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JANS1N4483DUS: 产品描述Zener Diode, 56V V(Z), 1%, 1.5W, Silicon, Unidirectional, HERMETIC SEALED, GLASS, D-5A, 2 PIN; 产品类别分立半导体二极管; 文件大小829KB，共31页; 制造商Microsemi; 官网地址https://www.microsemi.com

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JANS1N4483DUS概述

Zener Diode, 56V V(Z), 1%, 1.5W, Silicon, Unidirectional, HERMETIC SEALED, GLASS, D-5A, 2 PIN

JANS1N4483DUS规格参数

参数名称	属性值
是否无铅	含铅
是否Rohs认证	不符合
包装说明	O-LELF-R2
针数	2
Reach Compliance Code	compli
ECCN代码	EAR99
外壳连接	ISOLATED
配置	SINGLE
二极管元件材料	SILICON
二极管类型	ZENER DIODE
JESD-30 代码	O-LELF-R2
JESD-609代码	e0
元件数量	1
端子数量	2
封装主体材料	GLASS
封装形状	ROUND
封装形式	LONG FORM
峰值回流温度（摄氏度）	NOT SPECIFIED
极性	UNIDIRECTIONAL
最大功率耗散	1.5 W
认证状态	Qualified
参考标准	MIL-19500/406F
标称参考电压	56 V
表面贴装	YES
技术	ZENER
端子面层	Tin/Lead (Sn/Pb)
端子形式	WRAP AROUND
端子位置	END
处于峰值回流温度下的最长时间	NOT SPECIFIED
最大电压容差	1%
工作测试电流	4.5 mA
Base Number Matches	1

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The documentation and process conversion

measures necessary to comply with this revision

shall be completed by 1 May 2013.

INCH-POUND

MIL-PRF-19500/406K

w/AMENDMENT 2

1 April 2013

SUPERSEDING

MIL-PRF-19500/406K

w/AMENDMENT 1

9 November 2012

PERFORMANCE SPECIFICATION SHEET

SEMICONDUCTOR DEVICES, DIODE, SILICON, VOLTAGE REGULATOR,

TYPES 1N4460, 1N4460C, 1N4460D THROUGH 1N4496, 1N4496C, 1N4496D, AND 1N6485, 1N6485C, 1N6485D

THROUGH 1N6491, 1N6491C, 1N6491D, 1N4460US, 1N4460CUS, 1N4460DUS THROUGH 1N4496US,

1N4496CUS, 1N4496DUS, AND 1N6485US, 1N6485CUS, 1N6485DUS THROUGH 1N6491US, 1N6491CUS,

1N6491DUS, 1N4460UM THROUGH 1N4496UM, PLUS C AND D TOLERANCE SUFFIX; JAN, JANTX, JANTXV,

AND JANS

This specification is approved for use by all Departments

and Agencies of the Department of Defense.

The requirements for acquiring the product described herein

shall consist of this specification sheet and MIL-PRF-19500.

1. SCOPE

1.1 Scope. This specification covers the performance requirements for micro-miniature 1.5 watt silicon, low

leakage, voltage regulator diodes with tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product

assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

1.2 Physical dimensions. See

figure 1

(DO-41),

figure 2

(surface mount), and figure 3 (UM surface mount).

1.3 Maximum ratings. T

STG

= T

J(max)

= -65°C to +175°C. Maximum ratings are as shown in maximum and primary

test ratings (see

3.11)

herein and as follows:

= +112ºC

L =

.375

inch

(9.53 mm)

1.5 W

(1)

at T

+145ºC

1.5 W

(2)

T(PCB1)

at T

+55ºC

0.6 W

(3)

θJL

L =

.375

inch

T(PCB2)

(9.52 mm)

= +55ºC

At T

= +25°C

1.5 W

(4)

1.5 W

(5)

42ºC/W

(6)

Barometric pressure reduced

(high altitude operation)

8 mm Hg

θJEC

20ºC/W

(6) (7)

θJSP

56°C/W

(8)

θJA(PCB1)

200ºC/W

(3)

θJA(PCB2)

80ºC/W

(4)

(1)

Derate: See

figure

herein

(2)

(3)

(4)

(5)

(6)

(7)

(8)

Derate: See

figure

herein.

Derate: See

figure

herein and

6.4.1

(PCB1) herein.

Derate: See

figure

herein and

6.4.2

(PCB2) herein.

Derate: See

figure

herein.

See figures

and

herein.

See figures

and

herein.

See

figure 13

herein.

Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime,

ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to

Semiconductor@dla.mil

Since contact

information can change, you may want to verify the currency of this address information using the ASSIST Online

database at

https://assist.dla.mil .

AMSC N/A

FSC 5961

MIL-PRF-19500/406K

w/AMENDMENT 2

1.4 Primary electrical characteristics. Primary electrical characteristics are as shown in maximum and primary test

ratings (see

3.11)

and as follows: 3.3 V dc

≤

200 V dc (nominal).

a. 1N4460D through 1N4496D and 1N6485D through 1N6491D are 1 percent voltage tolerance.

b. 1N4460C through 1N4496C and 1N6485C through 1N6491C are 2 percent voltage tolerance.

c. 1N4460 through 1N4496 and 1N6485 through 1N6491 are 5 percent voltage tolerance.

θJL

= 42°C/W (max) at L =

375 inch (9.52 mm) (nonsurface mount).

θJEC

= 20ºC/W (max) (non-surface mount).

For thermal impedance curves, see figures

9, 10, 11, 12

and

13.

θJSP

= 56°C/W (max) (UM surface mount).

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-PRF-19500 - Semiconductor Devices, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-750 - Test Methods for Semiconductor Devices.

(Copies of these documents are available online at

https://assist.dla.mil/quicksearch/

https://assist.dla.mil

. or

from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the

text of this document and the references cited herein, the text of this document takes precedence. Nothing in this

document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

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JANS1N4483DUS概述

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