74LVQ02 Low Voltage Quad 2-Input NOR Gate
February 1992
Revised June 2001
74LVQ02
Low Voltage Quad 2-Input NOR Gate
General Description
The LVQ02 contains four 2-input NOR gates.
Features
s
Ideal for low power/low noise 3.3V applications
s
Guaranteed simultaneous switching noise level and
dynamic threshold performance
s
Guaranteed pin-to-pin skew AC performance
s
Guaranteed incident wave switching into 75
Ω
Ordering Code:
Order Number
74LVQ02SC
74LVQ02SJ
Package Number
M14A
M14D
Package Description
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Pin Descriptions
Pin Names
A
n
, B
n
O
n
Description
Inputs
Outputs
© 2001 Fairchild Semiconductor Corporation
DS011342
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74LVQ02
Absolute Maximum Ratings
(Note 1)
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
= −
0.5V
V
I
=
V
CC
+
0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
= −
0.5V
V
O
=
V
CC
+
0.5V
DC Output Voltage (V
O
)
DC Output Source
or Sink Current (I
O
)
DC V
CC
or Ground Current
(I
CC
or I
GND
)
Storage Temperature (T
STG
)
DC Latch-Up Source or
Sink Current
−
0.5V to
+
7.0V
−
20 mA
+
20 mA
−
0.5V to V
CC
+
0.5V
−
20 mA
+
20 mA
−
0.5V to V
CC
+
0.5V
±
50 mA
±
200 mA
−
65
°
C to
+
150
°
C
±
100 mA
Recommended Operating
Conditions
(Note 2)
Supply Voltage (V
CC
)
LVQ
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
74LVQ
Minimum Input Edge Rate (
∆
V/
∆
t)
V
IN
from 0.8V to 2.0V
V
CC
@ 3.0V
125 mV/ns
Note 1:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 2:
Unused inputs must be held HIGH or LOW. They may not float.
2.0V to 3.6V
0V to V
CC
0V to V
CC
−
40
°
C to
+
85
°
C
DC Electrical Characteristics
Symbol
V
IH
V
IL
V
OH
Parameter
Minimum High Level
Input Voltage
Maximum Low Level
Input Voltage
Minimum High Level
Output Voltage
V
OL
Maximum Low Level
Output Voltage
I
IN
I
OLD
I
OHD
I
CC
V
OLP
V
OLV
V
IHD
V
ILD
Maximum Input
Leakage Current
Minimum Dynamic (Note 4)
Output Current
Maximum Quiescent
Supply Current
Quiet Output
Maximum Dynamic V
OL
Quiet Output
Minimum Dynamic V
OL
Maximum High Level
Dynamic Input Voltage
Maximum Low Level
Dynamic Input Voltage
V
CC
(V)
3.0
3.0
3.0
3.0
3.0
3.0
3.6
3.6
3.6
3.6
3.3
3.3
3.3
3.3
0.6
−0.7
1.7
1.7
2.0
1.0
−1.0
2.0
0.8
0.002
T
A
= +25°C
Typ
1.5
1.5
2.99
2.0
0.8
2.9
2.58
0.1
0.36
±0.1
T
A
= −40°C
to
+85°C
Guaranteed Limits
2.0
0.8
2.9
2.48
0.1
0.44
±1.0
36
−25
20.0
V
V
V
V
V
V
µA
mA
mA
µA
V
V
V
V
V
OUT
=
0.1V
or V
CC
−
0.1V
V
OUT
=
0.1V
or V
CC
−
0.1V
I
OUT
= −50 µA
V
IN
=
V
IL
or V
IH
(Note 3)
I
OH
= −12
mA
I
OUT
=
50
µA
V
IN
=
V
IL
or V
IH
(Note 3)
I
OL
=
12 mA
V
I
=
V
CC
, GND
V
OLD
=
0.8V Max (Note 5)
V
OHD
=
2.0V Min (Note 5)
V
IN
=
V
CC
or GND
(Note 6)(Note 7)
(Note 6)(Note 7)
(Note 6)(Note 8)
(Note 6)(Note 8)
Units
Conditions
Note 3:
All outputs loaded; thresholds on input associated with output under test.
Note 4:
Maximum test duration 2.0 ms, one output loaded at a time.
Note 5:
Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for 74LVQ.
Note 6:
Worst case package.
Note 7:
Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8:
Max number of Data Inputs (n) switching. (n
−
1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (V
ILD
), 0V to threshold
(V
IHD
), f
=
1 MHz.
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2
74LVQ02
AC Electrical Characteristics
T
A
= +25°C
Symbol
Parameter
V
CC
(V)
t
PLH
t
PHL
t
OSHL,
t
OSLH
Propagation Delay
Propagation Delay
Output to Output Skew (Note 9)
Data to Output
2.7
3.3
±
0.3
2.7
3.3
±
0.3
2.7
3.3
±
0.3
Min
1.5
1.5
1.5
1.5
C
L
=
50 pF
Typ
6.0
5.0
6.0
5.0
1.0
1.0
Max
10.6
7.5
10.6
7.5
1.5
1.5
T
A
= −40°C
to
+85°C
C
L
=
50 pF
Min
1.0
1.0
1.0
1.0
Max
12.0
8.0
12.0
8.0
1.5
1.5
ns
ns
ns
Units
Note 9:
Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guaranteed by design.
Capacitance
Symbol
C
IN
C
PD
(Note 10)
Parameter
Input Capacitance
Power Dissipation Capacitance
Typ
4.5
20
Units
pF
pF
V
CC
=
Open
V
CC
=
3.3V
Conditions
Note 10:
C
PD
is measured at 10 MHz.
3
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74LVQ02
Physical Dimensions
inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
www.fairchildsemi.com
4
74LVQ02 Low Voltage Quad 2-Input NOR Gate
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
5
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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