Body Features: Heat Sink Style Fin | Heat Sink Finish Anodized Black | Configuration Features: Number of Rear EONs per Port Column 3 | Port Matrix Configuration 2 x 2 | Number of Positions 38 | Number of Ports 4 | Contact Features: Contact Mating Area Plating Material Thickness .76 MICIN | Contact Mating Area Plating Material Gold | Contact Underplating Material Tin | Contact Mating Area Plating Material Thickness 30 MICM | PCB Contact Termination Area Plating Material Gold | Dimensions: PCB Thickness (Reco
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108-106242
3.3.
Test Requirements and Procedures Summary
Unless otherwise specified, all tests shall be performed at ambient environmental conditions.
Figure 1
TEST DESCRIPTION
3.1
Examination
the product
of
PROCEDURE
Visual,dimensional and functional
as per applicable inspection plan
and no physical damage. Test
Method”EIA-364-18 B”
Speed of tensile testing machine
to be 50 mm/ min. test until
breakage or pull-out as per DIN
46249
REQUIREMENT
Meets requirements of the product drawings and no
physical damage
Wire section (mm²)
Minimum tensile force (N)
80
95
115
150
220
0.8mm tab
1st insertion
0.5mm tab
1st extration
70N Max.
35N max.
67N max.
3.2
Crimp
strength
tensile
0.5
0.75
1.0
1.5
2.5
3.3
Mating force
Measure force to push terminal
onto plain test tab at the rate of 50
mm/ min.according to IEC 760
Measure force to push terminal
onto plain test tab at the rate of 50
mm/ min.according to IEC 760
Measure between mating and
wire, crimped on Faston connector
receptacle, including 10mm length
of the wire
Wire
section Test current(A)
(mm²)
0.5
5
0.75
8
1.0
10
1.5
14
2.5
20
Temperature rise at rated current
as per IEC 61210
Subject receptacle mated with
test tab to 10-100-10Hz at 10g
acceleration for 2 hours each in
X,Y and Z directions – rate 1
octave/ minute amplitude of
oscillation 0.75mm
Temperature rise at rated current
as per IEC 61210, One cycle 45
min. on / 15 min. off, duration of
500 cycles as per IEC 61210
10th extration force
15N Min.
3.4
Unmating force
Millivolt drop required (without 10mm mV drop of the
wire)
3.5
Millivolt
drop
specified current
3.6
Temperature rise
18mv max
20mv max
20mv max
25mv max
30mv max
Temperature rise of any individual termination shall not
exceed 30° (temp. rise = temp. of contact – room
C
temp.)
No physical damage. No discontinuities than 1
microsecond
3.7
Vibration
3.8
Current cycling
The temperature rise Δt1 of any individual connection
is measured after the 24th cycle and Δt2 after the
500th cycle. The Δt2 value shall not exceed by 15°
C
the Δt1 value and neither rise shall exceed 85°C on
transition between contact body and crimp wire barrel
REV B2
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108-106242
Subject receptacle mated with test
tab to 5 cycles, each consisting of:
(a) 2 hours at 100±2°
C
(b) 2 hours at 40±2° and 90-
C
95% humidity
2 hours at 30±2°
C
Subject receptacle mated with test
tab to a current 1.5 times the rated
value for a duration of 1 hour
Subject receptacle mated with
test tab to 96 hours at 5%
concentration of NaCl
Voltage drop to be < 2 times the initial value.specified
at the point 3.5
3.9
Thermal shock
3.10
Electrical
overload
resistance
No functioning breakdown or damage. Voltage drop to
not drop must be same as specified at the point 3.5
3.11
Salt spray
Voltage drop to be < 2 times the initial value.specified
at the point 3.5
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in
Figure 2.
3.4.
Product Qualification and Requalification test sequence
Figure.2
TEST GROUP AND SEQUENCE
TEST OR EXAMINATION
VISUAL EXAMINATION
MATING FORCE (SINGLE CONTACT)
UNMATING FORCE (SINGLE CONTACT)
Durability
Millivolt drop
CRIMP TENSILE STRENGTH
THERMAL SHOCK
TEMPERATURE RISE
CURRENT CYCLING
SALT SPRAY
A
1,8
2
4,7
5
3,6
B
1,3
C
1,4
D
1,3
E
1,3
F
1,4
G
1,4
H
1,4
3
2
2
2
2
3
3
3
2
2
2
VIBRATION
ELECTRICAL OVERLOAD RESISTANCE
REV B2
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108-106242
NOTE
(a) Samples shall be prepared in accordance with applicable instruction sheets. They shall be
selected at random from current production.
(b) Numbers indicate sequence in which tests are performed.