MC74HC32A
Quad 2-Input OR Gate
High−Performance Silicon−Gate CMOS
The MC74HC32A is identical in pinout to the LS32. The device
inputs are compatible with Standard CMOS outputs; with pullup
resistors, they are compatible with LSTTL outputs.
Features
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•
•
•
•
•
•
•
•
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1
mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance With the JEDEC Standard No. 7 A Requirements
Chip Complexity: 48 FETs or 12 Equivalent Gates
NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
•
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
LOGIC DIAGRAM
A1
B1
A2
B2
A3
B3
A4
B4
1
3
2
4
6
5
9
8
10
12
11
13
PIN 14 = V
CC
PIN 7 = GND
Y4
Y3
Y2
Y = A+B
1
Y1
14
SOIC−14 NB
D SUFFIX
CASE 751A
TSSOP−14
DT SUFFIX
CASE 948G
PIN ASSIGNMENT
V
CC
14
B4
13
A4
12
Y4
11
B3
10
A3
9
Y3
8
1
A1
2
B1
3
Y1
4
A2
5
B2
6
7
Y2 GND
14−Lead
(Top View)
MARKING DIAGRAMS
14
HC32AG
AWLYWW
1
SOIC−14 NB
A
L, WL
Y, YY
W, WW
G or
G
TSSOP−14
HC
32A
ALYWG
G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
FUNCTION TABLE
Inputs
A
L
L
H
H
B
L
H
L
H
Output
Y
L
H
H
H
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
©
Semiconductor Components Industries, LLC, 2014
1
August, 2014 − Rev. 12
Publication Order Number:
MC74HC32A/D
MC74HC32A
MAXIMUM RATINGS
Symbol
V
CC
V
in
V
out
I
in
I
out
I
CC
P
D
T
stg
T
L
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage (Referenced to GND)
DC Output Voltage (Referenced to GND)
DC Input Current, per Pin
DC Output Current, per Pin
DC Supply Current, V
CC
and GND Pins
Power Dissipation in Still Air,
Storage Temperature
Lead Temperature, 1 mm from Case for 10 Seconds
Plastic DIP, SOIC or TSSOP Package
SOIC Package†
TSSOP Package†
Value
–0.5 to +7.0
–0.5 to V
CC
+ 0.5
–0.5 to V
CC
+ 0.5
±20
±25
±50
500
450
–65 to +150
260
Unit
V
V
V
mA
mA
mA
mW
_C
_C
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance cir-
cuit. For proper operation, V
in
and
V
out
should be constrained to the
range GND
v
(V
in
or V
out
)
v
V
CC
.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V
CC
).
Unused outputs must be left open.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of
these limits are exceeded, device functionality should not be assumed, damage may occur and
reliability may be affected.
†Derating: SOIC Package: –7 mW/_C from 65_ to 125_C
TSSOP Package: −6.1 mW/_C from 65_ to 125_C
RECOMMENDED OPERATING CONDITIONS
Symbol
V
CC
V
in
, V
out
T
A
t
r
, t
f
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
Operating Temperature, All Package Types
Input Rise and Fall Time
(Figure 1)
V
CC
= 2.0 V
V
CC
= 4.5 V
V
CC
= 6.0 V
Min
2.0
0
–55
0
0
0
Max
6.0
V
CC
+125
1000
500
400
Unit
V
V
_C
ns
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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MC74HC32A
DC CHARACTERISTICS
(Voltages Referenced to GND)
V
CC
V
2.0
3.0
4.5
6.0
2.0
3.0
4.5
6.0
2.0
4.5
6.0
|I
out
|
≤
2.4mA
|I
out
|
≤
4.0mA
|I
out
|
≤
5.2mA
3.0
4.5
6.0
2.0
4.5
6.0
|I
out
|
≤
2.4mA
|I
out
|
≤
4.0mA
|I
out
|
≤
5.2mA
3.0
4.5
6.0
6.0
6.0
Guaranteed Limit
−55 to 25°C
1.50
2.10
3.15
4.20
0.50
0.90
1.35
1.80
1.9
4.4
5.9
2.48
3.98
5.48
0.1
0.1
0.1
0.26
0.26
0.26
±0.1
1.0
≤85°C
1.50
2.10
3.15
4.20
0.50
0.90
1.35
1.80
1.9
4.4
5.9
2.34
3.84
5.34
0.1
0.1
0.1
0.33
0.33
0.33
±1.0
10
≤125°C
1.50
2.10
3.15
4.20
0.50
0.90
1.35
1.80
1.9
4.4
5.9
2.20
3.70
5.20
0.1
0.1
0.1
0.40
0.40
0.40
±1.0
40
mA
mA
V
Unit
V
Symbol
V
IH
Parameter
Minimum High−Level Input Voltage
Condition
V
out
= 0.1V or V
CC
−0.1V
|I
out
|
≤
20mA
V
IL
Maximum Low−Level Input Voltage
V
out
= 0.1V or V
CC
− 0.1V
|I
out
|
≤
20mA
V
V
OH
Minimum High−Level Output
Voltage
V
in
= V
IH
or V
IL
|I
out
|
≤
20mA
V
in
=V
IH
or V
IL
V
V
OL
Maximum Low−Level Output
Voltage
V
in
= V
IH
or V
IL
|I
out
|
≤
20mA
V
in
= V
IH
or V
IL
I
in
I
CC
Maximum Input Leakage Current
Maximum Quiescent Supply
Current (per Package)
V
in
= V
CC
or GND
V
in
= V
CC
or GND
I
out
= 0mA
AC CHARACTERISTICS
(C
L
= 50pF, Input t
r
= t
f
= 6ns)
Symbol
t
PLH
,
t
PHL
Parameter
Maximum Propagation Delay, Input A or B to Output Y
(Figures 1 and 2)
V
CC
V
2.0
3.0
4.5
6.0
2.0
3.0
4.5
6.0
Guaranteed Limit
−55 to 25°C
75
30
15
13
75
27
15
13
10
≤85°C
95
40
19
16
95
32
19
16
10
≤125°C
110
55
22
19
110
36
22
19
10
Unit
ns
t
TLH
,
t
THL
Maximum Output Transition Time, Any Output
(Figures 1 and 2)
ns
C
in
Maximum Input Capacitance
pF
Typical @ 25°C, V
CC
= 5.0 V, V
EE
= 0 V
C
PD
Power Dissipation Capacitance (Per Buffer)*
20
pF
* Used to determine the no−load dynamic power consumption: P
D
= C
PD
V
CC2
f + I
CC
V
CC
.
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3
MC74HC32A
t
r
90%
INPUT
A OR B
t
PLH
90%
OUTPUT Y
50%
10%
t
TLH
50%
10%
t
f
V
CC
GND
t
PHL
t
THL
Figure 1. Switching Waveforms
TEST
POINT
OUTPUT
DEVICE
UNDER
TEST
C
L
*
*Includes all probe and jig capacitance
Figure 2. Test Circuit
A
Y
B
Figure 3. Expanded Logic Diagram
(1/4 of the Device)
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MC74HC32A
ORDERING INFORMATION
Device
MC74HC32ADG
MC74HC32ADR2G
MC74HC32ADTR2G
NLV74HC32ADG*
NLV74HC32ADR2G*
NLV74HC32ADTR2G*
Package
SOIC−14 NB
(Pb−Free)
SOIC−14 NB
(Pb−Free)
TSSOP−14
(Pb−Free)
SOIC−14 NB
(Pb−Free)
SOIC−14 NB
(Pb−Free)
TSSOP−14
(Pb−Free)
Shipping
†
55 Units / Rail
2500 / Tape & Reel
2500 / Tape & Reel
55 Units / Rail
2500 / Tape & Reel
2500 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable
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