The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 2:
Either voltage limit or current limit is sufficient to protect inputs.
Note 3:
ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
TTL-to-PECL DC Electrical Characteristics
(Note 4)
V
CC
= +
5.0V
±
10%, GND
=
0V, T
C
=
0°C to
+85°C
Symbol
V
OH
V
OL
V
OHC
V
OLC
V
IH
V
IL
I
IH
I
IL
Parameter
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Corner Point High
Output LOW Voltage
Corner Point Low
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Breakdown Test
Input LOW Current
Dn
E
V
FCD
I
CC
Input Clamp
Diode Voltage
V
CC
Supply Current
−0.8
−4.2
−1.2
32
69
V
mA
I
IN
= −18
mA
Inputs OPEN
mA
V
IN
= +0.5V
2.0
0
Min
V
CC
−
1025
Typ
V
CC
−
955
Max
V
CC
−
870
Units
mV
mV
mV
V
CC
−
1610
5.0
0.8
10
20
mV
V
V
µA
µA
Conditions
V
IN
=
V
IH(max)
or V
IL (min)
Loading with 50Ω to V
CC
−
2V
V
IN
=
V
IH(min)
or V
IL (max)
Loading with 50Ω to V
CC
−
2V
Over V
TTL
, V
EE
, T
C
Range
Over V
TTL
, V
EE
, T
C
Range
V
IN
= +2.7V
V
IN
= +5.5V
V
CC
−
1890 V
CC
−
1705 V
CC
−
1620
V
CC
−
1035
Note 4:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
PDIP AC Electrical Characteristics
V
CC
=
5.0V
±
10%
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Parameter
Propagation Delay
Data to Output
Propagation Delay
Enable to Output
Transition Time
20% to 80%, 80% to 20%
T
C
=
0°C
Min
0.30
0.40
0.35
Max
1.40
1.50
1.70
T
C
= +25°C
Min
0.35
0.45
0.35
Max
1.30
1.40
1.70
T
C
= +85°C
Min
0.40
0.50
0.35
Max
1.30
1.40
1.70
Units
ns
ns
ns
Conditions
Figures 1, 2
Figures 1, 2
Figures 1, 2
3
www.fairchildsemi.com
100391
Commercial Version
(Continued)
SOIC and PLCC AC Electrical Characteristics
V
CC
=
5.0V
±
10%
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
t
OSHL
Parameter
Propagation Delay
Data to Output
Propagation Delay
Enable to Output
Transition Time
20% to 80%, 80% to 20%
Maximum Skew Common Edge
Output-to-Output Variation
Data to Output Path
t
OSLH
Maximum Skew Common Edge
Output-to-Output Variation
Data to Output Path
t
OST
Maximum Skew Opposite Edge
Output-to-Output Variation
Data to Output Path
t
PS
Maximum Skew
Pin (Signal) Transition Variation
Data to Output Path
Note 5:
Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same pack-
aged device. The specifications apply to any outputs switching in the same direction either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
), or in opposite
directions both HL and LH (t
OST
). Parameters t
OST
and t
PS
guaranteed by design.
T
C
=
0°C
Min
0.30
0.40
0.35
Max
1.40
1.50
1.70
T
C
= +25°C
Min
0.35
0.45
0.35
Max
1.30
1.40
1.70
T
C
= +85°C
Min
0.40
0.50
0.35
Max
1.30
1.40
1.70
Units
ns
ns
ns
Conditions
Figures 1, 2
750
750
750
ps
PLCC Only
(Note 5)
700
700
700
ps
PLCC Only
(Note 5)
450
450
450
ps
PLCC Only
(Note 5)
525
525
525
ps
PLCC Only
(Note 5)
www.fairchildsemi.com
4
100391
Industrial Version
PLCC DC Electrical Characteristics
(Note 6)
V
CC
= +5.0V ±
10%, GND
=
0V
Symbol
V
OH
V
OL
V
OHC
V
OLC
V
IH
V
IL
V
IH
I
IL
Parameter
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
D
n
E
V
FCD
I
CC
Input Clamp
Diode Voltage
V
CC
Supply Current
−0.8
−4.2
−1.2
29
69
−0.8
−4.2
−1.2
29
69
V
mA
I
IN
= −18
mA
Inputs OPEN
mV
V
IN
= +0.5V
2.0
0
T
C
= −40°C
Min
V
CC
−
1085
V
CC
−
1095
V
CC
−
1565
5.0
0.8
10
20
2.0
0
Max
T
C
=
0°C to
+85°C
Min
Max
Units
mV
mV
mV
V
CC
−
1610
5.0
0.8
10
20
mV
V
V
µA
µA
V
IN
= +2.7V
V
IN
= +5.5V
Conditions
V
IN
=
V
IH(max)
or V
IL (min)
Loading with 50Ω to V
CC
−
2V
V
IN
=
V
IH(min)
or V
IL(max)
Loading with 50Ω to V
CC
−
2V
V
CC
−
870 V
CC
−
1025 V
CC
−
870
V
CC
−
1035
V
CC
−
1830 V
CC
−
1575 V
CC
−
1830 V
CC
−
1620
Note 6:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
空分复用 (SDM) MIMO 处理可显著提高频谱效率，进而大幅增加无线通信系统的容量。空分复用 MIMO 通信系统作为一种能够大幅提升无线系统容量和连接可靠性的手段，近来吸引了人们的广泛关注。 MIMO 无线系统最佳硬判决检测方式是最大似然 (ML) 检测器。ML 检测因为比特误码率 (BER)性能出众，非常受欢迎。不过，直接实施的复杂性会随着天线和调制方案的增加呈指数级增强，使...[详细]
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