SCOPE: CMOS, TTL-COMPATIBLE ANALOG MULTIPLEXER
Device Type
01
02
03
Generic Number
DG506AA(x)/883B
DG507AA(x)/883B
DG509AA(x)/883B
SMD Number
5962-8513107
5962-8513108
5962-8513109
Circuit Function
Single 16-channel MUX/DEMUX
Differential 8-channel MUX/DEMUX
Differential 4-channel MUX/DEMUX
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
Maxim SMD
Z
3
Z
2
Mil-Std-1835
CQCC1-N28
CQCC1-N20
Case Outline
Package Code
L28
L20
28-Pin Ceramic LCC
20-Pin Ceramic LCC
Absolute Maximum Ratings
Voltage Referenced to V
-
V
+
to V
-
.............................................................................................................................. 44V
V
+
to GND ........................................................................................................................ +22V
V
-
to GND ......................................................................................................................... -25V
Digital Inputs, Overvoltage Range (V
A
, V
EN
) ......................................... (V
-
) -4V to (V
+
)+4V
or 20mA whichever comes first
Analog Inputs, Overvoltage Range (V
S
) ................................................ (V
-
) -2V to (V
+
)+2V
Continuous Current, S or D ............................................................................................. 20mA
Peak Current (Pulsed at 1ms, 10% duty cycle max) S or D............................................ 40mA
Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation .........................................................................……..... T
A
=+70°C
20 lead LCC (derate 9.1mW/°C above +70°C) .....................................................…….... 727mW
28 lead LCC (derate 10.2mW/°C above +70°C) ..................................................……..... 816mW
Junction Temperature T
J
....................................................................................………. +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 20 lead LCC ....................................................................……..... 20°C/W
Case Outline 28 lead LCC ....................................................................……..... 15°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 20 lead LCC ..................................................................……..... 110°C/W
Case Outline 28 lead LCC ....................................................................……..... 98°C/W
Recommended Operating Conditions.
Ambient Operating Range (T
A
) ..........................................................……..... -55°C to
+125°C
Positive Supply Voltage (V+) .................................................................................…….... +15V
Negative Supply Current (V-) .................................................................................………. -15V
V
AL
(max) ..............................................................................................................………... 0.8V
V
AH
(min) ...............................................................................................................……….. 2.4V
V
EN
.........................................................................................................................……….. 2.4V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of
DG506A/DG507A/DG509A/883B
for SMD 5962-8513107/08/09
19-0364
Page 2
Rev. B
of 6
TABLE 1. ELECTRICAL TESTS
CONDITIONS
-55
°C
<=T
A
<= +125°C
V+=+15V, V-=-15V, GND=0V
V
EN
=2.4V
Unless otherwise specified
Measure address inputs sequentially,
connect all unused address inputs to
GND
V
S
=+10V, V
EN
=0.8V, All unused
inputs=-10V, V
D
=-10V
V
S
=-10V, V
EN
=0.8V, All unused
inputs=+10V, V
D
=+10V
V
D
=+10V, V
EN
=0.8V, All unused
inputs=-10V
V
D
=-10V, V
EN
=0.8V, All unused
inputs=+10V
V
D
=+10V, V
S
=+10V, All unused
inputs=-10V
V
D
=-10V, V
S
=-10V, All unused
inputs=+10V
V
S
=+10V, I
D
=-1mA
V
S
=-10V, I
D
=+1mA
TEST
Symbol
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
SWITCH
Input Leakage
Current NOTE 1
Leakage Current
into the source
terminal of an
“OFF” switch
Leakage Current
into the drain
terminal of an
“OFF” switch
Leakage Current
from an “ON”
driver into the
switch (drain)
Switch “ON”
Resistance
Switch ON
Resistance
SUPPLY
Positive Supply
Current
Negative Supply
Current
Standby Positive
Supply Current
Standby Negative
Supply Current
DYNAMIC
Capacitance:
Address
Capacitance:
Output Switch
Capacitance:
Input Switch
Charge Transfer
Error
Off Isolation
Break-before-
make Time Delay
I
IH
I
IL
+I
S(OFF)
-I
S(OFF)
+I
D(OFF)
-I
D(OFF)
+I
D(ON)
-I
D(ON)
+
r
DS
(ON1)
-
r
DS(ON2)
1.0
1,2,3
All
µA
1.0
-10
-50
+10
+50
nA
1,2,3
All
1
2,3
2,3
2,3
1
2,3
2,3
2,3
All
01
02
03
All
01
02
03
All
All
-10
-300
-200
-100
-10
-300
-200
-100
+10
+300
+200
+100
+10
+300
+200
+100
300
400
300
400
3.0
nA
nA
1
2,3
1
2,3
Ω
Ω
01,02
I+
I-
V
A
=0V, V
EN
=2.4V
V
A
=0V, V
EN
=2.4V
1,2,3
1,2,3
03
All
01,02
mA
2.4
-1.0
3.0
mA
2.4
-1.0
mA
mA
+I
SBY
-I
SBY
V
A
=0V, V
EN
=0V
V
A
=0V, V
EN
=0V
1,2,3
1,2,3
03
All
C
A
C
OS
V+=V-=0V, f=1MHz, NOTE 2
V+=V-=0V, f=1MHz, NOTE 2
4
4
01,02
03
01
02
03
All
All
All
All
C
IS
V
CTE
V
ISO
V+=V-=0V, f=1MHz, NOTE 2
V
S
=GND. V
GEN
=0V to 5V, NOTE 2
V
EN
=0.8V, R
L
=1kΩ, f=100kHz,
C
L
=15pF, V
S
=7Vrms
R
L
=1000Ω, C
L
=50pF, Figure 3
4
7
7
12
10
90
50
25
12
10
-50
25
pF
pF
pF
mV
dB
ns
t
D
9
----------------------------
Electrical Characteristics of
DG506A/DG507A/DG509A/883B
for SMD 5962-8513107/08/09
19-0364
Page 3
Rev. B
of 6
TABLE 1. ELECTRICAL TESTS
CONDITIONS
-55
°C
<=T
A
<= +125°C
V+=+15V, V-=-15V, GND=0V
V
AH
=2.4V, V
AL
=0.8V
Unless otherwise specified
R
L
=10kΩ, C
L
=50pF
t
OFF(A)
t
ON(EN)
R
L
=1000Ω, C
L
=50pF
t
OFF(EN)
NOTE 1: Input current of one input mode.
NOTE 2: Guaranteed, if not tested, to the limits specified.
TEST
Symbol
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Propagation
Delay Times:
Address Inputs to
I/O Channels
Enable to I/O
t
ON(A)
9
All
10,11
9
All
10,11
500
ns
1000
500
ns
1000
FIGURE 3: Break-Before-Make Interval: See Commercial Datasheet.
TRUTH TABLE
A3
X
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
A2
X
L
L
L
L
H
H
H
H
L
L
L
L
H
H
H
H
A1
X
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
A0
X
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
EN
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
DG506A
Selected Channel
None
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
DG507A
Selected Channel
None
1A, 1B
2A, 2B
3A, 3B
4A, 4B
5A, 5B
6A, 5B
7A, 7B
8A, 8B
A2
X
L
L
L
L
H
H
H
H
A1
X
L
L
H
H
L
L
H
H
A0
X
L
H
L
H
L
H
L
H
EN
L
H
H
H
H
H
H
H
H
TERMINAL CONNECTION
TERMINAL
01
NUMBER
DG506A
L28
1
V+
2
NC
3
NC
4
S16
5
S15
6
S14
7
S13
8
S12
9
S11
10
S10
11
S9
12
GND
13
NC
14
A3
15
A2
16
A1
17
A0
18
EN
19
S1
20
S2
21
S3
22
S4
23
S5
24
S6
25
S7
26
S8
27
V-
28
D
02
DG507A
L28
V+
DB
NC
S8B
S7B
S6B
S5B
S4B
S3B
S2B
S1B
GND
NC
NC
A2
A1
A0
EN
S1A
S2A
S3A
S4A
S5A
S6A
S7A
S8A
V-
DA
03
DG509A
L20
NC
A0
EN
V-
IN 1A
NC
IN 2A
IN 3A
IN 4A
OUT A
NC
OUT B
IN 4B
IN 3B
IN 2B
NC
IN 1B
V+
GND
A1
----------------------------
Electrical Characteristics of
DG506A/DG507A/DG509A/883B
for SMD 5962-8513107/08/09
19-0364
Page 4
Rev. B
of 6
TRUTH TABLE:
A1
A0
X
X
L
L
L
H
H
L
H
H
EN
L
H
H
H
H
DG509A
CHANNEL SELECTED
NONE
1A, 1B
2A, 2B
3A, 3B
4A, 4B
SMD NUMBER
5962-85131073C
5962-85131083C
5962-85131092C
PACKAGE CODE
28 LCC
28LCC
20 LCC
ORDERING INFORMATION:
DG506AAZ/883B
DG507AAZ/883B
DG509AAZ/883B
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
1*, 2, 3, 9
Method 5005
Group A Test Requirements
1, 2, 3, 4**,7, 9, 10***, 11***
Method 5005
Group C and D End-Point Electrical Parameters
1
Method 5005
* PDA applies to Subgroup 1 only.
** Subgroup 4 capacitance measurements shall be measured only for the initial test and after
process or design changes which may affect capacitance.
*** Subgroups 10 and 11, if not tested shall be guaranteed to the limits of Table 1.
----------------------------
Electrical Characteristics of
DG506A/DG507A/DG509A/883B
for SMD 5962-8513107/08/09
19-0364
Page 5
Rev. B
of 6
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