CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details
.
Electrical Specifications
Supplies = +15V, -15V; V
AH
(Logic Level High) = 2.4V, V
AL
(Logic Level Low) = 0.5V; V
EN
= 2.4V,
Unless Otherwise Specified
TEST
CONDITIONS
TEMP
(
o
C)
-5
MIN
TYP
MAX
UNITS
PARAMETER
DYNAMIC CHARACTERISTICS
Access Time, t
A
Break-Before-Make Delay, t
OPEN
Enable Delay (ON), t
ON (EN)
Enable Delay (OFF), t
OFF (EN)
Settling Time (Note 5)
Note 5
Note 5
R
L
= 500Ω
R
L
= 500Ω
To 0.1%
To 0.01%
25
25
25
25
25
25
25
25
25
25
-
-
-
-
-
-
-
-
-
-
150
20
180
180
200
600
-65
4
10
5
300
-
-
-
-
-
-
-
-
-
ns
ns
ns
ns
ns
ns
dB
pF
pF
pF
Crosstalk
Channel Input Capacitance, C
S(OFF)
Channel Output Capacitance, C
D(OFF)
Digital Input Capacitance, C
A
DIGITAL INPUT SPECIFICATIONS
Input Low Threshold (TTL), V
AL
Input High Threshold (TTL), V
AH
Input Leakage Current (High), I
AH
Input Leakage Current (Low), I
AL
ANALOG CHANNEL SPECIFICATIONS
Analog Signal Range, V
lN
On Resistance, r
ON
Note 6
Full
Full
Full
Full
-
2.4
-
-
-
-
0.05
-
0.8
-
1
25
V
V
µA
µA
Full
Note 2
25
Full
-10
-
-
-
-
-
-
-
-
-
-
700
-
0.2
-
0.2
-
0.7
-
8
+10
-
1.5
-
50
-
50
-
50
-
V
Ω
kΩ
nA
nA
nA
nA
nA
nA
MHz
Off Input Leakage Current, I
S (OFF)
Note 3
25
Full
Off Output Leakage Current, I
D (OFF)
Note 3
25
Full
On Channel Leakage Current, I
D (ON)
Note 3
25
Full
-3dB Bandwidth
Note 4
25
2
HI-524
Electrical Specifications
Supplies = +15V, -15V; V
AH
(Logic Level High) = 2.4V, V
AL
(Logic Level Low) = 0.5V; V
EN
= 2.4V,
Unless Otherwise Specified
(Continued)
TEST
CONDITIONS
TEMP
(
o
C)
-5
MIN
TYP
MAX
UNITS
PARAMETER
POWER SUPPLY CHARACTERISTICS
Power Dissipation, P
D
Current, I+
Current, I-
NOTES:
2. V
lN
= 0V; l
OUT
= 100µA (See Test Circuit section).
3. V
O
=
±10V;
V
IN
=
±10V.
(See Test Circuit section).
4. MUX output is buffered with HA-5033 amplifier.
±
5. 6V Step,
±3V
to
3V, See Test Circuit section.
Full
Note 7
Note 7
Full
Full
-
-
-
-
-
-
750
25
25
mW
mA
mA
6. V
IN
= 10MHz, 3V
P-P
on one channel, with any other channel selected. (Worst case is channel 3 selected with input on channel 4.) MUX output
is buffered with HA-2541 as shown in Applications section. Terminate all channels with 75Ω.
7. Supply currents vary less than 0.5mA for switching rates from DC to 2MHz.
Test Circuits and Waveforms
T
A
= 25
o
C, V
SUPPLY
=
±15V,
V
AH
= 2.4V, V
AL
= 0.8V, Unless Otherwise Specified
I
OUT
100µA
V
2
IN
OUT
V
2
100µA
V
IN
r
ON
=
FIGURE 1A. TEST CIRCUIT
1,000
125
o
C
900
1,000
V
IN
= 0V
800
r
ON
(Ω)
r
ON
(Ω)
25
o
C
700
900
600
-55
o
C
800
500
400
-10
700
-8
-6
-4
-2
0
V
IN
(V)
2
4
6
8
10
9
10
11
12
13
14
15
SUPPLY VOLTAGE (±V)
FIGURE 1B. ON RESISTANCE vs ANALOG INPUT VOLTAGE
FIGURE 1C. ON RESISTANCE vs SUPPLY VOLTAGE
FIGURE 1. ON RESISTANCE
3
HI-524
Test Circuits and Waveforms
T
A
= 25
o
C, V
SUPPLY
=
±15V,
V
AH
= 2.4V, V
AL
= 0.8V, Unless Otherwise Specified
LEAKAGE CURRENT (nA)
I
D(ON)
1.0
EN
OUT
I
S(OFF)
I
D(OFF)
±10V
0
25
50
75
100
125
150
TEMPERATURE (
o
C)
0.8V
A
I
D(OFF)
0.1
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE
FIGURE 2B. I
D(OFF)
TEST CIRCUIT (NOTE 8)
OUT
A
I
S(OFF)
EN
A
0
±
±10V
10V
±
10V
A
1
0.8V
EN
OUT
A
+2.4V
FIGURE 2C. I
S(OFF)
TEST CIRCUIT (NOTE 8)
FIGURE 2D. I
D(ON)
TEST CIRCUIT (NOTE 8)
FIGURE 2. LEAKAGE CURRENTS
HA-524
±3V
IN1
V
AH
= 2.4V
IN2
HA-2541
2
18
+
OUTPUT
1.6V
ADDRESS DRIVE (V
A
)
V
AL
= 0.8V
75Ω
+3V
ACCESS TIME, t
A
IN4
3V
A
0
A
1
EN
5V
V
A
50Ω
HA-2541
OUTPUT
10%
-3V
±
0.1% OF FULL SCALE
(OR
±0.01%)
SETTLING TIME, t
S
±
-
20pF
(NOTE 10)
IN3
16
FIGURE 3A. TEST CIRCUIT
FIGURE 3B. MEASUREMENT POINTS
FIGURE 3. SETTLING TIME, ACCESS TIME, BREAK-BEFORE-MAKE DELAY (NOTE 9)
NOTES:
8. Two measurements per channel:
±10V
and 10V. (Two measurements per device for I
D(OFF)
±10V
and 10V.)
9. The Break-Before-Make test requires inputs 1 and 4 at the same voltage.
10. Capacitor value may be selected to optimize AC performance.
4
±
10V
I
D(ON)
±10V
HI-524
Test Circuits and Waveforms
T
A
= 25
o
C, V
SUPPLY
=
±15V,
V
AH
= 2.4V, V
AL
= 0.8V, Unless Otherwise Specified
V
A
INPUT
5V/DIV.
S
1
ON
OUTPUT
S
4
ON
1V/DIV.
50ns/DIV.
FIGURE 4. ACCESS TIME WAVEFORMS
Application Information
Often it is desirable to buffer the Hl-524 output, to avoid
loading errors due to the channel “ON” resistance:
HA-524
CH1
75Ω
HA-2541
+
12
Note that the on-chip feedback element between pins 16
and 18 includes two switches in series, to simulate a channel
resistance. These switches open for V
EN
= Low. This allows
two or more Hl-524s to operate into one HA-2541, with their
feedback elements connected in parallel. Thus, only the
selected multiplexer provides feedback, and the amplifier
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