It----
General Guide to RCA High-Reliability IC Products
Irldex to
RCA
High-Reliability
IC's
Hi,gh-Voltage CD4000B-Series CMOS IC's
(8(3e pages 27 through 52 for technical data)
Tlrp No.
CD4000B
CD4000UB
CD4001B
CD4001UB
CD4002B
CC4002UB
CC4006B
CC4007UB
CC4008B
CC4009UB
CD4010B
CD4011B
CD4011UB
CD4012B
CD4012UB
Description
Dual 3-input NOR gate plus inverter
Dual 3-input NOR gate plus inverter
Quad 2-input NOR gate
Quad 2-input NOR, gate
Dual 4-input NOR gate
Dual 4-input NOR gate
18-stage static shift register
Dual complementary pair plus
inverter
4-bit full adder with parallel
carry-out
Hex butter/converter (inverting)
Hex butter/converter (non-inverting)
Quad 2-input NAND gate
Quad 2-input NAND gate
Dual 4-input NAND gate
Dual 4-input NAND gate
Dual "D" flip-flop with set/reset
capability
8-stage static shift register
Dual 4-stage static shift register
Quad bilateral switch
Decade counter/divider
Presettable divide-by "N" counter
Quad AND/OR select gate
14-stage Binary Ripple Counter
8-stage static shift register
Divide-by-8 counter/divider
Triple 3-input NAND gate
Triple 3-input NAND gate
7-stage binary ripple counter
Triple 3-input NOR gate
Triple 3-input NOR gate
Decade counter/divider
Dual "J-K" flip-flop with set/reset
capability
BCD-te-decimal decoder
Presettable up/down counter
Quad exclusive-OR gate
64-stage static shift register
Decade counter/divider
8-st.age static shift register
4-stage parallel-in/parallel-out
shift register
12-stage binary ripple counter
Quad true/complement butter
Quad clocked "D" latch
Quad NOR R/S latch (3-state
outputs)
Quad NAND RlS latch (3-state
outputs)
21-stage timer
Micropower phase-locked loop
Monostable/astable multivibrator
Multifunctional expandable 8-input
gate (3-state output)
Hex butter/converter (inverting)
Hex butter/converter (non-inverting)
8-channel analog multiplexer/
demultiplexer
No. of
Leads
14
14
14
14
14
14
14
14
16
16
16
14
14
14
14
14
16
16
14
16
16
16
16
16 .
16
14
14
14
14
14
16
16
16
16
14
16
16
24
16
16
14
16
16
16
14
16
14
16
16
16
16'
Type No.
CD4052B
Description
No. of
Leads
16
16
16
16
14
24
14
14
14
14
14
14
14
14 •
14
14
,14
14
14
14
16
14
16
14
14
24
16 '
16
16
16
24
16
16
16
24
24
16
16
16
16
16
16
16
16
16
.040138
04014B
04015B
CD4016B
CD4017B
CD4018B
CD4019B
CD4020B
C04021B
C04022B
C04023B
CD4023UB
C04024B
CD4025B
CD4025UB
CD4026B
CD4027B
C04028B
CD4029B
CD4030B
CD4031B
CD4033B
CD4034B
CD4035B
CD4040B
gg:~~~B
CD4043B
CD4044B
CD4045B
CD4046B
7B
CD4051B
4-channel analog multiplexer/
demultiplexer
CD4053B
Triple 2-channel analog multiplexer/
demultiplexer
CD4060B
14-stage binary ripple counter/
divider and oscillator
CD4063B
4-bit magnitude comparator
CD4066B
Quad bilateral switch
CD4067B
16-channel analog multiplexers/
demultiplexers
8-input NAND/AND gate
CD4068B
CD4069UB Hex inverter
VCD4070B
Quad exclusive-OR gate
VCD4071B
Quad 2-input OR gate
CD4072B-
D<.Ial 4-lnput OR gate
CD4073B
Triple 3-input AND gate
Triple 3-input OR gate
C04075B
CD4076B
4-bit "0" flip-flop (3-state outputs)
CD4077B
Quad exclusive-NOR gate
CD4078B
8-input NOR/OR gate
CD4081B
Quad 2-input AND gate
CD4082B . Dual 4-iriput AND gate
CD4085B
Dual 2-wide, 2-input AND/OR
INVERT (A01) gate
E)(pandable 4-wide, 2-input
CD4086B
AND/OR/INVERT (A01) gate
CD4089B
Binary rate multiplier
CD4093B
Q~ad
2-input NAND Schmitt
Trigger
CD4094B
8-stage shift-and-store bus register
CD4095B
Gated "J-K" flip-flop (non-inverting)
CD4096B
Gated "J-K" flip-flop (inverting
and non-inverting)
CD4097B
8-channel analog multiplexer/
demultiplexer
CD4098B
Dual monostable multivibrator
CD4099B
8-bit addressable latch
CD4502B
Strobed hex inverter/buffer
CD4503B
Hex butter (non-inverting)
CD4508B
Dual 4-bit latch
CD4510B
Presettable 4-bit BCD up/down
counter
CD4511B
BCD-te-7-segment latch decoder/
driver
CD4512B
8-channel data selector (3-state
output)
4-bit latch/4-to-16 line decoder
CD4514B
.' '(outputs low)
CD4515B
4-bit latch/4-to-16 line decoder
(outputs low)
CD4516B
Presettable 4-bit binary up/down
counter
CD4517B
Dual 64-bit shift register
CD4518B
Dual BCD up counter
CD4520B
Dual binary up counter
CD4527B
BCD rate multiplier
CD4532B
8-input priority encoder
CD4536B
Programmable timer
CD4538B
Dual preCision monostable
m ultivibrator
CD4555B
Dual 1-of-4 decoder/demultiplexer
(outputs high)
5
General Guide to RCA High-Reliability IC Products
.Reliability Levels, Nomenclature and Lot Screening Tests
The term
high reliability
as applied to integrated circuits
covers a broad spectrum of reliability classes. These
'asses were originally defined by device manufacturers
based on test methods described in MIL-STD-883, a com-
pendium of quality and conformance tests and later were
standardized by the government. MIL-STD-883 establishes
uniform methods and procedures for testing microcircuits
including basic environmental tests to determine resistance
to deleterious effects of natural elements and conditions
surrounding military and space operations and physical
and electrical tests.
Today, there are both in-house and government-defined
reliability classes. The contents of in-house programs vary
with the manufacturer. The government program, referred
to as MIL-M-38510, consists of a general specification and a
detailed specification. This specification establishes the
general requirements for microcircuits and the quality- and
reliability-assurance requirements that must be met in the
procurement of microcircuits. Detailed test requirements
and inspections are defined for each device in the approp-
riate detail specification. The general speCification applies
to all technologies, such as TTL, ECL, linear and CMOS; the
detailed specification delineates the requirements for a cir-
cuit function within a technology.
MIL-M-38S10 CD4000-Serles CMOS IC's
The purpose of the MIL-M-38510 program is to achieve
standardization among integrated-circuit suppliers and to
assure delivery of devices whose long-term life will satisfy
the requirements of the system for which they are intended.
Three reliability classes - S, B, and C - are described in
MIL-M-38510; the screening tests for these reliability
classes are performed according to MIL-STD-883, Method
5004. Class S devices are of the highest reliability level and
are intended for critical applications where replacement of
components is not practical.
The qualification and quality conformance tests deli-
neated in MIL-STD-883, Method 5005 are accelerated
stress tests that subject devices to stress levels greater than
those normally experienced in a typical application. These
tests consist of: Group A, Electrical; Group B, Package and
Internal Mechanical Strength; Group C, Indicators of Long
Term Reliability; and Group D for package and chip. Both
qualification devices and a sample of devices from the pro-
duction line are subjected to this series of accelerated tests.
The tests performed on the qualification devices are called
qualification tests; the tests performed on production-line
devices after a specific type has been qualified are called
conformance tests. Electrical end-point limits for the tests
are defined by MIL-M-38510 and are more demanding of
CMOS than of TTL. DC parameters are measured at -55°C,
-
+25°C, and +125°C.
In summary, then, devices are manufactured in accord-
ance with the MIL-M-38510 (general and detailed) specifi-
cation, which includes portions of the MIL-STD-883 test
method. The device class is determined by the level of
inspections, screening, and conformance testing to WhiC_
the devices are subjected.
CMOS integrated circuits are supplied to MIL-M-3851
under a series of /050 and /170 numbers. Detailed ratings
and characteristics for these integrated circuits are given in
the /050 and /170 detailed electrical specifications. MIL-M-
38510 specifications can be obtained from the Naval Publi-
cations and Forms Center, 5801 Tabor Avenue, Philadel-
phia, PA, 19120.
RCA JAN Qualified-Parts Listing and MIL-M-38510 Detail
Specifications (Slash Sheets) as of Jan. 1982
Detail Specification
MIL-M-38510/5001
02
03
51
52
53
MIL-M-38510/5101
02
03
51
52
53
MIL-M-38510/5201
02
03
04
51
52
53
54
RCA
Type
Detail Specification
S
RCA
Type
B
A
A
A
MIL-M-3851 0/5301
02
03
04
51
52
53
54
MI L-M-3851 0/5401
51
MIL-M-38510/5501
02
03
04
J)5
51
52
53
54
55
CD4007A
CD4019A
CD4030A
CD4048A
CD4007B
CD4019B
CD4030B
CD4048B
CD4008A
CD4008B
CD4009A
CD4010A
CD4049A
CD4050A
CD4041A
CD4009UB
CD4010B
CD4049UB
CD4050B
CD4041B
S
B
A
A
CD4011A
CD4012A
CD4023A
CD4011B
CD4012B
CD4023B
CD4013A
CD4027A
CD4043A
CD4013B
CD4027B
CD4043B
CD4000A
CD4001A
CD4002A
CD4025A
CD4000B
CD4001B
CD4002B
CD4025B
P
P
P
A
A
P
P
P
P
P
A
A
A
A
A
A
P
P
P
P
P
P
P
P
10
General Guide to RCA High-Reliability IC Products
Screening Levels for RCA MIL-STD-883 Slash-Series CMOS Integrated Circuits
: ; . . " . . . . . 11 ••
1:11
Levelst
Application
Description
RCA
Levels
MIL-STD-883,
Method 5004 Format
Packaged Devices (0, F, K, or L Suffix)
11S
Class S with SEM Inspection and
Condition A Precap Visual
Inspection
Class S with SEM Inspection and
Condition B Precap Visual In-
spection (for LSI types)
Aerospace and Missiles
Same as
11
S or
11
R + Radiation
Hardened to 10
6
rads(Si)
Same as
11
S or
11
R + Radiation
Hardened to 10
5
rads(Si)
Class B
Military and Industrial
For example, In Air-
borne Electronics
For devices intended for use
where maintenance and replace-
ment can be performed but are
difficult and expensive
I1R*
11SJ
or
I1RJ*
11
SZ or /1 RZ*
For devices Intended for use
where maintenance and replace-
ment are impossible and reli-
ability is imperative
,
13W;
Class B with High- and Low-
,
Temperature DC and Dynamic
Testing omitted
CI ips (I
IS
IR*
:)
SEM Inspection and Condition A
Visual Inspection
SEM Inspection and Condition B
Visual Inspection (for LSI
types)
Same as
IS
or
IR
+ Radiation
Hardened to 10
6
rads(Si)
Same as
IS
or
IR
+ Radiation
Hardened to 10
5
rads(SI)
Condition B Precap Visual
Inspection
MIlitary and Industrial
For general applications
For hybrid applications where
maintenance and replacement
are extremely difficult and
reliability is imperative
Aerospace and Missiles
ISJ
or
IRJ*
ISZ
or
IRZ*
1M
°/1R
or
IR
screening IS used Instead of
11S
Or
IS
screening for LSI circuits for which their large size makes the Condition A Precap Visual
Inspection Impractical
tFor screening details refer to Total Lot Screening Chart
;/3W
screening of CDP1800 series Includes dynamic testing at +2SoC.
RCA MIL-STD-883 Slash-Series Linear IC's
The RCA CA3000 slash-series of high-reliability linear inte-
grated circuits includes a broad range of types for use in
satellites and other aerospace, military, and critical indus-
trial applications in which maintenance is extremely diffi-
cult. These integrated circuits are processed and screened
in accordance with MIL-STO-883, Method 5004 format. A
comprehensive listing of CA3000-series high-reliability
types is included in the
Index to RCA High-Reliability IC's
(refer to page 7). High-reliability versions of any commer-
cially available standard-product CA3000-series types not
listed in this Index can also be supplied on a custom basi so
The RCA CA3000 slash-series types are supplied to three
screening levels
(11,
/3, and /3W) that meet the electrical,
mechanical, and environmental test methods and proce-
dures established for microelectronics in MIL-STO-883.
The following charts and diagrams illustrate the typ_
number nomenclature system and the processing and tes
ing that types are subjected to for each screening level,
define the various screening levels, and outline the detailed
screening procedures and sampling inspections for
CA3000 slash-series high-reliability integrated circuits.
12
RCA MIL-STD-883 CD4000B Slash-Series High-Voltage CMOS IC's---------........;
RCA
MIL-STD-883 CD4000B Slash-Series
High-Voltage
CMOS
IC's
The RCA high-reliability CD4000B series of high-voltage
CMOS integrated circuits consists of a broad range of SSI,
MSI-1, and MSI-2 (LSI) functions from simple gates to com-
plex counters, registers, and arithmetic circuits. Specific
design features for CMOS devices and the performance
advantages of CMOS technology - low power consump-
tion, high noise immunity, high speed, high fanout, TTL and
DTL logic compatibility, excellent temperature stability,
and fully protected inputs and outputs - provide the logic
system designer with a capability to achieve outstanding
performance, high reliability, and simplified circuitry in a
wide variety of equipment designs.
Features
• Capability to 20
V,
tested at 18
V
in conformance with
JEDEC specifications
• 100% tested for quiescent current at 18
V
• Maximum input current (leakage) of 1J,JA at 18
V
over full
package-temperature range; 100 nA at 18
V
at 25°C
• Standardized symmetrical output characteristics
• 5-V, 10-V,
and
15-V
parametriC ratings
• Noise margin (over full package-temperature range): 1
V
at Voo
=
5
V,
2
V
at Voo
=
10
V,
2.5
V
at Voo::: 15
V
• Meets all requirements of JEDEC Standard No. 13A,
"Standard Specifications for description of 'B' Series
CMOS Devices"
Buffered Vs. Unbuffered Gates
The new industry standard establishes a suffix "UB" for
CMOS products that meet all B-series specifications except
that the logical outputs of the devices are not buffered and
the V
1L
and V
1H
specifications are 20% and 80% of Voo,
respectively. The suffix "B" defines high-voltage buffered-
output devices in which the output "on" impedance is inde-
pendent of any and all valid input logic conditions, both
preceding and present.
RCA will supply both buffered ("B") and unbuffe
("UB") versions of the popular NOR and NAND
make available to designers the advantages of both.
following table briefly compares the features of the
versions.
Buffered
Version
("B")
Moderate
Excellent
Constant
High
Yes
Low
Unbuffered
Version
("UB")
Fast
Good
Variable
Low
No
High
Recommended Operating Conditions
For maximum reliability, nominal operating conditions
should be selected so that operation is a/ways within the
following ranges:
Characteristic
Supply-Voltage Range (For
T A
=
Full Package-
Temperature Range)
Limits
Max.
Min.
Units
V
Characteristic
Propagation Delay (Speed)
Noise Immunity/Margin
Output Impedance and
Output Transition Time
AC Gain
Output Oscillation for
Slow Inputs
Input Capacitance
3
15
Maximum Ratings, Absolute-Maximum Values
DC SUPPLY-VOLTAGE RANGE, (Voo)
(Voltages referenced to Vss Terminal) ........................................................ -0.5 to +18
V
INPUT VOLTAGE RANGE, ALL INPUTS ................................................... -0.5 to Voo
+0.5V
DC INPUT CURRENT, ANY ONE INPUT ...........................................................
±
10 mA
POWER DISSIPATION PER PACKAGE (Po):
For TA
=
-55 to +100°C (PACKAGE TYPES D,F,K) ................................................. 500 mW
For TA
=
+100 to +125°C (PACKAGE TYPES D,F,K) ................. Derate Linearly at 12 mW/oC to 200 mW
DEVICE DISSIPATION PER OUTPUT TRANSISTOR
For TA
=
FULL PACKAGE-TEMPERATURE RANGE (All Package Types) ............................ 100 mW
OPERATING-TEMPERATURE RANGE (T A):
PACKAGE TYPES D,F,K,H ................................................................. -55 to +125°C
STORAGE TEMPERATURE RANGE (T
Btg ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
-65 to +150°C
,
LEAD TEMPERATURE (DURING SOLDERING):
At distance 1/16
±
1/32 inch (1.59
±
0.79 mm) from case for 10 s max ............................... +265°C
.
28
8 " ' - - - - - - - - - - R C A MIL-STD-883 CD4000B Slash-Series High-Voltage CMOS IC's
Classification According to Circuit Complexity
Gates/
Inverters (551)
CD4000B
CD4000UB
CD4001B
CD4001UB
CD4002B
CD4002UB
CD4007UB
CD4011B
CD4011UB
CD4012B
CD4012UB
CD4016B*
CD4023B
CD4023UB
CD4025B
CD4025UB
CD4048B
CD4066B*
CD4068B
CD4069UB
CD4071B
CD4072B
CD4073B
CD4075B
CD4078B
CD4081B
CD4082B
Buffers/Fllp-FI p/
Latches/Multi-Level
Gates (M51-1)
CD4009UB*
CD4010B*
CD4013B
CD4019B
CD4027B
CD4030B
CD4041UB*
CD4042B
CD4043B
CD4044B.
CD4047B
CD4049UB*
CD4050B*
CD4070B
CD4077B
CD4085B
CD4086B
CD4093B*
CD4095B
CD4096B
CD4098B
CD4502B*
CD4503B*
CD40106B*
CD40107B*
CD40109B*
CD40174B
CD40257B
CD4006B
CD4008B
CD4014B
CD4015B
CD4017B
CD4018B
CD4020B
CD4021B
CD4022B
CD4024B
CD4026B
CD4028B
CD4029B
CD4031Bft
CD4032B
CD4033B
CD4034B
CD4035B
CD4038B
CD4040B
CD4045Bw
CD4046Bw
CD4051B"
CD4052B"
Complex Logic (M51-2)
CD4053B*
CD4060B
CD4063B
CD4067B*
CD4076B
CD4089B
CD4094B
CD4097B*
CD4099B
CD4508B
CD4510B
CD4511B*
CD4512B
CD4514B
CD4515B
CD4516B
CD4517B
CD4518B
CD4520B
CD4527B
CD4532B
CD4536B
CD4538B
CD4555B
CD4556B
CD4585B
CD4724B
CD40100B
CD40101 B
CD40102B
CD40103B
CD40104B
CD40105B
CD40108B
CD40110B*
CD40147B
CD40160B
CD40161B
CD40162B
CD40163B
CD40181 B
CD40182B
CD40192B
CD40193B
CD40194B
CD40208B
* Indicates type for which, because of design requirements, one
or more static characteristics differ from the standardized
data. These differences are defined in separate data charts on
these types.
Note:
In addition to the high-voltage B-series CMOS Integrated circuits listed above, RCA also offers a
comprehensive line of high-reliability A-series (3 to 12 V) types. A-series counterparts are offered for all
B-series parts from CD4000 through CD4050 and for the CD4060. High-reliability versions are also
offered for four A-series parts for which there are no corresponding B-series types, as follows:
CD4036A
CD4039A
CD4057 A
CD4059A
4-word by 8-bit static RAM
4-word by 8-bit static RAM
LSI 4-bit ALU
programmable divide-by-N counter
RCA high-reliability A-series CMOS integrated circuits are provided to the same MIL-STD-883 slash-
series screening level as the B-series parts. For descriptive information on RCA CD4000A-series CMOS
integrated circuits, refer to the CMOS Integrated Circuits DATABOOK, SSD-250B .
•
29
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