512 Kbit (64K x8) Page-Write EEPROM
SST29EE512
SST29EE512512Kb (x8) Page-Write, Small-Sector flash memories
Data Sheet
FEATURES:
• Single Voltage Read and Write Operations
– 4.5-5.5V for SST29EE512
• Superior Reliability
– Endurance: 100,000 Cycles (typical)
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 10 µA (typical)
• Fast Page-Write Operation
– 128 Bytes per Page, 512 Pages
– Page-Write Cycle: 5 ms (typical)
– Complete Memory Rewrite: 2.5 sec (typical)
– Effective Byte-Write Cycle Time: 39 µs (typical)
• Fast Read Access Time
– 4.5-5.5V operation: 70 ns
• Latched Address and Data
• Automatic Write Timing
– Internal V
PP
Generation
• End of Write Detection
– Toggle Bit
– Data# Polling
• Hardware and Software Data Protection
• Product Identification can be accessed via
Software Operation
• TTL I/O Compatibility
• JEDEC Standard
– Flash EEPROM Pinouts and command sets
• Packages Available
– 32-lead PLCC
– 32-lead TSOP (8mm x 20mm)
– 32-pin PDIP
• All non-Pb (lead-free) devices are RoHS compliant
PRODUCT DESCRIPTION
The SST29EE512 is a 64K x8 CMOS, Page-Write
EEPROM manufactured with SST’s proprietary, high-per-
formance CMOS SuperFlash technology. The split-gate
cell design and thick-oxide tunneling injector attain better
reliability and manufacturability compared with alternate
approaches. The SST29EE512 writes with a single
power supply. Internal Erase/Program is transparent to
the user. The SST29EE512 conforms to JEDEC stan-
dard pin assignments for byte-wide memories.
Featuring
high
performance
Page-Write,
the
SST29EE512 provides a typical Byte-Write time of 39
µsec. The entire memory, i.e., 64 KByte, can be written
page-by-page in as little as 2.5 seconds, when using
interface features such as Toggle Bit or Data# Polling to
indicate the completion of a Write cycle. To protect
against inadvertent write, the SST29EE512 have on-chip
hardware and Software Data Protection schemes.
Designed, manufactured, and tested for a wide spectrum
of applications, the SST29EE512 is offered with a guar-
anteed Page-Write endurance of 10,000 cycles. Data
retention is rated at greater than 100 years.
The SST29EE512 is suited for applications that require
convenient and economical updating of program, config-
uration, or data memory. For all system applications, the
SST29EE512 significantly improves performance and
reliability, while lowering power consumption. The
SST29EE512 improves flexibility while lowering the cost
for program, data, and configuration storage applications.
To meet high density, surface mount requirements, the
SST29EE512 is offered in 32-lead PLCC and 32-lead
TSOP packages. A 600-mil, 32-pin PDIP package is also
available. See Figures 1, 2, and 3 for pin assignments.
Device Operation
The SST Page-Write EEPROM offers in-circuit electrical
write capability. The SST29EE512 does not require sepa-
rate Erase and Program operations. The internally timed
Write cycle executes both erase and program transparently
to the user. The SST29EE512 has industry standard
optional Software Data Protection, which SST recom-
mends always to be enabled. The SST29EE512 is com-
patible with industry standard EEPROM pinouts and
functionality.
©2005 Silicon Storage Technology, Inc.
S71060-09-000
9/05
1
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
SSF is a trademark of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.
512 Kbit Page-Write EEPROM
SST29EE512
Data Sheet
Read
The Read operations of the SST29EE512 is controlled by
CE# and OE#, both have to be low for the system to obtain
data from the outputs. CE# is used for device selection.
When CE# is high, the chip is deselected and only standby
power is consumed. OE# is the output control and is used
to gate data from the output pins. The data bus is in high
impedance state when either CE# or OE# is high. Refer to
the Read cycle timing diagram for further details (Figure 4).
writing to the selected page and will leave the
SST29EE512 protected at the end of the Page-Write. The
page-load cycle consists of loading 1 to 128 Bytes of data
into the page buffer. The internal Write cycle consists of the
T
BLCO
time-out and the write timer operation. During the
Write operation, the only valid reads are Data# Polling and
Toggle Bit.
The Page-Write operation allows the loading of up to 128
Bytes of data into the page buffer of the SST29EE512
before the initiation of the internal Write cycle. During the
internal Write cycle, all the data in the page buffer is written
simultaneously into the memory array. Hence, the Page-
Write feature of SST29EE512 allows the entire memory to
be written in as little as 2.5 seconds. During the internal
Write cycle, the host is free to perform additional tasks,
such as to fetch data from other locations in the system to
set up the write to the next page. In each Page-Write oper-
ation, all the bytes that are loaded into the page buffer must
have the same page address, i.e. A
7
through A
16
. Any byte
not loaded with user data will be written to FFH.
See Figures 5 and 6 for the Page-Write cycle timing dia-
grams. If after the completion of the three-byte SDP load
sequence or the initial byte-load cycle, the host loads a sec-
ond byte into the page buffer within a byte-load cycle time
(T
BLC
) of 100 µs, the SST29EE512 will stay in the page-
load cycle. Additional bytes are then loaded consecutively.
The page-load cycle will be terminated if no additional byte
is loaded into the page buffer within 200 µs (T
BLCO
) from
the last byte-load cycle, i.e., no subsequent WE# or CE#
high-to-low transition after the last rising edge of WE# or
CE#. Data in the page buffer can be changed by a subse-
quent byte-load cycle. The page-load period can continue
indefinitely, as long as the host continues to load the device
within the byte-load cycle time of 100 µs. The page to be
loaded is determined by the page address of the last byte
loaded.
Write
The Page-Write to the SST29EE512 should always use
the JEDEC Standard Software Data Protection (SDP)
three-byte command sequence. The SST29EE512 con-
tains the optional JEDEC approved Software Data Protec-
tion scheme. SST recommends that SDP always be
enabled, thus, the description of the Write operations will
be given using the SDP enabled format.
The three-byte
SDP Enable and SDP Write commands are identical;
therefore, any time a SDP Write command is issued,
Software Data Protection is automatically assured.
The
first time the three-byte SDP command is given, the device
becomes SDP enabled. Subsequent issuance of the same
command bypasses the data protection for the page being
written. At the end of the desired Page-Write, the entire
device remains protected. For additional descriptions,
please see the application notes
The Proper Use of
JEDEC Standard Software Data Protection
and
Protecting
Against Unintentional Writes When Using Single Power
Supply Flash Memories.
The Write operation consists of three steps. Step 1 is the
three-byte load sequence for Software Data Protection.
Step 2 is the byte-load cycle to a page buffer of the
SST29EE512. Steps 1 and 2 use the same timing for both
operations. Step 3 is an internally controlled Write cycle for
writing the data loaded in the page buffer into the memory
array for nonvolatile storage. During both the SDP three-
byte load sequence and the byte-load cycle, the addresses
are latched by the falling edge of either CE# or WE#,
whichever occurs last. The data is latched by the rising
edge of either CE# or WE#, whichever occurs first. The
internal Write cycle is initiated by the T
BLCO
timer after the
rising edge of WE# or CE#, whichever occurs first. The
Write cycle, once initiated, will continue to completion, typi-
cally within 5 ms. See Figures 5 and 6 for WE# and CE#
controlled Page-Write cycle timing diagrams and Figures
15 and 17 for flowcharts.
The Write operation has three functional cycles: the Soft-
ware Data Protection load sequence, the page-load cycle,
and the internal Write cycle. The Software Data Protection
consists of a specific three-byte load sequence that allows
©2005 Silicon Storage Technology, Inc.
Software Chip-Erase
The SST29EE512 provides a Chip-Erase operation, which
allows the user to simultaneously clear the entire memory
array to the “1” state. This is useful when the entire device
must be quickly erased.
The Software Chip-Erase operation is initiated by using a
specific six-byte load sequence. After the load sequence,
the device enters into an internally timed cycle similar to the
Write cycle. During the Erase operation, the only valid read
is Toggle Bit. See Table 4 for the load sequence, Figure 10
for timing diagram, and Figure 19 for the flowchart.
S71060-09-000
9/05
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512 Kbit Page-Write EEPROM
SST29EE512
Data Sheet
Write Operation Status Detection
The SST29EE512 provides two software means to detect
the completion of a Write cycle, in order to optimize the sys-
tem Write cycle time. The software detection includes two
status bits: Data# Polling (DQ
7
) and Toggle Bit (DQ
6
). The
end of write detection mode is enabled after the rising WE#
or CE# whichever occurs first, which initiates the internal
Write cycle.
The actual completion of the nonvolatile write is asynchro-
nous with the system; therefore, either a Data# Polling or
Toggle Bit read may be simultaneous with the completion
of the Write cycle. If this occurs, the system may possibly
get an erroneous result, i.e., valid data may appear to con-
flict with either DQ
7
or DQ
6
. In order to prevent spurious
rejection, if an erroneous result occurs, the software routine
should include a loop to read the accessed location an
additional two (2) times. If both reads are valid, then the
device has completed the Write cycle, otherwise the rejec-
tion is valid.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of less than 5
ns will not initiate a Write cycle.
V
DD
Power Up/Down Detection: The Write operation is
inhibited when V
DD
is less than 2.5V.
Write Inhibit Mode: Forcing OE# low, CE# high, or WE#
high will inhibit the Write operation. This prevents inadvert-
ent writes during power-up or power-down.
Software Data Protection (SDP)
The SST29EE512 provides the JEDEC approved optional
Software Data Protection scheme for all data alteration
operations, i.e., Write and Chip-Erase. With this scheme,
any Write operation requires the inclusion of a series of
three byte-load operations to precede the data loading
operation. The three-byte load sequence is used to initiate
the Write cycle, providing optimal protection from inadvert-
ent Write operations, e.g., during the system power-up or
power-down. The SST29EE512 is shipped with the Soft-
ware Data Protection disabled.
The software protection scheme can be enabled by
applying a three-byte sequence to the device, during a
page-load cycle (Figures 5 and 6). The device will then
be automatically set into the data protect mode. Any
subsequent Write operation will require the preceding
three-byte sequence. See Table 4 for the specific soft-
ware command codes and Figures 5 and 6 for the tim-
ing diagrams. To set the device into the unprotected
mode, a six-byte sequence is required. See Table 4 for
the specific codes and Figure 9 for the timing diagram. If
a Write is attempted while SDP is enabled the device
will be in a non-accessible state for ~ 300 µs. SST rec-
ommends Software Data Protection always be enabled.
See Figure 17 for flowcharts.
The SST29EE512 Software Data Protection is a global
command, protecting (or unprotecting) all pages in the
entire memory array once enabled (or disabled). Therefore
using SDP for a single Page-Write will enable SDP for the
entire array. Single pages by themselves cannot be SDP
enabled or disabled, although the page addressed during
the SDP write will be written.
Single power supply reprogrammable nonvolatile memo-
ries may be unintentionally altered. SST strongly recom-
mends that Software Data Protection (SDP) always be
enabled. The SST29EE512 should be programmed using
the SDP command sequence. SST recommends the SDP
Disable Command Sequence not be issued to the device
prior to writing.
Data# Polling (DQ
7
)
When the SST29EE512 is in the internal Write cycle, any
attempt to read DQ
7
of the last byte loaded during the byte-
load cycle will receive the complement of the true data.
Once the Write cycle is completed, DQ
7
will show true
data. Note that even though DQ
7
may have valid data
immediately following the completion of an internal Write
operation, the remaining data outputs may still be invalid:
valid data on the entire data bus will appear in subsequent
successive Read cycles after an interval of 1 µs. See Fig-
ure 7 for Data# Polling timing diagram and Figure 16 for a
flowchart.
Toggle Bit (DQ
6
)
During the internal Write cycle, any consecutive attempts to
read DQ
6
will produce alternating ‘0’s and ‘1’s, i.e., toggling
between 0 and 1. When the Write cycle is completed, the
toggling will stop. The device is then ready for the next
operation. See Figure 8 for Toggle Bit timing diagram and
Figure 16 for a flowchart. The initial read of the Toggle Bit
will typically be a “1”.
Data Protection
The SST29EE512 provide both hardware and software
features to protect nonvolatile data from inadvertent writes.
©2005 Silicon Storage Technology, Inc.
S71060-09-000
9/05
3
512 Kbit Page-Write EEPROM
SST29EE512
Data Sheet
Please refer to the following Application Notes for more
information on using SDP:
•
•
Protecting Against Unintentional Writes When
Using Single Power Supply Flash Memories
The Proper Use of JEDEC Standard Software
Data Protection
TABLE 1: P
RODUCT
I
DENTIFICATION
Address
Manufacturer’s ID
Device ID
SST29EE512
0001H
5DH
T1.3 1060
Data
BFH
0000H
Product Identification
The Product Identification mode identifies the device as the
SST29EE512 and manufacturer as SST. This mode is
accessed via software. For details, see Table 4, Figure 11
for the software ID entry, and Read timing diagram and Fig-
ure 18 for the ID entry command sequence flowchart.
Product Identification Mode Exit
In order to return to the standard Read mode, the Software
Product Identification mode must be exited. Exiting is
accomplished by issuing the Software ID Exit (reset) opera-
tion, which returns the device to the Read operation. The
Reset operation may also be used to reset the device to the
Read mode after an inadvertent transient condition that
apparently causes the device to behave abnormally, e.g.,
not read correctly. See Table 4 for software command
codes, Figure 12 for timing waveform, and Figure 18 for a
flowchart.
F
UNCTIONAL
B
LOCK
D
IAGRAM
X-Decoder
SuperFlash
Memory
A15 - A0
Address Buffer & Latches
Y-Decoder and Page Latches
CE#
OE#
WE#
Control Logic
I/O Buffers and Data Latches
DQ7 - DQ0
1060 B1.1
©2005 Silicon Storage Technology, Inc.
S71060-09-000
9/05
4
512 Kbit Page-Write EEPROM
SST29EE512
Data Sheet
WE#
VDD
A12
A15
NC
NC
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
5
6
7
8
9
10
11
12
13
4
3
2
1
32 31 30
29
28
27
26
25
24
23
22
NC
A14
A13
A8
A9
A11
OE#
A10
CE#
DQ7
32-lead PLCC
Top View
21
14 15 16 17 18 19 20
DQ1
DQ2
VSS
DQ3
DQ4
DQ5
DQ6
1060 32-plcc NH P1.0
FIGURE 1: P
IN
A
SSIGNMENTS FOR
32-
LEAD
PLCC
A11
A9
A8
A13
A14
NC
WE#
VDD
NC
NC
A15
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Standard Pinout
Top View
Die Up
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
OE#
A10
CE#
DQ7
DQ6
DQ5
DQ4
DQ3
VSS
DQ2
DQ1
DQ0
A0
A1
A2
A3
1060 32-tsop EH P2.0
FIGURE 2: P
IN
A
SSIGNMENTS FOR
32-
LEAD
TSOP
NC
NC
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
1
2
3
4
5
32-pin
6
PDIP
7
8
Top View
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VDD
WE#
NC
A14
A13
A8
A9
A11
OE#
A10
CE#
DQ7
DQ6
DQ5
DQ4
DQ3
1060 32-pdip PH P3.0
FIGURE 3: P
IN
A
SSIGNMENTS FOR
32-
PIN
PDIP
©2005 Silicon Storage Technology, Inc.
S71060-09-000
9/05
5
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