SCOPE:
IMPROVED, DUAL, HIGH-SPEED CHANNEL ANALOG SWITCHES
Generic Number
DG401A(x)/883B
DG403A(x)/883B
DG405A(x)/883B
Device Type
01
02
03
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
K
Z
Mil-Std-1835
GDIP1-T16 or CDIP2-T16
CQCC1-N20
Case Outline
Package Code
16 LEAD CERDIP
J16
20-Pin Ceramic LCC
L20
Absolute Maximum Ratings
Voltage Referenced to V
-
V
+
to V
-
.............................................................................................................................. 44V
V
+
to GND ......................................................................................................................... 25V
V
L
................................................................................................... (GND-0.3V) to (V
+
+0.3V)
Digital Inputs, V
S
, V
D
1/ ........................................................................ .(V
-
-2V) to (V
+
+2V)
or 20mA whichever occurs first.
Continuous Current, Any terminal except S or D ........................................................... 30mA
Continuous Current, S or D ............................................................................................. 20mA
Peak Current, S or D (Pulsed at 1ms, 10% duty cycle max) ......................................... 100mA
Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation ............................................................................. T
A
=+70°C
16 lead CERDIP(derate 10.0mW/°C above +70°C) .................................................. 800mW
20 lead LCC (derate 9.1 mW/°C above +70°C) ........................................................ 727mW
Junction Temperature T
J
....................................................................................…. +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 16 lead CERDIP................................................................…. 50°C/W
Case Outline 20 lead LCC .....................................................................…. 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 16 lead CERDIP................................................................... 100°C/W
Case Outline 20 lead LCC ......................................................................... 110°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ....................................................……...... -55°C to
+125°C
Positive Supply Voltage (V
+
) ..............................................................................……... +15V
Negative Supply Voltage (V
-
) ..............................................................................……... -15V
V
INL
(max) ............................................................................................................……... 0.8V
V
INH
(min) ...........................................................................................................…….... 2.4V
Logic Supply Voltage (V
L
) ...................................................................................…….. +5V
Low Charge Injection .........................................................................................……... 15pC
Crosstalk (channel-to-channel) 2/ .........................................................................…….. 90dB
1/ Signals on S
X
, D
X
or IN
X
exceeding V
+
or V
-
are clamped by internal diodes. Limit forward current to
maximum current ratings.
2/ Crosstalk performance is improved with case outline for 20LCC.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of DG401/403/405A /883B
19-0079
Page 2 of
Rev. C
7
TABLE 1. ELECTRICAL TESTS
CONDITIONS
-55
°C
<=T
A
<= +125°C
V
+
=+15V, V
-
=-15V, GND=0V
V
INH
=2.4V, V
INL
=0.8V, V
L
=5V
Unless otherwise specified
TEST
Symbol
Group A
Subgroup
Device
type
Limits
Min
3/
Limits
Max
3/
Units
SWITCH
Analog-Signal
Range
Drain-Source ON
Resistance
Drain-Source ON
Resistance
Matching between
Channels
5/
On-Resistance
Flatness
5/
Source-OFF
Leakage Current
Drain-OFF
Leakage Current
Drain-ON Leakage
Current
INPUT
Input
Current/Voltage
High
Input
Current/Voltage
Low
SUPPLY
Power-Supply
Range
Positive Supply
Current
Negative Supply
Current
Logic Supply
Current
Ground Current
V
ANALOG
1,2,3
All
All
-15
15
30
45
2.0
3.0
V
Ω
Ω
r
DS(ON)
∆r
DS
(ON)
4/
V
+
=+13.5V, V
-
=-13.5V,
I
S
=-10mA, V
D
=±10V, V
INH
=2.4V,
V
INL
=0.8V
V
+
=+15V, V
-
=-15V,
I
S
=-10mA, V
D
=±10V
V
+
=+15V, V
-
=-15V,
I
S
=-10mA, V
D
=±5V, 0V
V
+
=+16.5V, V
-
=-16.5V,
V
D
=±15.5V, V
S
=±15.5V
V
+
=+16.5V, V
-
=-16.5V,
V
D
=±15.5V, V
S
=±15.5V
V
+
=+16.5V, V
-
=-16.5V,
V
D
=±15.5V, V
S
=±15.5V
1
2,3
1
2,3
All
r
FLAT(ON)
I
S(OFF)
I
D(OFF)
I
D(ON)
or
1
2,3
1
2
1
2,3
1
2,3
All
3.0
6.0
-0.25
-10
-0.25
-10
-0.4
-20
0.25
10
0.25
10
0.4
20
Ω
nA
nA
nA
All
All
All
I
S(ON)
V
IN
= 2.4V, all others = 0.8V
I
INH
1,2,3
All
-1.0
1.0
µA
µA
I
INL
V
IN
= 0.8V, all others = 2.4V
1,2,3
All
-1.0
1.0
±4.5
I+
All channels on or off,
V
+
=+16.5V, V
-
=-16.5V,
V
IN
=0V or 5V
All channels on or off,
V
+
=+16.5V, V
-
=-16.5V,
V
IN
=0V or 5V
All channels on or off,
V
+
=+16.5V, V
-
=-16.5V,
V
IN
=0V or 5V
All channels on or off,
V
+
=+16.5V, V
-
=-16.5V,
V
IN
=0V or 5V
1
2,3
1
2,3
1
2,3
1
2,3
All
±20
1.0
5.0
1.0
5.0
1.0
5.0
1.0
5.0
V
µA
µA
µA
µA
-1.0
-5.0
-1.0
-5.0
-1.0
-5.0
-1.0
-5.0
I-
All
I
L
All
I
GND
All
----------------------------
Electrical Characteristics of DG401/403/405A /883B
19-0079
Page 3 of
Rev. C
7
TEST
Symbol
CONDITIONS
-55
°C
<=T
A
<= +125°C
V
+
=+15V, V
-
=-15V, GND=0V
V
INH
=2.4V, V
INL
=0.8V, V
L
=5V
Unless otherwise specified
Figure 2
Figure 2
DG403 only, Figure 3
C
L
=1.0nF, V
GEN
=0V, R
GEN
=0Ω
Figure 4
Group A
Subgroup
Device
type
Limits
Min
3/
Limits
Max
3/
Units
DYNAMIC
Turn-On Time
Turn-Off Time
Break-Before-
Make Delay
4/
Charge Injection 4/
t
ON
t
OFF
t
D
Q
9
9
9
9
All
All
02
All
150
100
10
15
ns
ns
ns
pC
NOTE 3: This data sheet uses the algebraic convention, where the most negative value is a minimum and the most
positive value is a maximum.
NOTE 4: Guaranteed by design.
NOTE 5:
∆
r
ON
=∆
r
ON
(max)-∆
r
ON
(min). On-resistance match between channels and flatness are guaranteed only
with specified voltages. Flatness is defined as the difference between the maximum and minimum value
of on-resistance as measured at the extremes of the specified analog signal range.
FIGURE 1:
FIGURE 2:
FIGURE 3:
FIGURE 4:
SWITCHING TIME TEST CIRCUIT:
See Commercial Data Sheet
SWITCHING TIME TEST CIRCUIT:
See Commercial Data Sheet
BREAK-BEFORE-MAKE INTERVAL:
See Commercial Data Sheet
CHARGE INJECTION:
See Commercial Data Sheet
ORDERING INFORMATION:
DG401AK/883B
16 CDIP
DG401AZ/883B
20 LCC
DG403AK/883B
16 CDIP
DG403AZ/883B
DG405AK/883B
DG405AZ/883B
20 LCC
16 CDIP
20 LCC
TRUTH TABLES:
DG401
DG401
LOGIC
SWITCH
0
1
OFF
ON
DG403
LOGIC
0
1
DG403
SWITCHES
1, 2
OFF
ON
DG403
SWITCHES
3,4
ON
OFF
DG405
LOGIC
0
1
DG405
SWITCH
OFF
ON
----------------------------
Electrical Characteristics of DG401/403/405A /883B
19-0079
Page 4 of
Rev. C
7
TERMINAL CONNECTIONS:
DG401
J16
D1
NC
NC
NC
NC
NC
NC
D2
S2
IN2
V+
V
L
GND
V-
IN1
S1
DG401
LCC20
NC
D1
NC
NC
NC
NC
NC
NC
NC
D2
NC
S2
IN2
V+
V
L
NC
GND
V-
IN1
S1
DG403
J16
D1
NC
D3
S3
S4
D4
NC
D2
S2
IN2
V+
V
L
GND
V-
IN1
S1
DG403
LCC20
NC
D1
NC
D3
S3
NC
S4
D4
NC
D2
NC
S2
IN2
V+
V
L
NC
GND
V-
IN1
S1
DG405
J16
D1
NC
D3
S3
S4
D4
NC
D2
S2
IN2
V+
V
L
GND
V-
IN1
S1
DG405
LCC20
NC
D1
NC
D3
S3
NC
S4
D4
NC
D2
NC
S2
IN2
V+
V
L
NC
GND
V-
IN1
S1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
----------------------------
Electrical Characteristics of DG401/403/405A /883B
19-0079
Page 5 of
Rev. C
7
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 9
1, 2, 3, 9
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
**
PDA applies to Subgroup 1 only.
Subgroups 10 and 11, if not tested shall be guaranteed to the limits of Table 1.
----------------------------
Electrical Characteristics of DG401/403/405A /883B
19-0079
Page 6 of
Rev. C
7
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