Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS)
MnO
2
(CWR09/19/29 Style)
Overview
The KEMET T497 is designed for the COTS (Commercial
Off-The-Shelf) requirements of military, medical, and
aerospace applications. This product is a COTS version
of CWR09,19, and 29 products. The T497 Series is a
surface mount product offering various lead-frame plating
options, Weibull grading options, X-ray inspection, surge
current testing, F-Tech (an improved anode manufacturing
process) and Simulated Breakdown Voltage (SBDV)
screening options to improve long term reliability.
KEMET’s F-Tech eliminates hidden defects in the dielectric,
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes, which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test. The
F-Tech parts see no degradation while standard tantalums
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for T493 (select D
and X case capacitance values in 25 V and higher rated
voltage) and T497 (select H case capacitance values in
25 V and higher rated voltage). Please contact KEMET for
details on ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provides only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
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© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
1
Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS) MnO
2
(CWR09/19/29 Style)
Benefits
• F-Tech and Simulated Breakdown Voltage (SBDS) screening
options available
• Taped and reeled per EIA 481
• Symmetrical, compliant terminations
• Laser-marked case
• 100% surge current test available on all case sizes
•
•
•
•
•
•
Termination options B, H, and T
Weibull failure options B and C
Voltage rating of 4 – 50 VDC
Operating temperature range of −55°C to +125°C
Capacitance values of 0.1 to 150 μF
100% thermal shock
Applications
Typical applications include decoupling and filtering in military, medical, and aerospace applications.
Environmental Compliance
RoHS Compliant (6/6) according to Directive 2002/95/EC when ordered with 100% Sn solder.
K-SIM
For a detailed analysis of specific part numbers, please visit ksim.kemet.com to access KEMET’s K-SIM software. KEMET
K-SIM is designed to simulate behavior of components with respect to frequency, ambient temperature, and DC bias levels.
Ordering Information
T
497
G
226
K
020
A
Failure Rate/
Design
A = N/A
B = 0.1%/
1,000 hours
C = 0.01%/
1,000 hours
H
Termination
Finish
T = 100% Matte
Tin (Sn) Plated
H = Standard
Solder Coated
(SnPb 5% Pb
minimum)
B = Gold Plated
61
Surge
10
X-ray
Packaging
(C-Spec)
Blank = 7"
Reel
7280 = 13"
Reel
7610 = Bulk
Bag
7640 = Bulk
plastic box
WAFL =
Waffle Pack
Capacitor
Series
Class
T=
Tantalum
High
Grade
COTS
Rated
Case Capacitance Capacitance
Voltage
Size Code (pF)
Tolerance
(VDC)
A
B
C
D
E
F
G
H
X
First two
K = ±10%
M = ±20%
digits
represent
significant
figures. Third
digit specifies
number of
zeros.
004 = 4
006 = 6.3
010 = 10
016 = 16
020 = 20
025 = 25
035 = 35
050 = 50
61 = Standard
10 = None
(in-process)
15 = 100%
62 = 10 Cycles After
Weibull, 25°C
63 = 10 Cycles After
Weibull, −55° and 85°C
64 = 10 Cycles Before
Weibull, −55° and 85°C
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
2
Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS) MnO
2
(CWR09/19/29 Style)
Ordering Information – F-Tech & Simulated Breakdown Screening (SBDS)
T
497
H
226
K
020
Rated
Voltage
(VDC)
025 = 25
035 = 35
050 = 50
A
Failure Rate/
Design
A = N/A
B=0.1%/
1,000 hours
C=.01%/
1,000 hours
H
Termination
Finish
T = 100% Matte
Tin (Sn) Plated
H = Standard
Solder Coated
(SnPb 5% Pb
minimum)
B = Gold Plated
61
Surge
61 = Standard (in-
process)
62 = 10 Cycles After
Weibull, 25°C
63 = 10 Cycles After
Weibull, −55° and 85°C
64 = 10 Cycles Before
Weibull, −55° and 85°C
10
Design/Screening
10 = Standard
11 = F-Tech & SBDS
12 = SBDS
13 = F-Tech
15 = 100% X-ray
16 = F-Tech & SBDS
& 100% X-ray
17 = SBDS & 100%
X-ray
18 = F-Tech & 100%
X-ray
Capacitor
Case Capacitance Capacitance
Series
Class
Size Code (pF)
Tolerance
T=
High
Tantalum Grade
COTS
H
First two
K = ±10%
digits
M = ±20%
represent
significant
figures. Third
digit specifies
number of
zeros.
Performance Characteristics
Item
Operating Temperature
Rated Capacitance Range
Capacitance Tolerance
Rated Voltage Range
DF (120 Hz)
ESR (100 kHz)
Leakage Current
−55°C to 125°C
0.1 µF – 150 µF at 120 Hz/25°C
K Tolerance (10%), M Tolerance (20%)
4 – 50 V
Refer to Part Number Electrical Specification Table
Refer to Part Number Electrical Specification Table
≤ 0.01 CV (µA) at rated voltage after 5 minutes
Performance Characteristics
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
3
Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS) MnO
2
(CWR09/19/29 Style)
Qualification
Test
Endurance
Condition
Δ C/C
105°C at rated voltage, 2,000 hours
125°C at 2/3 rated voltage, 2,000 hours
DF
DCL
ESR
Δ C/C
DF
DCL
ESR
Δ C/C
Humidity
85°C, 85% RH, 1,000 hours No Load
DF
DCL
+25°C
Extreme temperature exposure at a
succession of continuous steps at +25ºC,
−55ºC, +25ºC, +85ºC, +125ºC, +25ºC
Δ C/C
DF
DCL
IL*
IL
IL
Δ C/C
DF
DCL
ESR
Δ C/C
DF
DCL
Characteristics
Within −20%/+10% of initial value
≤ Initial Limit
2 x IL at 125ºC
2 x Initial Limit
Within −20%/+10% of initial value
Within initial limits
Within 2.0 x initial limit
Within 2.0 x initial limit
Within −5%/+35% of initial value
≤ Initial Limit
Within 3.0 x initial limit
−55°C
±20%
IL
n/a
+85°C
±20%
1.2 x IL
10 x IL
+125°C
±30%
1.5 x IL
10 x IL
Storage Life
125°C at 0 volts, 2,000 hours
Temperature Stability
Within −20%/+10% of initial value
Within initial limits
Within initial limits
Within initial limits
Within ±10% of initial value
Within initial limits
Within initial limits
Surge Voltage
105°C, 1.32 x rated voltage 1,000 cycles
Mechanical Shock/
Vibration
*IL = Initial limit
MIL–STD–202, Method 213, Condition I, 100 G peak
MIL–STD–202, Method 204, Condition D, 10 Hz to
2,000 Hz, 20 G peak
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
4
Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS) MnO
2
(CWR09/19/29 Style)
Electrical Characteristics
ESR vs. Frequency
1,000
T497D106/15_IMP
T497F336/15_IMP
Capacitance vs. Frequency
1,000
T497D106/15
T497F336/15
Impedance, ESR (Ohms)
T497D106/15_ESR
T497F336/15_ESR
T497F107/15_ESR
10
Capacitance (µF)
100
T497H107/15_IMP
100
T497H107/15
10
1
1
0.1
100
1,000
10,000
Frequency (Hz)
100,000
1,000,000
10,000,000
0
100
1,000
10,000
Frequency (Hz)
100,000
1,000,000
10,000,000
Dimensions – Millimeters (Inches)
Metric will govern
SIDE VIEW
L
H
P
P
Termination cutout
at KEMET's option,
either end
END VIEW
W
Solderable
Surfaces
BOTTOM VIEW
H
2
W
2
½ H
2
Min.
Case Size
KEMET
A
B
C
D
E
F
G
H
X
L ±0.38
(0.015)
2.54
(0.100)
3.81
(0.150)
5.08
(0.200)
3.81
(0.150)
5.08
(0.200)
5.59
(0.220)
6.73
(0.265)
7.24
(0.285)
6.93
(0.273)
W ±0.38
(0.015)
1.27
(0.050)
1.27
(0.050)
1.27
(0.050)
2.54
(0.100)
2.54
(0.100)
3.43
(0.135)
2.79
(0.110)
3.81
(0.150)
5.41
(0.213)
Component
H ±0.38
(0.015)
1.27
(0.050)
1.27
(0.050)
1.27
(0.050)
1.27
(0.050)
1.27
(0.050)
1.78
(0.070)
2.79
(0.110)
2.79
(0.110)
2.74
(0.108)
P +0.25 (0.010),
W
2
−0.13 (0.005)
0.76
1.27±0.13
(0.030)
(0.050±0.005)
0.76
1.27±0.13
(0.030)
(0.050±0.005)
0.76
1.27±0.13
(0.030)
(0.050±0.005)
0.76
2.41+0.13,−0.25
(0.030)
(0.095+0.005,−0.010)
0.76
2.41+0.13,−0.25
(0.030)
(0.095+0.005,−0.010)
0.76
3.30±0.13
(0.030)
(0.130±0.005)
1.27
2.67±0.13
(0.050)
(0.105±0.005)
1.27
3.68+0.013,−0.51
(0.050)
(0.145+0.005,−0.020)
1.19
3.05±0.13
(0.047)
(0.120±0.005)
H
2
Minimum
0.76
(0.030)
0.76
(0.030)
0.76
(0.030)
0.76
(0.030)
0.76
(0.030)
1.02
(0.040)
1.52
(0.060)
1.52
(0.060)
1.22
(0.048)
Typical Weight
(mg)
39.91
68.73
146.5
264.12
421.63
173.63
266.42
349.01
590.44
Note: When solder coated terminations are required, add an additional 0.38 mm (0.015 inch) to the above tolerances for "L", "W", "H", "P" ,"W
2
" and "H
2
"
These weights are provided as reference. If exact weights are needed, please contact your KEMET Sales Representative
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
5
Microchip MCU
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