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
A-to-B Data Inputs or B-to-A 3-State Outputs
B-to-A Data Inputs or A-to-B 3-State Outputs
xOEAB
X
X
L
L
H
H
NOTES:
1. * Before xLEAB LOW-to-HIGH Transition
H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedence
2. A-to-B data flow shown; B-to-A flow control is the same, except using xCEBA,
xLEBA and xOEBA.
2
IDT74FCT162543AT/CT
FAST CMOS 16-BIT LATCHED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
I
IL
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
V
mA
mV
µA
µA
Unit
V
V
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –24mA
I
OH
= 24mA
Min.
60
–60
2.4
—
Typ.
(2)
115
–115
3.3
0.3
Max.
200
–200
—
0.55
Unit
mA
mA
V
V
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ±5µA at T
A
= –55°C.
3
IDT74FCT162543AT/CT
FAST CMOS 16-BIT LATCHED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply
Current
(4)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
xCEAB and xOEAB = GND
xCEBA = V
CC
One Input Togging
50% Duty Cycle
V
CC
= Max.
Outputs Open
f
i
= 10MHz
50% Duty Cycle
xLEAB, xCEAB and
xOEAB = GND
xCEBA = V
CC
One Bit Toggling
V
CC
= Max.
Outputs Open
f
i
= 2.5MHz
50% Duty Cycle
xLEAB,
xCEBA
and
xOEAB = GND
xCEBA = V
CC
Sixteen Bit Toggling
V
IN
= V
CC
V
IN
= GND
Test Conditions
(1)
Min.
—
—
Typ.
(2)
0.5
60
Max.
1.5
100
Unit
mA
µA/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.6
1.5
mA
V
IN
= 3.4V
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
—
0.9
2.3
—
2.4
4.5
(5)
V
IN
= 3.4V
V
IN
= GND
—
6.4
16.5
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT74FCT162543AT/CT
FAST CMOS 16-BIT LATCHED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
74FCT162543AT
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
t
H
t
W
t
SK(o)
Parameter
Propagation Delay
Transparent Mode
xAx to xBx or xBx to xAx
Propagation Delay
xLEBA to xAx, xLEAB to xBx
Output Enable Time
xOEBA or xOEAB to xAx or xBx
xCEBA or xCEAB to xAx or xBx
Output Disable Time
xOEBA or xOEAB to xAx or xBx
xCEBA or xCEAB to xAx or xBx
Set-up Time HIGH or LOW
xAx or xBx to xLEAB or xLEBA
Hold Time HIGH or LOW
xAx or xBx to xLEAB or xLEBA
xLEBA or xLEAB Pulse Width LOW
Output Skew
(3)
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
Min.
(2)
1.5
Max.
6.5
1.5
74FCT162543CT
Min.
(2)
Max.
3.5
Unit
ns
1.5
1.5
8
9
1.5
1.5
4.1
4.8
ns
ns
1.5
7.5
1.5
4
ns
2
2
4
—
—
—
—
0.5
1
1
3
(4)
—
—
—
—
0.5
ns
ns
ns
ns
NOTES:
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This parameter is guaranteed but not tested.
5
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