Although Belden makes every reasonable effort to ensure their accuracy at the time of this publication, information and specifications described here in are subject to error or omission and to change without
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Belden believes this product to be in compliance with all applicable environmental programs as listed in the data sheet. The information provided is correct to the best of Belden's knowledge, information and belief
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复杂 IC 不仅吸引了更多系统，而且还吞食着设计者用于建立、评估与校准芯片的测试设备。 芯片设计者正开始在自己的复杂 IC上设计测试与测量仪器。在IC中设计测试仪器的潮流开始于CPU核心与总线的数字调试硬件。现在，设计者也在高速I/O块中建立分析仪器。设计者正在高频芯片的内部作业中集成更复杂的模拟与RF测试仪器，如读取通道IC。 这只是尺度问题。随着系统级 IC 越来越大而复杂...[详细]
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