Resistance to sulphur-bearing gas (AS version only): ASTM-B-809
Voltage proof
Volts
Note: A 0.01 Ohm addition to be added to the performance of all resistors <10 Ohms.
ΔR%
ΔR%
ΔR%
ΔR%
ΔR%
1
1
1
0.25
0.25
0.25
500
ΔR%
ΔR%
Maximum
1
0.1
Zero at 155°C
0.1
0.2
0.25
0.05
0.05
0.05
Typical
0.25
0.02
Pulse Performance Data
Pulse Performance Data
Lightning Surge
Lightning surge resistors are tested in accordance with IEC 60 115-1 using both 1.2/50µs and 10/700µs pulse shapes. 10 pulses are applied. The limit of
acceptance is a shift in resistance of less than 1% from the initial value.
2512
2010
1206
0805
0603
Lightning Surge
Lightning surge resistors are tested in
accordance with IEC 60 115-1 using
both 1.2/50µs and 10/700µs pulse shapes.
10 pulses are applied. The limit of
acceptance is a shift in resistance of less
than 1% from the initial value.
2512
2010
1206
0805
0603
General Note
TT Electronics reserves the right to make changes in product specification without notice or liability.
All information is subject to TT Electronics’ own data and is considered accurate at time of going to print.
The single impulse graph is the result of 50 impulses of rectangular shape applied at one minute intervals. The limit of acceptance was a shift in
resistance of less than 1% from the initial value.
2512
2010
1206
0805
0603
Continuous Load Due to Repetitive Pulses
The continuous load graph was obtained by applying repetitive rectangular pulses where the pulse period was adjusted so that the average
power dissipated in the resistor was equal to its rated power at 70°C. Again the limit of acceptance was a shift in resistance of less than 1% from the
initial value
2512
2010
1206
0805
0603
General Note
TT Electronics reserves the right to make changes in product specification without notice or liability.
All information is subject to TT Electronics’ own data and is considered accurate at time of going to print.
复杂 IC 不仅吸引了更多系统，而且还吞食着设计者用于建立、评估与校准芯片的测试设备。 芯片设计者正开始在自己的复杂 IC上设计测试与测量仪器。在IC中设计测试仪器的潮流开始于CPU核心与总线的数字调试硬件。现在，设计者也在高速I/O块中建立分析仪器。设计者正在高频芯片的内部作业中集成更复杂的模拟与RF测试仪器，如读取通道IC。 这只是尺度问题。随着系统级 IC 越来越大而复杂...[详细]
NXP MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
