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HN1B26FS

产品描述General-Purpose Amplifier Applications
产品类别分立半导体    晶体管   
文件大小159KB,共6页
制造商Toshiba(东芝)
官网地址http://toshiba-semicon-storage.com/
标准
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HN1B26FS概述

General-Purpose Amplifier Applications

HN1B26FS规格参数

参数名称属性值
是否无铅不含铅
是否Rohs认证符合
厂商名称Toshiba(东芝)
包装说明SMALL OUTLINE, R-PDSO-F6
针数6
Reach Compliance Codeunknow
ECCN代码EAR99
最大集电极电流 (IC)0.1 A
集电极-发射极最大电压50 V
配置SEPARATE, 2 ELEMENTS
最小直流电流增益 (hFE)120
JESD-30 代码R-PDSO-F6
元件数量2
端子数量6
最高工作温度150 °C
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
峰值回流温度(摄氏度)NOT SPECIFIED
极性/信道类型NPN
认证状态Not Qualified
表面贴装YES
端子形式FLAT
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
晶体管应用AMPLIFIER
晶体管元件材料SILICON
标称过渡频率 (fT)60 MHz

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HN1B26FS
TOSHIBA Transistor
Silicon NPN Epitaxial Type (PCT Process)
HN1B26FS
General-Purpose Amplifier Applications
1.0±0.05
Unit: mm
0.1±0.05
0.35 0.35
0.8±0.05
0.1±0.05
0.15±0.05
Q1
High voltage and high current
: V
CEO
= 50 V, I
C
= 100 mA (max)
Excellent h
FE
linearity : h
FE
(I
C
= 0.1 mA)/h
FE
(I
C
= 2 mA) = 0.95 (typ.)
High h
FE
:
h
FE
= 120~400
1.0±0.05
0.7±0.05
1
2
3
6
5
4
0.1±0.05
: V
CEO
=
−50
V, I
C
=
−100
mA (max)
Excellent h
FE
linearity :
h
FE
(I
C
=
−0.1
mA)/h
FE
(I
C
=
−2
mA) =
−0.95
(typ.)
High h
FE
:
h
FE
= 120~400
0.48
-0.04
+0.02
Q2
High voltage and high current
Q1 Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
Rating
60
50
5
100
30
Unit
V
V
V
mA
mA
fS6
1.EMITTER1
2.BASE1
3.COLLECTOR2
4.EMITTER2
5.BASE2
6.COLLECTOR1
2-1F1D
(E1)
(B1)
(C2)
(E2)
(B2)
(C1)
JEDEC
JEITA
TOSHIBA
Weight: 0.0008 g (typ.)
Q2 Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
Rating
−50
−50
−5
−100
−30
Unit
V
V
V
mA
mA
Q1, Q2 Common Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
P
C
T
j
T
stg
Rating
50*
150
−55~150
Unit
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*: Total rating
1
2007-11-01

 
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