REVISIONS
LTR
A
DESCRIPTION
Added note to paragraph 1.2.2 and table I regarding the 4 transistor
design. Paragraph 1.3; changed the power dissipation for device types
05-09 from 2.9 W max to 3.3 W max. Table I; changed the I
CC
max limit
for device types 05-09 from 520 mA to 600 mA. Table I; changed the
I
CCDR1
max limit from 12 mA to 28 mA. Figure 1; changed dimension A
minimum from 0.175 inches to 0.115 inches. Redrew entire document . -
sld
Drawing updated to reflect current requirements. -sld
Table I; Changed the maximum limit for COE and CAD tests from 32
pF to 30 pF. -sld
Update drawing to latest requirements of MIL-PRF-38534. -gc
DATE (YR-MO-DA)
00-09-27
APPROVED
Michael Jones
B
C
D
04-03-29
06-02-06
17-10-17
Raymond Monnin
Raymond Monnin
Charles F. Saffle
REV
SHEET
REV
SHEET
D
15
D
16
D
17
D
18
REV
SHEET
PREPARED BY
Gary Zahn
CHECKED BY
Michael C. Jones
APPROVED BY
Kendall A. Cottongim
D
19
D
20
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
D
13
D
14
REV STATUS
OF SHEETS
PMIC N/A
STANDARD MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF
DEFENSE
AMSC N/A
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil/
MICROCIRCUIT, HYBRID, MEMORY,
DIGITAL, 512K x 32-BIT, STATIC RANDOM
ACCESS MEMORY, CMOS
DRAWING APPROVAL DATE
96-08-09
REVISION LEVEL
D
SIZE
A
SHEET
CAGE CODE
67268
1 OF
20
5962-E037-18
5962-95624
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
Federal
stock class
designator
\
-
95624
RHA
designator
(see 1.2.1)
/
\/
Drawing number
01
Device
type
(see 1.2.2)
H
Device
class
designator
(see 1.2.3)
N
Case
outline
(see 1.2.4)
C
Lead
finish
(see 1.2.5)
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices meet the MIL-PRF-38534 specified RHA levels
and are be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type 1/
01
02
03
04
05
06
07
08
09
10
11
12
Generic number
WS512K32F-120G4Q
WS512K32F-100G4Q
WS512K32F-85G4Q
WS512K32F-70G4Q
WS512K32F-55G4Q
WS512K32F-45G4Q
WS512K32F-35G4Q
WS512K32F-25G4Q
WS512K32F-20G4Q
WS512K32M-45G4Q
WS512K32M-35G4Q
WS512K32M-25G4Q
Circuit function
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
SRAM, 512K x 32-bit
Access time
120 ns
100 ns
85 ns
70 ns
55 ns
45 ns
35 ns
25 ns
20 ns
45 ns
35 ns
25 ns
1.2.3 Device class designator. This device class designator is a single letter identifying the product assurance level. All
levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and
E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
H
___________
1/ Due to the nature of the 4 transistor design of the die in these device types, topologically pure testing is important,
particularly for high reliability applications. The device manufacturer should be consulted concerning their testing
methods and algorithms.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-95624
SHEET
2
DSCC FORM 2234
APR 97
G
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
E
D
1.2.4 Case outline(s). The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
N
Descriptive designator
See figure 1
Terminals
68
Package style
Co-fired, single cavity, quad flat pack,
low capacitance
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Supply voltage range (V
CC
) .......................................................
Signal voltage range (V
G
) ..........................................................
Power dissipation (P
D
) :
Device types 01 through 09 ....................................................
Device types 10 through 12 ....................................................
Storage temperature range ........................................................
Lead temperature (soldering, 10 seconds) ................................
1.4 Recommended operating conditions.
Supply voltage range (V
CC
) .......................................................
Input low voltage range (V
IL
) ......................................................
Input high voltage range (V
IH
) ....................................................
Case operating temperature range (T
C
).....................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
+4.5 V dc to +5.5 V dc
-0.5 V dc to +0.8 V dc
+2.2 V dc to V
CC
+ 0.3 V dc
-55°C to +125°C
-0.5 V dc to +7.0 V dc
-0.5 V dc to +7.0 V dc
3.3 W Maximum at 5 MHz
4.4 W Maximum at 5 MHz
-65°C to +150°C
+300°C
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
1/
__
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-95624
SHEET
3
DSCC FORM 2234
APR 97
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://quicksearch.dla.mil
or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.
3.2.4 Logic diagram(s). The logic diagram(s) shall be as specified on figures 4 and 5.
3.2.5 Block diagram. The block diagram shall be as specified on figure 6.
3.2.6 Output load circuit. The output load circuit shall be as specified on figure 7.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime-VA) upon request.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-95624
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/ 3/
-55°C
≤
T
C
≤
+125°C
unless otherwise specified
Group A
subgroups
Device
types
Min
Limits
Max
Unit
DC parameters
Input leakage current
I
LI
V
CC
= 5.5 V dc, V
IN
= GND
or V
CC
CS = V
IH
, OE = V
IH
, V
OUT
=
GND or V
CC
CS = V
IL
, OE = V
IH
,
f = 5 MHz, V
CC
= 5.5 V dc
1,2,3
All
10
µA
Output leakage current
I
LO
1,2,3
All
10
µA
Operating supply current
I
CC
1,2,3
01-04
05-09
10-12
01-04
05-09
10-12
All
200
600
800
4.0
60
120
0.8
mA
Standby current
I
SB
CS = V
IH
, OE = V
IH
,
f = 5 MHz, V
CC
= 5.5 V dc
1,2,3
mA
Input low level
V
IL
1,2,3
V
Input high level
V
IH
1,2,3
All
2.2
V
Output low voltage
V
OL
V
CC
= 4.5 V, I
OL
= 2.1 mA
V
CC
= 4.5 V, I
OL
= 8.0 mA
1,2,3
1,2,3
1,2,3
1,2,3
01-06
07-12
01-06
07-12
2.4
2.4
0.4
0.4
V
Output high voltage
V
OH
V
CC
= 4.5 V, I
OL
= -1.0 mA
V
CC
= 4.5 V, I
OL
= -4.0 mA
V
Dynamic characteristics
OE capacitance 4/
C
OE
V
IN
= 0 V, f = 1.0 MHz,
T
A
= +25°C
V
IN
= 0 V, f = 1.0 MHz,
T
A
= +25°C
V
IN
= 0 V, f = 1.0 MHz,
T
A
= +25°C
V
IN
= 0 V, f = 1.0 MHz,
T
A
= +25°C
4
All
30
pF
WE
capacitance 4/
C
WE
4
All
32
pF
CS
1-4
capacitance 4/
C
CS
4
All
15
pF
Data I/O capacitance 4/
C
I/O
4
All
15
pF
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
A
REVISION LEVEL
D
5962-95624
SHEET
5
DSCC FORM 2234
APR 97
stm32/stm8
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