M
Features
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
10-bit resolution
± 1 LSB max DNL
± 1 LSB max INL
4 (MCP3004) or 8 (MCP3008) input channels
Analog inputs programmable as single-ended or
pseudo-differential pairs
On-chip sample and hold
SPI serial interface (modes 0,0 and 1,1)
Single supply operation: 2.7V - 5.5V
200 ksps max. sampling rate at V
DD
= 5V
75 ksps max. sampling rate at V
DD
= 2.7V
Low power CMOS technology
5 nA typical standby current, 2 µA max.
500 µA max. active current at 5V
Industrial temp range: -40°C to +85°C
Available in PDIP, SOIC and TSSOP packages
MCP3004/3008
Description
The Microchip Technology Inc. MCP3004/3008
devices are successive approximation 10-bit Analog-
to-Digital (A/D) converters with on-board sample and
hold circuitry. The MCP3004 is programmable to pro-
vide two pseudo-differential input pairs or four single-
ended inputs. The MCP3008 is programmable to pro-
vide four pseudo-differential input pairs or eight single-
ended inputs. Differential Nonlinearity (DNL) and Inte-
gral Nonlinearity (INL) are specified at ±1 LSB. Com-
munication with the devices is accomplished using a
simple serial interface compatible with the SPI protocol.
The devices are capable of conversion rates of up to
200 ksps. The MCP3004/3008 devices operate over a
broad voltage range (2.7V - 5.5V). Low current design
permits operation with typical standby currents of only
5 nA and typical active currents of 320 µA. The
MCP3004 is offered in 14-pin PDIP, 150 mil SOIC and
TSSOP packages, while the MCP3008 is offered in 16-
pin PDIP and SOIC packages.
2.7V 4-Channel/8-Channel 10-Bit A/D Converters
with SPI™ Serial Interface
Applications
•
•
•
•
Sensor Interface
Process Control
Data Acquisition
Battery Operated Systems
Functional Block Diagram
V
REF
CH0
CH1
CH7*
14
13
12
11
10
9
8
V
DD
V
REF
AGND
CLK
D
OUT
D
IN
CS/SHDN
Sample
and
Hold
Control Logic
Input
Channel
Max
V
DD
V
SS
Package Types
PDIP, SOIC, TSSOP
CH0
CH1
CH2
CH3
NC
NC
DGND
1
2
3
4
5
6
7
DAC
Comparator
10-Bit SAR
MCP3004
Shift
Register
D
OUT
CS/SHDN D
IN
CLK
PDIP, SOIC
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
DD
V
REF
AGND
CLK
D
OUT
D
IN
CS/SHDN
DGND
*
Note:
Channels 4-7 available on MCP3008 Only
2002 Microchip Technology Inc.
MCP3008
DS21295B-page 1
MCP3004/3008
1.0
ELECTRICAL
CHARACTERISTICS
PIN FUNCTION TABLE
Name
V
DD
DGND
AGND
CH0-CH7
CLK
D
IN
D
OUT
CS/SHDN
V
REF
Function
+2.7V to 5.5V Power Supply
Digital Ground
Analog Ground
Analog Inputs
Serial Clock
Serial Data In
Serial Data Out
Chip Select/Shutdown Input
Reference Voltage Input
Absolute Maximum Ratings*
V
DD
........................................................................7.0V
All inputs and outputs w.r.t. V
SS
.....-0.6V to V
DD
+0.6V
Storage temperature .......................... -65°C to +150°C
Ambient temp. with power applied ..... -65°C to +125°C
Soldering temperature of leads (10 seconds) .. +300°C
ESD protection on all pins .................................. > 4 kV
*Notice: Stresses above those listed under "Maximum
Ratings" may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operation listings of this specification is not implied. Exposure
to maximum rating conditions for extended periods may affect
device reliability.
ELECTRICAL SPECIFICATIONS
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
REF
= 5V,
T
AMB
= -40°C to +85°C, f
SAMPLE
= 200 ksps and f
CLK
= 18*f
SAMPLE
. Unless otherwise noted, typical values apply for
V
DD
= 5V, T
AMB
= 25°C.
Parameter
Conversion Rate
Conversion Time
Analog Input Sample Time
Throughput Rate
DC Accuracy
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Dynamic Performance
Total Harmonic Distortion
Signal to Noise and Distortion
(SINAD)
Spurious Free Dynamic Range
Reference Input
Voltage Range
Current Drain
0.25
—
—
100
0.001
V
DD
150
3
V
µA
µA
Note 2
CS = V
DD
= 5V
—
—
—
-76
61
78
dB
dB
dB
V
IN
= 0.1V to 4.9V@1 kHz
V
IN
= 0.1V to 4.9V@1 kHz
V
IN
= 0.1V to 4.9V@1 kHz
INL
DNL
—
—
—
—
10
±0.5
±0.25
—
—
±1
±1
±1.5
±1.0
bits
LSB
LSB
LSB
LSB
No missing codes over
temperature
t
CONV
t
SAMPLE
f
SAMPLE
—
—
—
1.5
—
200
75
10
clock
cycles
clock
cycles
ksps
ksps
V
DD
= V
REF
= 5V
V
DD
= V
REF
= 2.7V
Sym
Min
Typ
Max
Units
Conditions
Note 1:
This parameter is established by characterization and not 100% tested.
2:
See graphs that relate linearity performance to V
REF
levels.
3:
Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity
performance, especially at elevated temperatures. See Section 6.2, “Maintaining Minimum Clock Speed”,
for more information.
DS21295B-page 2
2002 Microchip Technology Inc.
MCP3004/3008
ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
REF
= 5V,
T
AMB
= -40°C to +85°C, f
SAMPLE
= 200 ksps and f
CLK
= 18*f
SAMPLE
. Unless otherwise noted, typical values apply for
V
DD
= 5V, T
AMB
= 25°C.
Parameter
Analog Inputs
Input Voltage Range for CH0 or
CH1 in Single-Ended Mode
Input Voltage Range for IN+ in
pseudo-differential mode
Input Voltage Range for IN- in
pseudo-differential mode
Leakage Current
Switch Resistance
Sample Capacitor
Digital Input/Output
Data Coding Format
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Input Leakage Current
Output Leakage Current
Pin Capacitance
(All Inputs/Outputs)
Timing Parameters
Clock Frequency
Clock High Time
Clock Low Time
CS Fall To First Rising CLK Edge
CS Fall To Falling CLK Edge
Data Input Setup Time
Data Input Hold Time
CLK Fall To Output Data Valid
CLK Fall To Output Enable
CS Rise To Output Disable
CS Disable Time
D
OUT
Rise Time
D
OUT
Fall Time
f
CLK
t
HI
t
LO
t
SUCS
t
CSD
t
SU
t
HD
t
DO
t
EN
t
DIS
t
CSH
t
R
t
F
—
125
125
100
—
—
—
—
—
—
270
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
3.6
1.35
—
—
—
0
50
50
125
200
125
200
100
—
100
100
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
See Test Circuits, Figure 1-2
(Note
1)
See Test Circuits, Figure 1-2
(Note
1)
V
DD
= 5V, See Figure 1-2
V
DD
= 2.7V, See Figure 1-2
V
DD
= 5V, See Figure 1-2
V
DD
= 2.7V, See Figure 1-2
See Test Circuits, Figure 1-2
V
DD
= 5V (Note
3)
V
DD
= 2.7V (Note
3)
V
IH
V
IL
V
OH
V
OL
I
LI
I
LO
C
IN
,
C
OUT
4.1
—
-10
-10
—
Straight Binary
0.7 V
DD
—
—
—
—
—
—
—
—
0.3 V
DD
—
0.4
10
10
10
V
V
V
V
µA
µA
pF
I
OH
= -1 mA, V
DD
= 4.5V
I
OL
= 1 mA, V
DD
= 4.5V
V
IN
= V
SS
or V
DD
V
OUT
= V
SS
or V
DD
V
DD
= 5.0V (Note
1)
T
AMB
= 25°C, f = 1 MHz
V
SS
IN-
V
SS
-100
—
—
—
—
—
—
0.001
1000
20
V
REF
V
REF
+IN-
V
SS
+100
±1
—
—
mV
µA
Ω
pF
See Figure 4-1
See Figure 4-1
V
Sym
Min
Typ
Max
Units
Conditions
Note 1:
This parameter is established by characterization and not 100% tested.
2:
See graphs that relate linearity performance to V
REF
levels.
3:
Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity
performance, especially at elevated temperatures. See Section 6.2, “Maintaining Minimum Clock Speed”,
for more information.
2002 Microchip Technology Inc.
DS21295B-page 3
MCP3004/3008
ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
REF
= 5V,
T
AMB
= -40°C to +85°C, f
SAMPLE
= 200 ksps and f
CLK
= 18*f
SAMPLE
. Unless otherwise noted, typical values apply for
V
DD
= 5V, T
AMB
= 25°C.
Parameter
Power Requirements
Operating Voltage
Operating Current
V
DD
I
DD
2.7
—
—
425
225
5.5
550
V
µA
V
DD
= V
REF
= 5V,
D
OUT
unloaded
V
DD
= V
REF
= 2.7V,
D
OUT
unloaded
CS = V
DD
= 5.0V
Sym
Min
Typ
Max
Units
Conditions
Standby Current
Temperature Ranges
Specified Temperature Range
Operating Temperature Range
Storage Temperature Range
Thermal Package Resistance
Thermal Resistance, 14L-PDIP
Thermal Resistance, 14L-SOIC
Thermal Resistance, 14L-TSSOP
Thermal Resistance, 16L-PDIP
Thermal Resistance, 16L-SOIC
I
DDS
T
A
T
A
T
A
θ
JA
θ
JA
θ
JA
θ
JA
θ
JA
—
-40
-40
-65
—
—
—
—
—
0.005
—
—
—
70
108
100
70
90
2
+85
+85
+150
—
—
—
—
—
µA
°C
°C
°C
°C/W
°C/W
°C/W
°C/W
°C/W
Note 1:
This parameter is established by characterization and not 100% tested.
2:
See graphs that relate linearity performance to V
REF
levels.
3:
Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity
performance, especially at elevated temperatures. See Section 6.2, “Maintaining Minimum Clock Speed”,
for more information.
T
CSH
CS
T
SUCS
T
HI
T
LO
CLK
T
SU
D
IN
T
HD
MSB IN
T
EN
T
DO
NULL BIT
MSB OUT
T
R
T
F
T
DIS
LSB
D
OUT
FIGURE 1-1:
Serial Interface Timing.
DS21295B-page 4
2002 Microchip Technology Inc.
MCP3004/3008
1.4V
3 kΩ
D
OUT
C
L
= 100 pF
Test Point
V
DD
Test Point
D
OUT
100 pF
V
SS
3 kΩ
V
DD
/2
t
DIS
Waveform 2
t
EN
Waveform
t
DIS
Waveform 1
Voltage Waveforms for t
R
, t
F
D
OUT
t
R
t
F
V
OH
V
OL
CS
CLK
Voltage Waveforms for t
DO
D
OUT
CLK
t
DO
D
OUT
Voltage Waveforms for t
EN
1
2
3
4
B9
t
EN
Voltage Waveforms for t
DIS
CS
V
IH
90%
T
DIS
D
OUT
Waveform 2†
*
Waveform 1 is for an output with internal
conditions such that the output is high,
unless disabled by the output control.
Waveform 2 is for an output with internal
conditions such that the output is low,
unless disabled by the output control.
10%
FIGURE 1-2:
Load Circuit for t
R
, t
F
, t
DO
.
D
OUT
Waveform 1*
†
FIGURE 1-3:
Load circuit for t
DIS
and t
EN
.
2002 Microchip Technology Inc.
DS21295B-page 5