CAT25080, CAT25160
8-Kb and 16-Kb SPI Serial CMOS EEPROM
FEATURES
10 MHz SPI compatible
1.8V to 5.5V supply voltage range
SPI modes (0,0) & (1,1)
32-byte page write buffer
Self-timed write cycle
Hardware and software protection
Block write protection
– Protect 1/4, 1/2 or entire EEPROM array
Low power CMOS technology
1,000,000 program/erase cycles
100 year data retention
Industrial temperature range
RoHS-compliant 8 lead PDIP, SOIC, TSSOP and
8-pad TDFN, UDFN packages
DESCRIPTION
The CAT25080/25160 are 8-Kb/16-Kb Serial CMOS
EEPROM
devices
internally
organized
as
1024x8/2048x8 bits. They feature a 32-byte page
write buffer and support the Serial Peripheral Interface
(SPI) protocol. The device is enabled through a Chip
¯¯
Select (CS) input. In addition, the required bus signals
are a clock input (SCK), data input (SI) and data
¯¯¯¯¯
output (SO) lines. The HOLD input may be used to
pause any serial communication with the
CAT25080/25160 device. These devices feature
software and hardware write protection, including
partial as well as full array protection.
PIN CONFIGURATION
PDIP (L)
SOIC (V)
TSSOP (Y)
TDFN (VP2)
UDFN (HU2)
¯¯
CS
SO
¯¯¯
WP
V
SS
1
2
3
4
8 V
CC
¯¯¯¯¯
7 HOLD
6 SCK
5 SI
FUNCTIONAL SYMBOL
V
CC
SI
CS
WP
HOLD
SCK
CAT25080
CAT25160
SO
PIN FUNCTION
Pin Name
¯¯
CS
SO
¯¯¯
WP
V
SS
SI
SCK
¯¯¯¯¯
HOLD
V
CC
Function
Chip Select
Serial Data Output
Write Protect
Ground
Serial Data Input
Serial Clock
Hold Transmission Input
Power Supply
GND
For Ordering Information details, see page 16.
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
1
Doc. No. 1122 Rev. A
CAT25080, CAT25160
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Storage Temperature
Voltage on any Pin with Respect to Ground
RELIABILITY CHARACTERISTICS
(3)
Symbol
N
END(4)
T
DR
Parameter
Endurance
Data Retention
Min
1,000,000
100
Units
Program/ Erase Cycles
Years
(2)
Ratings
–65 to +150
–0.5 to V
CC
+ 0.5
Units
ºC
V
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V, T
A
=-40°C to +85°C unless otherwise specified.
Symbol Parameter
I
CC
Supply Current
I
SB1
I
SB2
I
L
I
LO
V
IL
V
IH
V
OL1
V
OH1
V
OL2
V
OH2
Standby Current
Standby Current
Input Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
V
CC
> 2.5V, I
OL
= 3.0mA
V
CC
> 2.5V, I
OH
= -1.6mA
V
CC
> 1.8V, I
OL
= 150µA
V
CC
> 1.8V, I
OH
= -100µA
V
CC
- 0.2V
V
CC
- 0.8V
0.2
Test Conditions
Read, Write, V
CC
= 5.0V, f
SCK
= 10MHz,
SO open
¯¯
WP
V
IN
= GND or V
CC
, CS = V
CC
, ¯¯¯ = V
CC
,
V
CC
= 5.0V
¯¯
WP
V
IN
= GND or V
CC
, CS = V
CC
, ¯¯¯ = GND,
V
CC
= 5.0V
V
IN
= GND or V
CC
-2
-1
-0.5
0.7V
CC
Min
Max
2
2
4
2
1
0.3V
CC
V
CC
+ 0.5
0.4
Units
mA
µA
µA
µA
µA
V
V
V
V
V
V
¯¯
Output Leakage Current CS = V
CC
, V
OUT
= GND or V
CC
PIN CAPACITANCE
(3)
T
A
= 25˚C, f = 1.0MHz, V
CC
= +5.0V
Symbol
C
OUT
C
IN
Test
Output Capacitance (SO)
¯¯
Input Capacitance (CS, SCK, SI, ¯¯¯, HOLD)
WP ¯¯¯¯¯
Conditions
V
OUT
= 0V
V
IN
= 0V
Min
Typ
Max
8
8
Units
pF
pF
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is
not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than V
CC
+ 0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than V
CC
+ 1.5V, for periods of less than 20ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and
JEDEC test methods.
(4) Page Mode, V
CC
= 5V, 25°C
Doc. No. 1122 Rev. A
2
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT25080, CAT25160
A.C. CHARACTERISTICS
T
A
= -40°C to +85°C, unless otherwise specified.
(1)
V
CC
= 1.8V-5.5V
Symbol
f
SCK
t
SU
t
H
t
WH
t
WL
t
LZ
t
RI(2)
t
FI(2)
t
HD
t
CD
t
V
t
HO
t
DIS
t
HZ
t
CS
t
CSS
t
CSH
t
WPS
t
WPH
t
WC(4)
Parameter
Clock Frequency
Data Setup Time
Data Hold Time
SCK High Time
SCK Low Time
¯¯¯¯¯
HOLD to Output Low Z
Input Rise Time
Input Fall Time
¯¯¯¯¯ Setup Time
HOLD
¯¯¯¯¯
HOLD Hold Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
¯¯¯¯¯
HOLD to Output High Z
¯¯
CS High Time
¯¯
CS Setup Time
¯¯
CS Hold Time
¯¯¯ Setup Time
WP
¯¯¯ Hold Time
WP
Write Cycle Time
50
50
50
10
10
5
0
50
100
15
15
15
10
10
5
0
10
75
0
20
25
Min.
DC
30
30
75
75
50
2
2
0
10
40
Max.
5
V
CC
= 2.5V-5.5V
Min.
DC
20
20
40
40
25
2
2
Max.
10
Units
MHz
ns
ns
ns
ns
ns
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Power-Up Timing
(2)(3)
Symbol
t
PUR
t
PUW
Notes:
(1) AC Test Conditions:
Input Pulse Voltages: 0.3V
CC
to 0.7V
CC
Input rise and fall times:
≤
10ns
Input and output reference voltages: 0.5V
CC
Output load: current source I
OL max
/I
OH max
; C
L
= 50pF
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated.
¯¯
(4) t
WC
is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
Parameter
Power-up to Read Operation
Power-up to Write Operation
Max.
1
1
Units
ms
ms
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc. No. 1122 Rev. A
CAT25080, CAT25160
PIN DESCRIPTION
SI:
The serial data input pin accepts op-codes,
addresses and data. In SPI modes (0,0) and (1,1)
input data is latched on the rising edge of the SCK
clock input.
SO:
The serial data output pin is used to transfer data
out of the device. In SPI modes (0,0) and (1,1) data is
shifted out on the falling edge of the SCK clock.
SCK:
The serial clock input pin accepts the clock
provided by the host and used for synchronizing
communication between host and CAT25080/160.
¯¯
CS:
The chip select input pin is used to enable/disable
¯¯
the CAT25080/160. When CS is high, the SO output is
tri-stated (high impedance) and the device is in
Standby Mode (unless an internal write operation is in
progress).
Every communication session between host
and CAT25080/160 must be preceded by a high to low
transition and concluded with a low to high transition of
¯¯
the CS input.
¯¯¯:
The write protect input pin will allow all write
WP
operations to the device when held high. When ¯¯¯
WP
pin is tied low and the WPEN bit in the Status
Register (refer to Status Register description, later in
this Data Sheet) is set to “1”, writing to the Status
Register is disabled.
¯¯¯¯¯
HOLD:
The ¯¯¯¯¯ input pin is used to pause trans–
HOLD
mission between host and CAT25080/160, without
having to retransmit the entire sequence at a later
¯¯¯¯¯
time. To pause, HOLD must be taken low and to
resume it must be taken back high, with the SCK
input low during both transitions. When not used for
pausing, the ¯¯¯¯¯ input should be tied to V
CC
,
HOLD
either directly or through a resistor.
Figure 1. Synchronous Data Timing
V
IH
t
CS
FUNCTIONAL DESCRIPTION
The CAT25080/160 devices support the Serial Periphe–
ral Interface (SPI) bus protocol, modes (0,0) and (1,1).
The device contains an 8-bit instruction register. The
instruction set and associated op-codes are listed in
Table 1.
Reading data stored in the CAT25080/160 is accom–
plished by simply providing the READ command and an
address. Writing to the CAT25080/160, in addition to a
WRITE command, address and data, also requires
enabling the device for writing by first setting certain bits
in a Status Register, as will be explained later.
¯¯
After a high to low transition on the CS input pin, the
CAT25080/160 will accept any one of the six instruction
op-codes listed in Table 1 and will ignore all other
possible 8-bit combinations. The communication proto–
col follows the timing from Figure 1.
Table 1: Instruction Set
Instruction
WREN
WRDI
RDSR
WRSR
READ
WRITE
Opcode
0000 0110
0000 0100
0000 0101
0000 0001
0000 0011
0000 0010
Operation
Enable Write Operations
Disable Write Operations
Read Status Register
Write Status Register
Read Data from Memory
Write Data to Memory
CS
V
IL
V
IH
V
IL
V
IH
t
SU
t
CSS
t
CSH
SCK
t
WH
t
H
t
WL
SI
VALID IN
t
RI
tFI
VIL
t
V
t
HO
t
DIS
HI-Z
SO
V
OH
V
OL
HI-Z
Note:
Dashed Line = mode (1, 1) - - - - - -
Doc. No. 1122 Rev. A
4
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT25080, CAT25160
STATUS REGISTER
The Status Register, as shown in Table 2, contains a
number of status and control bits.
The ¯¯¯¯ (Ready) bit indicates whether the device is
RDY
busy with a write operation. This bit is automatically set
to 1 during an internal write cycle, and reset to 0 when
the device is ready to accept commands. For the host,
this bit is read only.
The WEL (Write Enable Latch) bit is set/reset by the
WREN/WRDI commands. When set to 1, the device is
in a Write Enable state and when set to 0, the device is
in a Write Disable state.
The BP0 and BP1 (Block Protect) bits determine which
blocks are currently write protected. They are set by the
Table 2. Status Register
7
WPEN
6
0
5
0
4
0
3
BP1
2
BP0
1
WEL
0
¯¯¯¯
RDY
user with the WRSR command and are non-volatile.
The user is allowed to protect a quarter, one half or the
entire memory, by setting these bits according to Table
3. The protected blocks then become read-only.
The WPEN (Write Protect Enable) bit acts as an enable
for the ¯¯¯ pin. Hardware write protection is enabled
WP
when the ¯¯¯ pin is low and the WPEN bit is 1. This
WP
condition prevents writing to the status register and to
the block protected sections of memory. While
hardware write protection is active, only the non-block
protected memory can be written. Hardware write
protection is disabled when the ¯¯¯ pin is high or the
WP
WPEN bit is 0. The WPEN bit, ¯¯¯ pin and WEL bit
WP
combine to either permit or inhibit Write operations, as
detailed in Table 4.
Table 3. Block Protection Bits
Status Register Bits
BP1
0
0
1
1
BP0
0
1
0
1
Array Address Protected
None
25080: 0300-03FF
25160: 0600-07FF
25080: 0200-03FF
25160: 0400-07FF
25080: 0000-03FF
25160: 0000-07FF
Protection
No Protection
Quarter Array Protection
Half Array Protection
Full Array Protection
Table 4. Write Protect Conditions
WPEN
0
0
1
1
X
X
¯¯¯
WP
X
X
Low
Low
High
High
WEL
0
1
0
1
0
1
Protected
Blocks
Protected
Protected
Protected
Protected
Protected
Protected
Unprotected
Blocks
Protected
Writable
Protected
Writable
Protected
Writable
Status
Register
Protected
Writable
Protected
Protected
Protected
Writable
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
5
Doc. No. 1122 Rev. A
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