RF/Microwave MLC’s
SQ Series Ultra Low ESR MLC
FEATURES:
•
•
•
•
•
Low ESR
High Q
High Self Resonance
Capacitance Range 0.1 pF to 5100 pF
175ºC Capability SQCB
(Standard voltages only)
APPLICATIONS:
•
•
•
•
RF Power Amplifiers
Low Noise Amplifiers
Filter Networks
MRI Systems
HOW TO ORDER
SQ
CA
Case Size
CA = 0505
CB = 1111
7
M
100
Capacitance
J
A
Failure Rate
Code
A = Not
Applicable
T
1A
Packaging Code
1A = 7" Reel Unmarked
6A = Waffle Pack Unmarked
ME = 7" Reel Marked
WE = Waffle Pack Marked
* Vertical T&R available
AVX Style
See mechanical
dimensions below
Voltage
Code
5 = 50V
1 = 100V
E = 150V
2 = 200V
V = 250V
9 = 300V
7 = 500V
C = 600V
A = 1000V
S = 1500V
EIA Capacitance Code in pF.
First two digits = significant
figures or “R” for decimal
place.
Third digit = number of zeros
or after “R” significant figures.
Capacitance
Tolerance Code
B = ±.1 pF
C = ±.25 pF
D = ±.5 pF
F = ±1%
G = ±2%
J = ±5%
K = ±10%
M = ±20%
N = ±30%
Termination Style Code
**T
= 100% Tin
J = Nickel Barrier Sn/Pb
(60/40)
**7
= Ag/Ni/Au
H = Cu/Sn (Non-Magnetic)
Temperature
Coefficient Code
M = +90±20ppm/°C
A = 0±30ppm/°C
C = 15% (“J” Termination only)
**RoHS compliant
MECHANICAL DIMENSIONS:
W
T
L
inches (millimeters)
Width (W)
.055±.015
(1.40±.381)
.110±.010
(2.79±.254)
Case
SQCA*
SQCB*
Length (L)
.055 + .015 - .010
(1.40+ .381 - .254)
.110 + .020 - .010
(2.79 +.508 -.254)
Thickness (T)
.020/.057
(.508/1.45)
.030/.102
(.762/2.59)
Band Width (bw)
.010 + .010 -.005
(.254 +.254 -.127)
.015±.010
(.381±.254)
bw
TAPE & REEL:
All tape and reel specifications are in compliance with EIA RS481 (equivalent to IEC 286 part 3).
—8mm carrier
—7" reel: SQCA/SQCB = 1000 pcs
Not RoHS Compliant
WAFFLE PACK
SQCA 100 pcs
SQCB 100 pcs
LEAD-FREE COMPATIBLE
COMPONENT
8
192
For RoHS compliant products,
please select correct termination style.
12132017
RF/Microwave MLC’s
SQ Series Ultra Low ESR MLC
ELECTRICAL SPECIFICATIONS
Dielectric
Temperature Coefficient (TCC)
M&A
(M) +90 ± 20 PPM/ºC ( -55ºC to +125ºC)
(M) +90 ± 30 PPM/ºC ( +125ºC to +175ºC)*
(A)
0 ± 30 PPM/ºC
(M) 0.1 pF to 1000 pF
(A) 0.1 pF to 5100 pF
A Case: -55ºC to +125ºC*
B Case (M Dielectric):
0.1 pF to 330 pF: from -55ºC to +175ºC
360 pF to 5100 pF: from -55ºC to +125ºC
B Case (A Dielectric):
0.1 pF to 200 pF: from -55ºC to +175ºC
220 pF to 5100 pF: from -55ºC to +125ºC
Greater than 10,000 at 1 MHz
Greater than 10,000 at 1 MHz
Greater than 2,000 at 1 MHz
Greater than 2,000 at 1 KHz
Greater than 10,000 at 1 MHz
Greater than 2,000 at 1 MHz
0.2 pF to 470 pF
10
6
Megohms min. @ 25ºC at rated WVDC
10
5
Megohms min. @ 125ºC at rated WVDC
510 pF to 5100 pF
10
5
Megohms min. @ 25ºC at rated WVDC
10
4
Megohms min. @ 125ºC at rated WVDC
See Capacitance Values table
WVDC 500V or less: 250% of rated WVDC for 5 seconds
WVDC 1250V or less: 150% of rated WVDC for 5 seconds
WVDC > 1250V: 120% of rated WVDC for 5 seconds
None
None
± (0.02% or 0.02 pF), whichever is greater
C
±15% (-55ºC to 125ºC)
Capacitance Range
Operating Temperature
0.001μF to 0.1μF
-55°C to +125°C
Quality Factor (Q)
M Dielectric A & B Case
A Dielectric B Case
A Dielectric A Case
Insulation Resistance (IR)
2.5% @ 1kHz
0.1 - 200 pF
220 - 1000 pF
1100 - 5100 pF
0.1 - 100 pF
110 - 1000 pF
10
4
Megohms min. @ 25ºC at rated WVDC
10
3
Megohms min. @ 125ºC at rated WVDC
Working Voltage (WVDC)
Dielectric Withstanding Voltage (DWV)
See Capacitance Values table
250% of rated WVDC for 5 secs
Aging Effects
Piezoelectric Effects
Capacitance Drift
* 175 SQCB only
<3% per decade hour
None
Not Applicable
ENVIRONMENTAL CHARACTERISTICS
AVX SQ will meet and exceed the requirements of EIA-198, MIL-PRF-55681 and MIL-PRF-123
Themal Shock
Moisture Resistance
Low Voltage Humidity
Mil-STD-202, Method 107, Condition A
Mil-STD-202, Method 106
Mil-STD-202, Method 103, condition A, with 1.5 VDC
applied while subjected to an environment of 85ºC with
85% relative humidity for 240 hours
Mil-STD-202, Method 108, for 2000 hours at 125ºC
Mil-STD-202, Method 213, Condition J
Mil-STD-202, Method 204, Condition B
Mil-STD-202, Method 104, Condition B
Mil-STD-202, Method 101, Condition B
Mil-STD-202, Method 208
Mil-STD-202, Method 211
Mil-STD-202, Method 102, Condition C
Mil-STD-202, Method 105, Condition B
Mil-STD-202, Method 210, Condition C
Life Test
Shock
Vibration
Immersion
Salt Spray
Solderability
Terminal Strength
Temperature Cycling
Barometric Pressure
Resistance to Solder Heat
8
193
Microchip MCU
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