IDT74FCT823AT/CT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTER
INDUSTRIAL TEMPERATURE RANGE
HIGH-PERFORMANCE
CMOS BUS
INTERFACE REGISTER
FEATURES:
•
•
•
•
A and C grades
Low input and output leakage
≤
1µA (max.)
CMOS power levels
True TTL input and output compatibility:
– V
OH
= 3.3V (typ.)
– V
OL
= 0.3V (typ.)
High Drive outputs (-15mA I
OH
, 48mA I
OL
)
Meets or exceeds JEDEC standard 18 specifications
Power off disable outputs permit "live insertion"
Available in the SOIC and QSOP packages
IDT74FCT823AT/CT
DESCRIPTION:
The FCT823T series is built using an advanced dual metal CMOS
technology. The FCT823T series bus interface registers are designed to
eliminate the extra packages required to buffer existing registers and
provide extra data width for wider address/data paths or buses carrying
parity. The FCT823T is a 9-bit wide buffered register with Clock Enable
(EN) and Clear (CLR) – ideal for parity bus interfacing in high-performance
microprogrammed systems.
The FCT823T high-performance interface family can drive large capacitive
loads, while providing low-capacitance bus loading at both inputs and
outputs. All inputs have clamp diodes and all outputs are designed for low-
capacitance bus loading in high-impedance state.
•
•
•
•
FUNCTIONAL BLOCK DIAGRAM
D
0
EN
D
N
CLR
D
CL
Q
D
CL
Q
CP
Q
CP
Q
CP
OE
Y
0
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
Y
N
INDUSTRIAL TEMPERATURE RANGE
1
February 19, 2009
DSC-5487/4
© 2006 Integrated Device Technology, Inc.
IDT74FCT823AT/CT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
OE
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
CLR
GND
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
Y
0
Y
1
Y
2
Y
3
Y
4
Y
5
Y
6
Y
7
Y
8
EN
CP
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM
(2)
V
TERM
(3)
T
STG
I
OUT
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
6
8
Max.
10
12
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
SOIC/ QSOP
TOP VIEW
PIN DESCRIPTION
Pin Names
Dx
CLR
I/O
I
I
Description
D Flip-Flop Data Inputs
When the clear input is LOW and
OE
is LOW, the
Qx outputs are LOW. When the clear input is HIGH,
data can be entered into the register.
Clock Pulse for the Register; enters data into the
register on the LOW-to-HIGH transition.
Register 3-State Outputs
Clock Enable. When the clock enable is LOW, data
on the Dx output is transferred to the Qx output on the
LOW-to-HIGH transition. When the clock enable is
HIGH, the Qx outputs do not change state, regardless
of the data or clock input transitions.
Output Control. When the
OE
is HIGH, the Yx
outputs are in the high-impedance state. When the
OE
is LOW, the TRUE register data is present at the
Yx outputs.
FUNCTION TABLE
(1)
OE
H
H
H
L
H
L
H
H
L
L
Inputs
CLR
EN
H
L
H
L
L
X
L
X
H
H
H
H
H
L
H
L
H
L
H
L
Dx
L
H
X
X
X
X
L
H
L
H
CP
↑
↑
X
X
X
X
↑
↑
↑
↑
Internal/
Outputs
Qx
Yx
L
Z
H
Z
L
Z
L
L
NC
Z
NC
NC
L
Z
H
Z
L
L
H
H
Function
High Z
Clear
Hold
Load
CP
Yx
EN
I
O
I
OE
I
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
NC = No Change
↑
= LOW-to-HIGH Transition
Z = High Impedance
2
IDT74FCT823AT/CT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±5%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
I
V
IK
V
H
I
CC
Input HIGH Current
(4)
Clamp Diode Voltage
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Max., V
I
= V
CC
(Max.)
V
CC
= Min., I
IN
= –18mA
—
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current
(4)
Input LOW Current
(4)
High Impedance Output Current
(4)
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
CC
= Max.
V
CC
= Max., V
I
= V
CC
(Max.)
V
I
= 2.7V
V
I
= 0.5V
V
I
= 2.7V
V
I
= 0.5V
Min.
2
—
—
—
—
—
—
—
—
—
Typ.
(2)
—
—
—
—
—
—
—
–0.7
200
0.01
Max.
—
0.8
±1
±1
±1
±1
±1
–1.2
—
1
µA
V
mV
mA
Unit
V
V
µA
µA
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
V
OH
V
OL
I
OS
I
OFF
Parameter
Output HIGH Voltage
Output LOW Voltage
Short Circuit Current
Input/Output Power Off Leakage
(5)
V
CC
= Min
V
IN
= V
IH
or V
IL
V
CC
= Min
V
IN
= V
IH
or V
IL
V
CC
= Max., V
O
= GND
(3)
Test Conditions
(1)
I
OH
= –8mA
I
OH
= –15mA
I
OL
= 48mA
Min.
2.4
2
—
–60
—
Typ.
(2)
3.3
3
0.3
–120
—
Max.
—
—
0.5
–225
±1
Unit
V
V
mA
µA
V
CC
= 0V, V
IN
or V
O
≤
4.5V
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A
= –55°C.
5. This parameter is guaranteed but not tested.
3
IDT74FCT823AT/CT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
ΔI
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply
Current
(4)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
OE
=
EN
= GND
One Input Toggling
50% Duty Cycle
V
CC
= Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
OE
=
EN
= GND
One Bit Toggling
at fi = 5MHz
V
CC
= Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
OE
=
EN
= GND
Eight Bits Toggling
at fi = 2.5MHz
V
IN
= 3.4V
V
IN
= GND
—
6
16.3
(5)
V
IN
= V
CC
V
IN
= GND
Test Conditions
(1)
Min.
—
—
Typ.
(2)
0.5
0.15
Max.
2
0.25
Unit
mA
mA/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
1.5
3.5
mA
V
IN
= 3.4V
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
—
2
5.5
—
3.8
7.3
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input; (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of
ΔI
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
ΔI
CC
D
H
N
T
+ I
CCD
(f
CP
/2+ f
i
N
i
)
I
CC
= Quiescent Current
ΔI
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Output Frequency
N
i
= Number of Outputs at f
i
All currents are in milliamps and all frequencies are in megahertz.
4
IDT74FCT823AT/CT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT823AT
Symbol
t
PLH
t
PHL
Parameter
Propagation Delay
CP to Yx (OE = LOW)
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(4)
R
L
= 500Ω
t
SU
t
H
t
SU
t
H
t
PHL
t
REM
t
W
t
W
t
PZH
t
PZL
Set-up Time HIGH or LOW Dx to CP
Hold Time HIGH or LOW Dx to CP
Set-up Time HIGH or LOW
EN
to CP
Hold Time HIGH or LOW
EN
to CP
Propagation Delay,
CLR
to Yx
Recovery Time
CLR
to CP
Clock Pulse Width HIGH or LOW
CLR
Pulse Width LOW
Output Enable Time
OE
to Yx
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(4)
R
L
= 500Ω
t
PHZ
t
PLZ
Output Disable Time
OE
to Yx
C
L
= 5pF
(4)
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. This parameter is guaranteed but not tested.
4. This condition is guaranteed but not tested.
FCT823CT
Max.
10
20
—
—
—
—
14
—
—
—
12
23
7
8
Min
.
(2)
1.5
1.5
3
1.5
3
0
1.5
6
6
6
1.5
1.5
1.5
1.5
Max.
6
12.5
—
—
—
—
8
—
—
—
7
12.5
6
6.5
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Min
.
(2)
1.5
1.5
4
2
4
2
1.5
6
7
6
1.5
1.5
1.5
1.5
C
L
= 50pF
R
L
= 500Ω
5
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