CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
PARAMETER
Conversion Speed, f
C
Integral Non-Linearity
Differential Non-Linearity
Supply Current
Reference Pin Current
Analog Input (-1dB)
Analog Input Capacitance
V
DD
= +5V, V
RB
= 1V, V
RT
= 2V, T
A
= 25
o
C
SYMBOL
f
C
E
L
E
D
I
DD
I
REF
BW
C
IN
R
REF
E
OT
E
OB
V
IN
= 1.5V + 0.07V
RMS
TEST CONDITIONS
V
IN
= 1V to 2V
f
IN
= 1kHz Ramp
f
C
= 20MSPS
V
IN
= 1V to 2V
f
C
= 20MSPS
V
IN
= 1V to 2V
f
C
= 20MSPS
NTSC Ramp Wave Input
MIN
0.5
-
-
-
3
-
-
175
0
15
4.0
-
V
DD
= Max
V
IH
= V
DD
V
IL
= 0V
V
DD
= Min
V
OH
= V
DD
= 0.5V
V
OL
= 0.4V
With TTL 1 Gate and 10pF Load
NTSC 40 IRE Mod
Ramp, f
C
= 14.3MSPS
-
-
-1.1
3.7
-
-
-
-
-
TYP
-
±0.3
±0.3
7
4
18
4
250
-20
35
-
-
-
-
-
-
18
1.0
1.0
40
4
MAX
20
±0.5
±0.5
12
5.7
-
-
325
-40
55
-
1.0
5
5
-
-
30
-
-
-
-
UNITS
MSPS
LSB
LSB
mA
mA
MHz
pF
Ω
mV
mV
V
V
µA
µA
mA
mA
ns
%
deg
ps
ns
Reference Resistance (V
RT
to V
RB
)
Offset Voltage
Digital Input Voltage
V
IH
V
IL
Digital Input Current
I
IH
I
IL
Digital Output Current
I
OH
I
OL
Output Data Delay
Differential Gain Error
Differential Phase Error
Aperture Jitter
Sampling Delay
T
DL
DG
DP
t
AJ
t
SD
3
HI1172
Test Circuits
+V
S2
-
+
S1
S1 : ON IF A < B
S2 : ON IF B > A
-V
A<B
V
IN
DUT
HI1172
6
A>B
6
COMPARATOR
A6
A1
A0
B6
B1
B0
BUFFER
“0”
DVM
CLK (20MHz)
“1”
6
000 • • • 00
TO
111 • • • 10
CONTROLLER
FIGURE 1. INTEGRAL NON-LINEARITY ERROR, DIFFERENTIAL NON-LINEARITY, OFFSET VOLTAGE
2V
f
C
-1kHz
SG
1V
1
2
NTSC
SIGNAL
SOURCE
40 IRE
MODULATION
BURST
1V
-5.2V
TTL
f
C
ECL
AMP
V
IN
HI1172
ECL
620
2V
-5.2V
620
SYNC
DG
DP
6
TTL
6
HI20201
1
10-BIT
D/A
CLK
2
VECTOR
SCOPE
HPF
ERROR RATE
COUNTER
100
IAE
0
-40
SG
(CW)
FIGURE 2. MAXIMUM OPERATIONAL SPEED, DIFFERENTIAL GAIN ERROR, DIFFERENTIAL PHASE ERROR
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