74ACTQ273 Quiet Series Octal D-Type Flip-Flop
August 1989
Revised August 2001
74ACTQ273
Quiet Series Octal D-Type Flip-Flop
General Description
The ACTQ273 has eight edge-triggered D-type flip-flops
with individual D inputs and Q outputs. The common buff-
ered Clock (CP) and Master Reset (MR) input load and
reset (clear) all flip-flops simultaneously.
The register is fully edge-triggered. The state of each D-
type input, one setup time before the LOW-to-HIGH clock
transition, is transferred to the corresponding flip-flop’s Q
output.
All outputs will be forced LOW independently of Clock or
Data inputs by a LOW voltage level on the MR input. The
device is useful for applications where the true output only
is required and the Clock and Master Reset are common to
all storage elements.
The ACTQ utilizes Fairchild Quiet Series
technology to
guarantee quiet output switching and improved dynamic
threshold performance. FACT Quiet Series
features
GTO
output control and undershoot corrector in addition
to a split ground bus for superior performance.
Features
s
I
CC
reduced by 50%
s
Guaranteed simultaneous switching noise level and
dynamic threshold performance
s
Guaranteed pin-to-pin skew AC performance
s
Improved latch-up immunity
s
Buffered common clock and asynchronous master reset
s
Outputs source/sink 24 mA
s
4 kV minimum ESD immunity
Ordering Code:
Order Number
74ACTQ273SC
74ACTQ273SJ
74ACTQ273MTC
74ACTQ273PC
Package Number
M20B
M20D
MTC20
N20A
Package Description
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Pin Names
D
0
–D
7
MR
CP
Q
0
–Q
7
Description
Data Inputs
Master Reset
Clock Pulse Input
Data Outputs
FACT, FACT Quiet Series, and GTO are trademarks of Fairchild Semiconductor Corporation.
© 2001 Fairchild Semiconductor Corporation
DS010585
www.fairchildsemi.com
74ACTQ273
Logic Symbols
IEEE/IEC
Mode Select-Function Table
Inputs
Operating Mode
MR
Reset (Clear)
Load “1”
Load “0”
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
X
=
Immaterial
=
LOW-to-HIGH Transition
Outputs
D
n
X
H
L
Q
n
L
H
L
CP
L
H
H
X
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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2
74ACTQ273
Absolute Maximum Ratings
(Note 1)
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
= −
0.5V
V
I
=
V
CC
+
0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
= −
0.5V
V
O
=
V
CC
+
0.5V
DC Output Voltage (V
O
)
DC Output Source
or Sink Current (I
O
)
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
)
Storage Temperature (T
STG
)
DC Latch-up Source or
Sink Current
Junction Temperature (T
J
)
PDIP
140
°
C
−
0.5V to
+
7.0V
−
20 mA
+
20 mA
−
0.5V to V
CC
+
0.5V
−
20 mA
+
20 mA
−
0.5V to V
CC
+
0.5V
±
50 mA
±
50 mA
−
65
°
C to
+
150
°
C
±
300 mA
Recommended Operating
Conditions
Supply Voltage (V
CC
)
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
Minimum Input Edge Rate
∆
V/
∆
t
V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V
125 mV/ns
4.5V to 5.5V
0V to V
CC
0V to V
CC
−
40
°
C to
+
85
°
C
Note 1:
Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, with-
out exception, to ensure that the system design is reliable over its power
supply, temperature, and output/input loading variables. Fairchild does not
recommend operation of FACT circuits outside databook specifications.
DC Electrical Characteristics
Symbol
V
IH
V
IL
V
OH
Parameter
Minimum HIGH Level
Input Voltage
Maximum LOW Level
Input Voltage
Minimum HIGH Level
Output Voltage
V
CC
(V)
4.5
5.5
4.5
5.5
4.5
5.5
4.5
5.5
V
OL
Maximum LOW Level
Output Voltage
4.5
5.5
4.5
5.5
I
IN
I
CCT
I
OLD
I
OHD
I
CC
V
OLP
V
OLV
V
IHD
V
ILD
Maximum Input Leakage Current
Maximum I
CC
/Input
Minimum Dynamic
Output Current (Note 3)
Maximum Quiescent Supply Current
Quiet Output
Maximum Dynamic V
OL
Quiet Output
Minimum Dynamic V
OL
Minimum HIGH Level Dynamic Input Voltage
Maximum LOW Level Dynamic Input Voltage
5.5
5.5
5.5
5.5
5.5
5.0
5.0
5.0
5.0
1.1
−0.6
1.9
1.2
4.0
1.5
−1.2
2.2
0.8
0.6
0.001
0.001
T
A
= +25°C
Typ
1.5
1.5
1.5
1.5
4.49
5.49
2.0
2.0
0.8
0.8
4.4
5.4
3.86
4.86
0.1
0.1
0.36
0.36
±0.1
T
A
= −40°C
to
+85°C
Guaranteed Limits
2.0
2.0
0.8
0.8
4.4
5.4
3.76
4.76
0.1
0.1
0.44
0.44
±
1.0
1.5
75
−75
40.0
µA
mA
mA
mA
µA
V
V
V
V
V
Units
V
V
V
Conditions
V
OUT
=
0.1V
or V
CC
−
0.1V
V
OUT
=
0.1V
or V
CC
−
0.1V
I
OUT
= −50 µA
V
IN
=
V
IL
or V
IH
V
I
OH
= −24
mA
I
OH
= −24
mA (Note 2)
I
OUT
=
50
µA
V
IN
=
V
IL
or V
IH
V
I
OL
=
24 mA
I
OL
=
24 mA (Note 2)
V
I
=
V
CC
, GND
V
I
=
V
CC
−
2.1V
V
OLD
=
1.65V Max
V
OHD
=
3.85V Min
V
IN
=
V
CC
or GND
Figures 1, 2
(Note 4)
Figures 1, 2
(Note 4)
(Note 5)
(Note 5)
Note 2:
All outputs loaded; thresholds on input associated with output under test.
Note 3:
Maximum test duration 2.0 ms, one output loaded at a time.
Note 4:
Max number of outputs defined as (n). n
−
1 Data inputs are driven 0V to 3V; one output @ GND.
Note 5:
Max number of Data Inputs (n) switching. (n
−
1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (V
ILD
), 0V to thresh-
old (V
IHD
) f
=
1 MHz.
3
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74ACTQ273
AC Electrical Characteristics
V
CC
Symbol
Parameter
(V)
(Note 6)
f
MAX
t
PLH
t
PHL
t
PHL
t
OSHL
,
t
OSLH
Maximum Clock
Frequency
Propagation Delay
CP to Q
n
Propagation Delay
MR to Q
n
Output to Output
Skew (Note 7)
5.0
5.0
5.0
5.0
Min
125
1.5
1.5
T
A
= +25°C
C
L
=
50 pF
Typ
189
6.5
7.0
0.5
8.5
9.0
1.0
Max
T
A
= −40°C
to
+85°C
C
L
=
50 pF
Min
110
1.5
1.5
9.0
9.5
1.0
Max
MHz
ns
ns
ns
Units
Note 6:
Voltage Range 5.0 is 5.0V
±
0.5V
Note 7:
Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device.
The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guaranteed by
design. Not tested.
AC Operating Requirements
V
CC
Symbol
Parameter
(V)
(Note 8)
t
S
t
H
t
W
Setup Time, HIGH or LOW
D
n
to CP
Hold Time, HIGH or LOW
D
n
to CP
Clock Pulse Width
HIGH or LOW
t
W
t
W
MR Pulse Width
HIGH or LOW
Recovery Time
MR to CP
Note 8:
Voltage Range 5.0 is 5.0V
±
0.5V
T
A
= +25°C
C
L
=
50 pF
Typ
1.0
−0.5
2.0
3.5
1.5
4.0
T
A
= −40°C
to
+85°C
C
L
=
50 pF
Guaranteed Minimum
3.5
1.5
4.0
ns
ns
ns
Units
5.0
5.0
5.0
5.0
5.0
1.5
0.5
4.0
3.0
4.0
3.0
ns
ns
Capacitance
Symbol
C
IN
C
PD
Parameter
Input Capacitance
Power Dissipation Capacitance
Typ
4.5
40.0
Units
pF
pF
V
CC
=
OPEN
V
CC
=
5.0V
Conditions
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4
74ACTQ273
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500
Ω
.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
V
OLP
/V
OLV
and V
OHP
/V
OHV
:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50
Ω
coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
• Measure V
OLP
and V
OLV
on the quiet output during the
worst case transition for active and enable. Measure
V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD
and V
IHD
:
• Monitor one of the switching outputs using a 50
Ω
coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
• Next decrease the input HIGH voltage level, V
IH
, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note 9:
V
OHV
and V
OLP
are measured with respect to ground reference.
Note 10:
Input pulses have the following characteristics: f
=
1 MHz, t
r
=
3 ns, t
f
=
3 ns, skew
<
150 ps.
FIGURE 2. Simultaneous Switching Test Circuit
5
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