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NLV14516BDR2G

产品描述Encoders, Decoders, Multiplexers & Demultiplexers BINARY UP/DOWN COUNTER
产品类别逻辑    逻辑   
文件大小93KB,共10页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
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NLV14516BDR2G概述

Encoders, Decoders, Multiplexers & Demultiplexers BINARY UP/DOWN COUNTER

NLV14516BDR2G规格参数

参数名称属性值
Brand NameON Semiconductor
是否无铅不含铅
厂商名称ON Semiconductor(安森美)
零件包装代码SOIC
包装说明SOP, SOP16,.25
针数16
制造商包装代码751B-05
Reach Compliance Codecompliant
Factory Lead Time51 weeks
计数方向BIDIRECTIONAL
系列4000/14000/40000
JESD-30 代码R-PDSO-G16
JESD-609代码e3
长度9.9 mm
负载电容(CL)50 pF
负载/预设输入YES
逻辑集成电路类型BINARY COUNTER
最大频率@ Nom-Sup1500000 Hz
工作模式SYNCHRONOUS
湿度敏感等级1
位数4
功能数量1
端子数量16
最高工作温度125 °C
最低工作温度-55 °C
封装主体材料PLASTIC/EPOXY
封装代码SOP
封装等效代码SOP16,.25
封装形状RECTANGULAR
封装形式SMALL OUTLINE
包装方法TAPE AND REEL
峰值回流温度(摄氏度)NOT SPECIFIED
电源5/15 V
传播延迟(tpd)630 ns
认证状态Not Qualified
筛选级别AEC-Q100
座面最大高度1.75 mm
最大供电电压 (Vsup)18 V
最小供电电压 (Vsup)3 V
标称供电电压 (Vsup)5 V
表面贴装YES
技术CMOS
温度等级MILITARY
端子面层Tin (Sn)
端子形式GULL WING
端子节距1.27 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
触发器类型POSITIVE EDGE
宽度3.9 mm

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MC14516B
Binary Up/Down Counter
The MC14516B synchronous up/down binary counter is
constructed with MOS P−channel and N−channel enhancement mode
devices in a monolithic structure.
This counter can be preset by applying the desired value, in binary,
to the Preset inputs (P0, P1, P2, P3) and then bringing the Preset
Enable (PE) high. The direction of counting is controlled by applying
a high (for up counting) or a low (for down counting) to the
UP/DOWN input. The state of the counter changes on the positive
transition of the clock input.
Cascading can be accomplished by connecting the Carry Out to the
Carry In of the next stage while clocking each counter in parallel. The
outputs (Q0, Q1, Q2, Q3) can be reset to a low state by applying a high
to the reset (R) pin.
This CMOS counter finds primary use in up/down and difference
counting. Other applications include: (1) Frequency synthesizer
applications where low power dissipation and/or high noise immunity
is desired, (2) Analog−to−Digital and Digital−to−Analog conversions,
and (3) Magnitude and sign generation.
Features
http://onsemi.com
MARKING
DIAGRAM
SOIC−16
D SUFFIX
CASE 751B
1
A
WL
Y
WW
G
16
14516BG
AWLYWW
1
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
Diode Protection on All Inputs
Supply Voltage Range = 3.0 Vdc to 18 Vdc
Internally Synchronous for High Speed
Logic Edge−Clocked Design — Count Occurs on Positive Going
Edge of Clock
Single Pin Reset
Asynchronous Preset Enable Operation
Capable of Driving Two Low−Power TTL Loads or One
Low−Power Schottky Load Over the Rated Temperature Range
These Devices are Pb−Free and are RoHS Compliant
NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
This device contains protection circuitry to guard
against damage due to high static voltages or electric
fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated
voltages to this high−impedance circuit. For proper
operation, V
in
and V
out
should be constrained to the
range V
SS
v
(V
in
or V
out
)
v
V
DD
.
Unused inputs must always be tied to an appropriate
logic voltage level (e.g., either V
SS
or V
DD
). Unused
outputs must be left open.
MAXIMUM RATINGS
(Voltages Referenced to V
SS
)
Parameter
DC Supply Voltage Range
Input or Output Voltage Range
(DC or Transient)
Input or Output Current (DC or Transient)
per Pin
Power Dissipation, per Package (Note 1)
Ambient Temperature Range
Storage Temperature Range
Lead Temperature (8−Second Soldering)
Symbol
V
DD
V
in
, V
out
I
in
, I
out
P
D
T
A
T
stg
T
L
Value
−0.5 to +18.0
−0.5 to V
DD
+ 0.5
±
10
500
−55 to +125
−65 to +150
260
Unit
V
V
mA
mW
°C
°C
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Temperature Derating: Plastic “DW” Packages:
– 7.0 mW/_C From 65_C To 125_C
©
Semiconductor Components Industries, LLC, 2014
1
March, 2014 − Rev. 10
Publication Order Number:
MC14516B/D

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