DC Output Current (Maximum Sink Current/Pin) ...... 120 mA
Outputs
I
0
X
X
X
L
H
I
1
X
L
H
X
X
Y
L
L
H
L
H
Range
Commercial
Military
[4]
Range
All
All
Power Dissipation.......................................................... 0.5W
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Function Table
[1]
Inputs
E
H
L
L
L
L
S
X
H
H
L
L
Operating Range
Ambient
Temperature
−40°C
to +85°C
−55°C
to +125°C
V
CC
5V
±
5%
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
Description
Output HIGH Voltage
Test Conditions
V
CC
=Min., I
OH
=−32 mA
V
CC
=Min., I
OH
=−15 mA
V
CC
=Min., I
OH
=−12 mA
V
OL
V
IH
V
IL
V
H
V
IK
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
OFF
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Hysteresis
[6]
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
Off State HIGH-Level Output
Current
Off State LOW-Level
Output Current
Output Short Circuit Current
[7]
Power-Off Disable
All inputs
V
CC
=Min., I
IN
=−18 mA
V
CC
=Max., V
IN
=V
CC
V
CC
=Max., V
IN
=2.7V
V
CC
=Max., V
IN
=0.5V
V
CC
= Max., V
OUT
= 2.7V
V
CC
= Max., V
OUT
= 0.5V
V
CC
=Max., V
OUT
=0.0V
V
CC
=0V, V
OUT
=4.5V
−60
−120
0.2
−0.7
−1.2
5
±1
±1
10
−10
−225
±1
V
CC
=Min., I
OL
=64 mA
V
CC
=Min., I
OL
=32 mA
Com’l
Com’l
Mil
Com’l
Mil
2.0
0.8
Min.
2.0
2.4
2.4
3.3
3.3
0.3
0.3
0.55
0.55
Typ.
[5]
Max.
Unit
V
V
V
V
V
V
V
V
V
µA
µA
µA
µA
µA
mA
µA
Note:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. T
A
is the “instant on” case temperature.
5. Typical values are at V
CC
=5.0V, T
A
=+25°C ambient.
6. This parameter is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
2
CY54/74FCT157T
Capacitance
[6]
Parameter
C
IN
C
OUT
Input Capacitance
Output Capacitance
Description
Typ.
[5]
5
9
Max.
10
12
Unit
pF
pF
Power Supply Characteristics
Parameter
I
CC
∆I
CC
I
CCD
Description
Quiescent Power Supply Current
Quiescent Power Supply Current
(TTL inputs HIGH)
Dynamic Power Supply Current
[9]
Test Conditions
V
CC
=Max., V
IN
≤0.2V,
V
IN
≥V
CC
−0.2V
V
CC
=Max., V
IN
=3.4V,
[8]
f
1
=0, Outputs Open
V
CC
=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
V
CC
=Max., 50% Duty Cycle,
Outputs Open,
One Input Toggling at f
1
=10 MHz,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
V
CC
=Max., 50% Duty Cycle,
Outputs Open,
One Input Toggling at f
1
=10 MHz,
OE=GND, V
IN
=3.4V or V
IN
=GND
V
CC
=Max., 50% Duty Cycle,
Outputs Open,
Four Bits Toggling at f
1
=2.5 MHz,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
V
CC
=Max., 50% Duty Cycle,
Outputs Open,
Four Bits Toggling at f
1
=2.5 MHz,
OE=GND, V
IN
=3.4V or V
IN
=GND
Notes:
8. Per TTL driven input (V
IN
=3.4V); all other inputs at V
CC
or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+∆I
CC
D
H
N
T
+I
CCD
(f
0
/2 + f
1
N
1
)
I
CC
= Quiescent Current with CMOS input levels
∆I
CC
= Power Supply Current for a TTL HIGH input (V
IN
=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
= Number of TTL inputs at D
H
N
T
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
= Clock frequency for registered devices, otherwise zero
f
0
= Input signal frequency
f
1
N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
Typ.
[5]
0.1
0.5
0.06
Max.
0.2
2.0
0.12
Unit
mA
mA
mA/MHz
I
C
Total Power Supply Current
[10]
0.7
1.4
mA
1.0
2.4
mA
0.7
1.4
[11]
mA
1.7
5.4
[11]
mA
3
CY54/74FCT157T
Switching Characteristics
Over the Operating Range
FCT157T
Commercial
Parameter
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
Description
Propagation Delay
I to Y
Propagation Delay
E to Y
Propagation Delay
S to Y
Min.
[12]
1.5
1.5
1.5
Max.
6.0
10.5
10.5
Min.
[12]
1.5
1.5
1.5
FCT157AT
Military
Max.
5.8
7.4
8.1
Commercial
Min.
[12]
1.5
1.5
1.5
Max.
5.0
6.0
7.0
FCT157CT
Commercial
Min.
[12]
1.5
1.5
1.5
Max.
4.3
4.8
5.2
Unit
ns
ns
ns
Fig.
No.
[13}
1, 3
1, 5
1, 3
Ordering Information
Speed
(ns)
4.3
5.0
5.8
Ordering Code
CY74FCT157CTQC
CY74FCT157CTSOC
CY74FCT157ATQC
CY74FCT157ATSOC
CY54FCT157ATLMB
Package
Name
Q1
S1
Q1
S1
L61
Package Type
16-Lead (150-Mil) QSOP
16-Lead (300-Mil) Molded SOIC
16-Lead (150-Mil) QSOP
16-Lead (300-Mil) Molded SOIC
20-Pin Square Leadless Chip Carrier
Military
Commercial
Operating
Range
Commercial
Note:
12. Minimum limits are guaranteed but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information Section
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
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